Patent US6763485B2 successfully refreshed from Google Patents.
US6763485B2
Expired / Lapsed
US
⏱️ 0.0 years remaining
Position independent testing of circuits
Assignee: Texas Instruments Inc
•
Filing: 2002-04-02
•
Granted: 2004-07-13
•
Expires: 2022-04-02
Abstract
Abstract Scan distributor, collector, and controller circuitry connect to the functional inputs and outputs of core circuitry on integrated circuits to provide testing through those functional inputs and outputs. Multiplexer and demultiplexer circuits select between the scan circuitry and the functional inputs and outputs. The core circuitry can also be provided with built-in scan distributor, collector, and controller circuitry to avoid having to add it external of the core circuitry. With appropriately placed built-in scan distributor and collector circuits, connecting together the functional inputs and outputs of the core circuitry also connects together the scan distributor and collector circuitry in each core. This can provide a hierarchy of scan circuitry and reduce the need for separate test interconnects and multiplexers.
Inventors
- 👤 Lee D. Whetsel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 16:29
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3177; G01R31/3181; G01R31/3185; G01R31/318533; G01R31/318536; G01R31/318558; G01R31/318572
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
140 words
A process of testing an integrated circuit comprising: A. configuring a functional circuit into a test mode; B. capturing one response data bit output from each of plural scan paths, associated with the functional circuit, into a scan collector; C. simultaneously loading stimulus data bits into a scan distributor and unloading response data bits from the scan collector; D. shifting the scan paths one bit to load each scan path with one stimulus data bit from the scan distributor; E. if the scan paths are not filled with stimulus data bits, then repeating steps B, C, and D; F. if the scan paths are full of stimulus data bits, then applying the stimulus data bits in the scan paths to the functional circuit, capturing response data bits from the functional circuit in the scan paths, and returning to step B.
Claim 2
Dependent Claim
140 words
A process of testing an integrated circuit comprising: A. configuring a functional circuit into a test mode; B. capturing one response data bit output from each of plural scan paths, associated with the functional circuit, into a scan collector; C. simultaneously loading stimulus data bits into a scan distributor and unloading response data bits from the scan collector; D. shifting the scan paths one bit to load each scan path with one stimulus data bit from the scan distributor; E. if the scan paths are not filled with stimulus data bits, then repeating steps B, C, and D; F. if the scan paths are full of stimulus data bits, then applying the stimulus data bits in the scan paths to the functional circuit, capturing response data bits from the functional circuit in the scan paths, and returning to step B.
Claim 3
Dependent Claim
31 words
The process of claim 1 including, if the scan paths are full of stimulus data bits and the test is to end, then configuring the functional circuit into a normal mode.
Claim 4
Dependent Claim
29 words
The process of claim 1 in which the capturing includes capturing one response data bit output from each of plural scan paths in parallel into a parallel scan collector.
Claim 5
Dependent Claim
20 words
The process of claim 1 in which the loading includes serially loading stimulus data bits into a parallel scan distributor.
Claim 6
Dependent Claim
20 words
The process of claim 1 in which the unloading includes serially unloading response data bits from a parallel scan collector.
Claim 7
Dependent Claim
25 words
The process of claim 1 in which the loading includes serially loading stimulus data bits into a parallel scan distributor from a single bond pad.
Claim 8
Dependent Claim
25 words
The process of claim 1 in which the unloading includes serially unloading response data bits from a parallel scan collector to a single bond pad.
Claim 9
Dependent Claim
32 words
The process of claim 1 in which the shifting includes serially shifting the scan paths one bit to load each scan path with one stimulus data bit from the parallel scan distributor.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2007-07-13 | 2008-01-12 | 2008-07-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2011-07-13 | 2012-01-12 | 2012-07-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2015-07-13 | 2016-01-12 | 2016-07-13 | $7700.00 | Window Closed / Lapsed |