← Back to Patent Explorer
US6499123B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Method and apparatus for debugging an integrated circuit

Assignee: Advanced Micro Devices Inc
•
Filing: 2000-04-12
•
Granted: 2002-12-24
•
Expires: 2020-04-12
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract An integrated circuit having a normal mode for operating under normal operating conditions and a debug mode for operating to test and debug the integrated circuit. The integrated circuit includes a plurality of output pins that carry a first plurality of signals in the normal mode and carry a second plurality of signals in the debug mode. In one embodiment, the integrated circuit embodies a microprocessor. The microprocessor may include logic circuitry for enabling the second plurality of signals to be output from a multiplexer to the output pins in response to a predetermined event, such as a hit in an associated memory unit.

Inventors

  • 👤 Harold L. McFarland
  • 👤 David R. Stiles
  • 👤 Korbin S. Van Dyke
  • 👤 Shrenik Mehta
  • 👤 John Gregory Favor
  • 👤 Dale R. Greenley
  • 👤 Robert A. Cargnoni

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 21:17
CPC Classifications
G; G06; G06F; G06F9/00; G06F9/06; G06F9/30; G06F9/34; G06F11/00; G06F11/36; G06F11/362; G06F11/3636; G06F11/364; G06F11/3648; G06F12/00; G06F12/02; G06F12/08; G06F12/10; G06F12/1027; G06F12/14; G06F12/1416; G06F12/145; G06F15/00; G06F15/76; G06F15/80; G06F15/8053; G06F9/30003; G06F9/30007; G06F9/30018; G06F9/30036; G06F9/30038; G06F9/3005; G06F9/30145; G06F9/3016; G06F9/30167; G06F9/3017; G06F9/30174; G06F9/30181; G06F9/30185; G06F9/30189; G06F9/32; G06F9/322; G06F9/323; G06F9/355; G06F9/3555; G06F9/38; G06F9/3802; G06F9/3804; G06F9/3812; G06F9/3836; G06F9/3838; G06F9/384; G06F9/3842; G06F9/3854; G06F9/3856; G06F9/3858; G06F9/38585; G06F9/3861; G06F9/3863; G06F9/3867; G06F9/3869; G06F9/3885

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 157 words
A microprocessor having a normal mode for operation under normal operating conditions and a debug mode for operations to test and debug the microprocessor, comprising: a cache memory unit; a plurality of execution units; a plurality of output pins; a plurality of internal busses, wherein the plurality of execution units are interconnected through the plurality of internal busses; multiplexer circuitry having a first input coupled to the plurality of internal busses and a second input coupled the cache memory unit; and test control logic for setting the multiplexer in either the normal mode or the debug mode; wherein during the normal mode, external data requests resulting from misses in the cache memory unit are conveyed through the second input of the multiplexer circuitry to the output pins; and wherein during the debug mode, at least some signals of the plurality of internal busses are conveyed through the first input of the multiplexer circuitry to the output pins.
Claim 2
Dependent Claim 157 words
A microprocessor having a normal mode for operation under normal operating conditions and a debug mode for operations to test and debug the microprocessor, comprising: a cache memory unit; a plurality of execution units; a plurality of output pins; a plurality of internal busses, wherein the plurality of execution units are interconnected through the plurality of internal busses; multiplexer circuitry having a first input coupled to the plurality of internal busses and a second input coupled the cache memory unit; and test control logic for setting the multiplexer in either the normal mode or the debug mode; wherein during the normal mode, external data requests resulting from misses in the cache memory unit are conveyed through the second input of the multiplexer circuitry to the output pins; and wherein during the debug mode, at least some signals of the plurality of internal busses are conveyed through the first input of the multiplexer circuitry to the output pins.
Claim 3
Dependent Claim 34 words
The microprocessor of claim 1 wherein the test control logic includes a test register for storing a value that controls which signals of the plurality of internal busses are conveyed to the output pins.
Claim 4
Dependent Claim 40 words
The microprocessor of claim 2 , wherein the multiplexer circuitry is configured to cause the signals of the internal busses to be conveyed to the ouput pins during said debug mode in response to an occurrence of a predetermined event.
Claim 5
Dependent Claim 21 words
The microprocessor of claim 3 wherein the predetermined event is an occurrence of a cache hit in said cache memory unit.
Claim 6
Dependent Claim 23 words
The integrated circuit of claim 1 wherein the internal signals are not visible on the output pins while operating in the normal mode.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2005-12-23 2006-06-24 2006-12-24 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2009-12-23 2010-06-24 2010-12-24 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2013-12-23 2014-06-24 2014-12-24 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag