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US7065481B2 Expired / Lapsed US ⏱️ 0.0 years remaining

Method and system for debugging an electronic system using instrumentation circuitry and a logic analyzer

Assignee: Synopsys Inc
•
Filing: 2002-07-31
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Granted: 2006-06-20
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Expires: 2022-07-31
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Abstract

Abstract Techniques and systems for analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level are described. Although the hardware designs (which were designed in HDL) have been fabricated in integrated circuit products with limited input/output pins, the techniques and systems enable the hardware designs within the integrated circuit products to be comprehensively analyzed, diagnosed, and debugged at the HDL level at speed. The ability to debug hardware designs at the HDL level facilitates correction or adjustment of the HDL description of the hardware designs.

Inventors

  • 👤 Nils Endric Schubert
  • 👤 John Mark Beardslee
  • 👤 Gernot Heinrich Koch
  • 👤 Olaf Poeppe

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-07 02:41
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3183; G01R31/318342; G01R31/318357; G01R31/318364; G06; G06F; G06F30/00; G06F30/30; G06F30/32; G06F30/33

Claims Analysis

Total Claims: 29
Claim 1
Independent Claim 141 words
A method for debugging an electronic system having instrumentation circuitry included therein, the electronic system being coupled to at least one logic analyzer, wherein the electronic system is described with a HDL, said method comprising: (a) activating certain design visibility, design patching or design control aspects of the instrumentation circuitry available for examining or modifying the electronic system via the instrumentation circuitry; (b) determining configuration information based on the certain design visibility, design patching or design control aspects that are activated; (c) configuring the instrumentation circuitry in accordance with the configuration information; (d) configuring the instrumentation circuitry to interoperate with the at least one logic analyzer; (e) receiving debug data from the configured instrumentation circuitry operating within the electronic system product; (f) translating the debug data into HDL-related debug information; and (g) relating the HDL-related debug information to the HDL description.
Claim 2
Independent Claim 141 words
A method for debugging an electronic system having instrumentation circuitry included therein, the electronic system being coupled to at least one logic analyzer, wherein the electronic system is described with a HDL, said method comprising: (a) activating certain design visibility, design patching or design control aspects of the instrumentation circuitry available for examining or modifying the electronic system via the instrumentation circuitry; (b) determining configuration information based on the certain design visibility, design patching or design control aspects that are activated; (c) configuring the instrumentation circuitry in accordance with the configuration information; (d) configuring the instrumentation circuitry to interoperate with the at least one logic analyzer; (e) receiving debug data from the configured instrumentation circuitry operating within the electronic system product; (f) translating the debug data into HDL-related debug information; and (g) relating the HDL-related debug information to the HDL description.
Claim 3
Dependent Claim 32 words
A method as recited in claim 1 , wherein at least a portion of the debug data being received from the configured instrumentation circuitry is from the at least one logic analyzer.
Claim 4
Dependent Claim 31 words
A method as recited in claim 1 , wherein at least a portion of the design patching aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 5
Dependent Claim 34 words
A method as recited in claim 1 , wherein at least a portion of the design visibility or design control aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 6
Dependent Claim 44 words
A method as recited in claim 4 , wherein said method further comprises: (h) configuring the at least one logic analyzer based on the portion of the design visibility or design control aspects of the instrumentation circuitry to be performed by the logic analyzer.
Claim 7
Dependent Claim 22 words
A method as recited in claim 5 , wherein said configuring (c) and said configuring (h) are automatically performed without user interaction.
Claim 8
Dependent Claim 36 words
A method as recited in claim 5 , wherein the design visibility comprises sampling performed by the at least one logic analyzer and the design control comprises triggering performed by the at least one logic analyzer.
Claim 9
Dependent Claim 32 words
A method as recited in claim 5 , wherein at least a portion of the debug data being received from the configured instrumentation circuitry is from the at least one logic analyzer.
Claim 10
Dependent Claim 31 words
A method as recited in claim 8 , wherein at least a portion of the design patching aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 11
Dependent Claim 25 words
A method as recited in claim 1 , wherein said method further comprises: (h) displaying the HDL description with the HDL-related debug information related thereto.
Claim 12
Dependent Claim 29 words
A method as recited in claim 10 , wherein said displaying (h) operates to display the HDL-related debug information as visual indicators on the HDL-related debug information being displayed.
Claim 13
Dependent Claim 14 words
A method as recited in claim 11 , wherein the visual indicators are tags.
Claim 14
Dependent Claim 31 words
A method as recited in claim 10 , wherein at least a portion of the design patching aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 15
Dependent Claim 32 words
A method as recited in claim 13 , wherein at least a portion of the debug data being received from the configured instrumentation circuitry is from the at least one logic analyzer.
Claim 16
Dependent Claim 34 words
A method as recited in claim 13 , wherein at least a portion of the design visibility or design control aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 17
Dependent Claim 173 words
A computer readable storage medium including at least computer program code for debugging an electronic system having instrumentation circuitry included therein, the electronic system being coupled to at least one logic analyzer, wherein the electronic system is described with a HDL, said computer readable medium comprising: computer program code for activating certain design visibility, design patching or design control aspects of the instrumentation circuitry available for examining or modifying the electronic system via the instrumentation circuitry; computer program code for determining configuration information based on the certain design visibility, design patching or design control aspects that are activated; computer program code for configuring the instrumentation circuitry in accordance with the configuration information; computer program code for configuring the instrumentation circuitry to interoperate with the at least one logic analyzer; computer program code for receiving debug data from the configured instrumentation circuitry operating within the electronic system product; computer program code for translating the debug data into HDL-related debug information; and computer program code for relating the HDL-related debug information to the HDL description.
Claim 18
Dependent Claim 173 words
A computer readable storage medium including at least computer program code for debugging an electronic system having instrumentation circuitry included therein, the electronic system being coupled to at least one logic analyzer, wherein the electronic system is described with a HDL, said computer readable medium comprising: computer program code for activating certain design visibility, design patching or design control aspects of the instrumentation circuitry available for examining or modifying the electronic system via the instrumentation circuitry; computer program code for determining configuration information based on the certain design visibility, design patching or design control aspects that are activated; computer program code for configuring the instrumentation circuitry in accordance with the configuration information; computer program code for configuring the instrumentation circuitry to interoperate with the at least one logic analyzer; computer program code for receiving debug data from the configured instrumentation circuitry operating within the electronic system product; computer program code for translating the debug data into HDL-related debug information; and computer program code for relating the HDL-related debug information to the HDL description.
Claim 19
Dependent Claim 35 words
A computer storage readable medium as recited in claim 16 , wherein at least a portion of the debug data being received from the configured instrumentation circuitry is from the at least one logic analyzer.
Claim 20
Dependent Claim 33 words
A computer readable medium as recited in claim 16 , wherein at least a portion of the design patching aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 21
Dependent Claim 36 words
A computer readable medium as recited in claim 16 , wherein at least a portion of the design visibility or design control aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 22
Dependent Claim 51 words
A computer readable storage medium as recited in claim 19 , wherein said computer readable medium further comprises: computer program code for configuring the at least one logic analyzer based on the portion of design visibility or design control aspects of the instrumentation circuitry to be performed by the logic analyzer.
Claim 23
Dependent Claim 40 words
A computer readable storage medium as recited in claim 20 , wherein said computer program code for configuring the instrumentation circuitry and said computer program code for configuring the at least one logic analyzer are automatically performed without user interaction.
Claim 24
Dependent Claim 38 words
A computer readable medium as recited in claim 20 , wherein the design visibility comprises sampling performed by the at least one logic analyzer and the design control comprises triggering performed by the at least one logic analyzer.
Claim 25
Dependent Claim 34 words
A computer readable medium as recited in claim 20 , wherein at least a portion of the debug data being received from the configured instrumentation circuitry is from the at least one logic analyzer.
Claim 26
Dependent Claim 34 words
A computer readable storage medium as recited in claim 23 , wherein at least a portion of the design patching aspects of the instrumentation circuitry are performed by the at least one logic analyzer.
Claim 27
Dependent Claim 33 words
A computer readable storage medium as recited in claim 16 , wherein said computer readable medium further comprises: computer program code for displaying the HDL description with the HDL-related debug information related thereto.
Claim 28
Dependent Claim 35 words
A computer readable storage medium as recited in claim 25 , wherein said computer program code for displaying operates to display the HDL-related debug information as visual indicators on the HDL-related debug information being displayed.
Claim 29
Dependent Claim 17 words
A computer readable storage medium as recited in claim 26 , wherein the visual indicators are tags.

References Cited (Backward Citations)

US4306286A Cited
US4590581A Cited
US4635218A Cited
US4590581B1 Cited
US4675646A Cited
US4937827A Cited
US4937770A Cited
US5329471A Cited
US4845712A Cited
US4901259A Cited
US5036473A Cited
US5812414A Cited
US5661662A Cited
US5963735A Cited
US6377911B1 Cited
US5329470A Cited
US5644515A Cited
US6499123B1 Cited
US5369593A Cited
US5416919A Cited
US5146460A Cited
US5870308A Cited
US5933356A Cited
US5560009A Cited
DE4042262A1 Cited
US5412260A Cited
US5281864A Cited
US5321828A Cited
US5581742A Cited
US5491793A Cited
US5425036A Cited
US5596587A Cited
US5596743A Cited
US5663900A Cited
US5640542A Cited
US5801956A Cited
US6132109A Cited
US5937190A Cited
US5757819A Cited
US5572712A Cited
US5537580A Cited
US5546562A Cited
US5805859A Cited
US5568437A Cited
US5544311A Cited
US5777489A Cited
US5754827A Cited
US6057706A Cited
US5907697A Cited
US5574388A Cited
US6223148B1 Cited
US5831868A Cited
US6014334A Cited
US5905883A Cited
US5999725A Cited
US5790832A Cited
US5870410A Cited
US5822564A Cited
US5748875A Cited
US5717699A Cited
US5859993A Cited
US6182247B1 Cited
US6389558B1 Cited
US5771240A Cited
US5751735A Cited
US5951696A Cited
US6134707A Cited
US6006022A Cited
US5812562A Cited
US6430727B1 Cited
US6551844B1 Cited
US6618854B1 Cited
US6202172B1 Cited
US5991523A Cited
US6026230A Cited
US6009256A Cited
US5943490A Cited
US6377912B1 Cited
US5960191A Cited
US6202044B1 Cited
US6157210A Cited
US6175946B1 Cited
US6292765B1 Cited
US6247147B1 Cited
US6286114B1 Cited
US6704889B2 Cited
US6460148B2 Cited
US6212650B1 Cited
US6021447A Cited
US6075234A Cited
US6389586B1 Cited
US6182268B1 Cited
US6378093B1 Cited
US6041176A Cited
US6188975B1 Cited
US6353906B1 Cited
US6363520B1 Cited
US6240376B1 Cited
US6336087B2 Cited
US6311292B1 Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2009-06-19 2009-12-19 2010-06-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2013-06-19 2013-12-19 2014-06-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2017-06-19 2017-12-19 2018-06-20 $7700.00 Window Closed / Lapsed

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