Patent US5132244A successfully refreshed from Google Patents.
US5132244A
Expired / Lapsed
US
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Growth-modified thermal oxidation for thin oxides
Assignee: Nokia Bell Labs
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Filing: 1991-06-12
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Granted: 1992-07-21
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Expires: 2011-06-12
Abstract
Abstract A method is disclosed for growing relatively thin (e.g., <250 Å) thermal oxides which results in lowering the defect density, mobile ion concentration, interface trapped charge density, and stress of the structure. In particular, the prior art oxidation process is modified to include in situ preoxidation silicon surface treatments to improve the silicon nucleation surface. For example, gettering operations may be performed to remove metal-ion contaminants from the silicon nucleation surface, and high temperature annealing operations may be performed to remove any local stress gradients which exist in the silicon substrate during the initial stages of oxidation. By improving the silicon nucleation surface, the subsequently grown thin oxide will be improved in terms of the qualities mentioned above.
Inventors
- 👤 Pradip K. Roy
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 16:25
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60; H10P14/65; H10P14/6502; H10P14/6504; H10P14/6512; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6322; Y; Y10; Y10S; Y10S148/00; Y10S148/118; Y10S438/00; Y10S438/974
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
170 words
A method of fabricating a semiconductor structure including a relatively thin thermal oxide layer grown on a silicon surface, the method including the steps of: a) providing a silicon surface at a first ambient temperature in the range of 600°-750° C.; b) increasing the ambient temperature to a second value required for oxidation in the range of 900°-950° C.; c) initiating and maintaining oxide growth by subjecting the silicon surface to an oxygen ambient for a period of time related to the desired thickness of the grown oxide; and d) removing the oxygen ambient to terminate the oxide growth characterized in that the process includes performing an in situ preoxidation silicon surface treatment before initiating the oxide growth of step c), the steps including 1) gettering the silicon surface in a chlorine-containing ambient, at the first ambient temperature, to remove contaminants at said silicon surface; and 2) annealing, at the second temperature, the silicon surface gettered in step 1), the annealing to minimize local stress variations in said silicon surface.
Claim 2
Independent Claim
170 words
A method of fabricating a semiconductor structure including a relatively thin thermal oxide layer grown on a silicon surface, the method including the steps of: a) providing a silicon surface at a first ambient temperature in the range of 600°-750° C.; b) increasing the ambient temperature to a second value required for oxidation in the range of 900°-950° C.; c) initiating and maintaining oxide growth by subjecting the silicon surface to an oxygen ambient for a period of time related to the desired thickness of the grown oxide; and d) removing the oxygen ambient to terminate the oxide growth characterized in that the process includes performing an in situ preoxidation silicon surface treatment before initiating the oxide growth of step c), the steps including 1) gettering the silicon surface in a chlorine-containing ambient, at the first ambient temperature, to remove contaminants at said silicon surface; and 2) annealing, at the second temperature, the silicon surface gettered in step 1), the annealing to minimize local stress variations in said silicon surface.
Claim 3
Dependent Claim
24 words
The method of claim 1 wherein preparation step 1) is performed prior to step b) and preparation step 2) is performed after step b).
Claim 4
Dependent Claim
26 words
The method of claim 1 wherein in performing preparation step 1), the chlorine-containing ambient is chosen from the group consisting of hydrochloric acid, trichloroethane and trichloroethene.
Claim 5
Dependent Claim
16 words
The method of claim 1 wherein in performing preparation step 2), an argon ambient is used.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-07-21 | 1996-01-20 | 1996-07-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-07-21 | 2000-01-20 | 2000-07-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-07-21 | 2004-01-20 | 2004-07-21 | $7700.00 | Window Closed / Lapsed |