Patent US5332697A successfully refreshed from Google Patents.
US5332697A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Formation of silicon nitride by nitridation of porous silicon
Assignee: Individual
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Filing: 1991-10-16
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Granted: 1994-07-26
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Expires: 2011-10-16
Abstract
Abstract Low residual stress, stoichiometric or near stoichiometric, silicon nitride and silicon carbide films with thicknesses of one micron or greater are produced by reacting porous silicon with a nitrogen or carbon containing gas, such as ammonia or methane, at an appropriate temperature and pressure. The gas diffuses into the pores and reacts with the silicon skeletal structure. Because the initial structure is porous and the pore spaces provide strain relief during the addition reaction and subsequent volume expansion, the resultant film has relatively low residual stress. Either porous or solid films can be produced. This process provides a means to chemically stabilize porous silicon layers and their morphologies.
Inventors
- 👤 Rosemary L. Smith
- 👤 Scott D. Collins
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 06:25
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/69; H10P14/692; H10P14/6921; H10P14/6928; H10P14/6932; H10P14/63; H10P14/6302; H10P14/6316; H10P14/6322; H10P14/66; H10P14/665; H10P14/6903; H10P14/6905; H10P14/69215; H10P14/6938; H10P14/6939; H10P14/69391; H10P14/694; H10P14/6943; H10P14/69433; Y; Y10; Y10S; Y10S438/00; Y10S438/96
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
82 words
A method for fabricating low residual stress insulating films in a silicon substrate comprising the steps of: a) forming a porous silicon layer in a silicon layer or silicon substrate, b) nitriding the porous silicon layer in a non-oxidizing ambient of nitrogen, ammonia, a nitrogen-containing chemical, or combinations thereof, at a temperature less than 1000° C., c) continuing step (b) for a time sufficient to convert the porous silicon layer to a silicon nitride layer with a thickness greater than one micron.
Claim 2
Independent Claim
82 words
A method for fabricating low residual stress insulating films in a silicon substrate comprising the steps of: a) forming a porous silicon layer in a silicon layer or silicon substrate, b) nitriding the porous silicon layer in a non-oxidizing ambient of nitrogen, ammonia, a nitrogen-containing chemical, or combinations thereof, at a temperature less than 1000° C., c) continuing step (b) for a time sufficient to convert the porous silicon layer to a silicon nitride layer with a thickness greater than one micron.
Claim 3
Dependent Claim
23 words
The method of claim 1, wherein the silicon layer or silicon substrate is doped with As, B, or P prior to step (a).
Claim 4
Dependent Claim
28 words
The method of claim 1, wherein the porous silicon layer is nitrided for a time sufficient to convert the porous silicon layer to a non-stoichiometric silicon nitride layer.
Claim 5
Dependent Claim
28 words
The method of claim 1, wherein the porous silicon layer is nitrided for a time sufficient to convert the porous silicon layer to a stoichiometric silicon nitride layer.
Claim 6
Dependent Claim
13 words
The method of claim 1, wherein the resulting silicon nitride layer is porous.
Claim 7
Dependent Claim
28 words
The method of claim 5, wherein step (c) is continued for a time sufficient only to cover the interior surface of the pores in the porous silicon layer.
Claim 8
Dependent Claim
43 words
The method of claim 5, further comprising depositing a material selected from the group consisting of silicon, silicon-rich nitride, silicon oxide, silicon dioxide, aluminum oxide, titanium silicide, tungsten silicide, copper, aluminum, gold, silver, diamond, and combinations thereof, in the porous silicon nitride layer.
Claim 9
Dependent Claim
29 words
The method of claim 1, further comprising: continuing to deposit the material so as to both completely fill the pores and deposit the material on the silicon nitride layer.
Claim 10
Dependent Claim
44 words
The method of claim 1, further comprising depositing a material selected from the group consisting of silicon, silicon-rich nitride, silicon oxide, silicon dioxide, aluminum oxide, titanium silicide, tungsten silicide, copper, aluminum, gold, silver, diamond, and combinations thereof, on top of the silicon nitride layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-07-25 | 1998-01-24 | 1998-07-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-07-25 | 2002-01-24 | 2002-07-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-07-25 | 2006-01-24 | 2006-07-26 | $7700.00 | Window Closed / Lapsed |