Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
138 words
A microelectronic workpiece for manufacturing a plurality of microelectronic devices, comprising: a substrate; a plurality of dies formed on the substrate, the dies having integrated circuitry and a plurality of bond-pads electrically coupled to the integrated circuitry; a redistribution layer having a first dielectric layer over the dies, a second dielectric layer over the first dielectric layer, ball-pads arranged in ball-pad arrays corresponding to the dies, and traces coupling the bond-pads of a die to the ball-pads of a corresponding ball-pad array; solder balls on the ball-pads, wherein the solder balls project from the ball-pads by a ball height; and a protective coating over the second dielectric layer and between the solder balls, the protective coating being a preformed film having a thickness less than the ball height and an outer surface formed by a removable backing member.
Claim 2
Dependent Claim
138 words
A microelectronic workpiece for manufacturing a plurality of microelectronic devices, comprising: a substrate; a plurality of dies formed on the substrate, the dies having integrated circuitry and a plurality of bond-pads electrically coupled to the integrated circuitry; a redistribution layer having a first dielectric layer over the dies, a second dielectric layer over the first dielectric layer, ball-pads arranged in ball-pad arrays corresponding to the dies, and traces coupling the bond-pads of a die to the ball-pads of a corresponding ball-pad array; solder balls on the ball-pads, wherein the solder balls project from the ball-pads by a ball height; and a protective coating over the second dielectric layer and between the solder balls, the protective coating being a preformed film having a thickness less than the ball height and an outer surface formed by a removable backing member.
Claim 3
Dependent Claim
24 words
The device of claim 1 wherein the protective coating comprises a material that is deformable at a temperature of 60° F. to 100° F.
Claim 4
Dependent Claim
38 words
The device of claim 1 wherein the protective coating comprises a material that is deformable at a temperature of approximately 60° C. to 90° C., and curable to a non-deformable state at approximately 140° C. to 180° C.
Claim 5
Dependent Claim
12 words
The device of claim 1 wherein the protective coating comprises an epoxy.
Claim 6
Dependent Claim
41 words
The device of claim 1 wherein the solder balls have a diameter and the protective coating has a thickness approximately 10% to 95% of the solder ball diameter such that a portion of the solder balls projects beyond the protective coating.
Claim 7
Dependent Claim
25 words
The device of claim 1 wherein the protective coating has a plurality of openings over the ball-pads and the solder-balls are positioned in the openings.
Claim 8
Dependent Claim
13 words
The device of claim 1 wherein the integrated circuitry comprises a memory circuit.
Claim 9
Dependent Claim
132 words
A semiconductor workpiece for fabricating a plurality of semiconductor devices, comprising: a wafer having a substrate composed of a semiconductor material; a plurality of dies having integrated circuitry in the substrate and a plurality of bond-pads electrically coupled to the integrated circuitry; a redistribution layer having a first dielectric layer over the dies, a second dielectric layer over the first dielectric layer, ball-pads arranged in ball-pad arrays corresponding to the dies, and traces coupling the bond-pads of a die to the ball-pads of a corresponding ball-pad array; solder balls on the ball-pads; and a cover on the second dielectric layer and between the solder balls, wherein the solder balls have contact sites exposed through the cover, the cover being a preformed film pressed onto the second dielectric layer from a backing member.
Claim 10
Dependent Claim
132 words
A semiconductor workpiece for fabricating a plurality of semiconductor devices, comprising: a wafer having a substrate composed of a semiconductor material; a plurality of dies having integrated circuitry in the substrate and a plurality of bond-pads electrically coupled to the integrated circuitry; a redistribution layer having a first dielectric layer over the dies, a second dielectric layer over the first dielectric layer, ball-pads arranged in ball-pad arrays corresponding to the dies, and traces coupling the bond-pads of a die to the ball-pads of a corresponding ball-pad array; solder balls on the ball-pads; and a cover on the second dielectric layer and between the solder balls, wherein the solder balls have contact sites exposed through the cover, the cover being a preformed film pressed onto the second dielectric layer from a backing member.
Claim 11
Dependent Claim
23 words
The device of claim 8 wherein the cover comprises a material that is deformable at a temperature of 60° F. to 100° F.
Claim 12
Dependent Claim
37 words
The device of claim 8 wherein the cover comprises a material that is deformable at a temperature of approximately 60° C. to 90° C., and curable to a non-deformable state at approximately 140° C. to 180° C.
Claim 13
Dependent Claim
11 words
The device of claim 8 wherein the cover comprises an epoxy.
Claim 14
Dependent Claim
40 words
The device of claim 8 wherein the solder balls have a diameter and the cover has a thickness approximately 10% to 95% of the solder ball diameter such that a portion of the solder balls projects beyond the protective coating.
Claim 15
Dependent Claim
24 words
The device of claim 8 wherein the cover has a plurality of openings over the ball-pads and the solder-balls are positioned in the openings.
Claim 16
Dependent Claim
13 words
The device of claim 8 wherein the integrated circuitry comprises a memory circuit.