Patent US5617038A successfully refreshed from Google Patents.
US5617038A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and system for screening reliability of semiconductor circuits
Assignee: Texas Instruments Inc
•
Filing: 1995-06-07
•
Granted: 1997-04-01
•
Expires: 2015-06-07
Abstract
Abstract A method and system for screening semiconductor circuits is disclosed herein. A circuit 50, such as an SOI circuit, is provided. The circuit includes a plurality of transistors and is coupled to a supply voltage node V DD , a reference node V SS , and a substrate node V SUB . A supply voltage is applied to the supply node while a reference voltage is applied to the reference node and a test voltage is applied to the substrate node. The current I DD flowing to the supply and/or reference node is then measured. These steps are repeated for a plurality of test circuits to determine at least one performance and/or reliability criterion. The steps can then be repeated to screen other circuits by comparing the measured current to the reliability limit(s).
Inventors
- 👤 Theodore W. Houston
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:34
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/316; G01R31/3163
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
107 words
A system for testing a semiconductor which includes a circuit having a plurality of transistors, said circuit further including a supply voltage node, a reference node and a substrate node, said system comprising: circuitry for applying a supply voltage to said supply voltage node of said circuit; circuitry for applying a reference voltage to said reference node of said circuit; circuitry for applying a test voltage to said substrate node of said circuit; circuitry for measuring a current flowing to said supply node such that the current flowing to the supply node can be compared to a predetermined current criterion to obtain performance information about said circuit.
Claim 2
Independent Claim
107 words
A system for testing a semiconductor which includes a circuit having a plurality of transistors, said circuit further including a supply voltage node, a reference node and a substrate node, said system comprising: circuitry for applying a supply voltage to said supply voltage node of said circuit; circuitry for applying a reference voltage to said reference node of said circuit; circuitry for applying a test voltage to said substrate node of said circuit; circuitry for measuring a current flowing to said supply node such that the current flowing to the supply node can be compared to a predetermined current criterion to obtain performance information about said circuit.
Claim 3
Dependent Claim
17 words
The system of claim 1 wherein said performance information comprises information on radiation hardness of said circuit.
Claim 4
Dependent Claim
17 words
The system of claim 1 wherein said performance information comprises information on the reliability of said circuit.
Claim 5
Dependent Claim
12 words
The system of claim 1 wherein said circuit comprises a silicon-on-insulator circuit.
Claim 6
Dependent Claim
25 words
The system of claim 1 wherein said system for testing comprises a system for performing a screening test prior to packaging of said semiconductor circuit.
References Cited (Backward Citations)
US3440715A
Cited
US3668523A
Cited
US3795859A
Cited
US3889188A
Cited
US4220918A
Cited
US4168432A
Cited
US4418403A
Cited
US4520448A
Cited
US4808915A
Cited
US4631724A
Cited
US4637201A
Cited
US4710704A
Cited
US4719418A
Cited
US4755748A
Cited
US4849847A
Cited
US4820974A
Cited
US4816753A
Cited
US4835458A
Cited
US4860261A
Cited
US4977371A
Cited
US5057774A
Cited
US5047711A
Cited
US5321354A
Cited
US5097206A
Cited
US5132615A
Cited
US5138256A
Cited
US5392293A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2000-03-31 | 2000-09-30 | 2001-04-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-03-31 | 2004-09-30 | 2005-04-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-03-31 | 2008-09-30 | 2009-04-01 | $7700.00 | Window Closed / Lapsed |