Patent US5695557A successfully refreshed from Google Patents.
US5695557A
Expired / Lapsed
US
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Process for producing a semiconductor substrate
Assignee: Canon Inc
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Filing: 1994-12-28
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Granted: 1997-12-09
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Expires: 2014-12-28
Abstract
Abstract A bonded substrate and a process for its production is provided to solve the problem involved in the heat treatment which tends to cause troubles such as break, separation and warpage of the substrates bonded. A single-crystal semiconductor epitaxially grown on a porous semiconductor substrate is bonded to an insulator substrate, and the semiconductor substrate is removed by etching, grinding, or a combination of the both, where no heat treatment is carried out or, even if carried out, only once.
Inventors
- 👤 Kenji Yamagata
- 👤 Takao Yonehara
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 10:13
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10P90/1922; H10P90/1924; H10W; H10W10/00; H10W10/10; H10W10/181
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
166 words
A process for producing a semiconductor substrate, comprising successively the steps of: a) anodizing a surface layer on one side of a single-crystal semiconductor substrate to make the surface layer porous to form a porous single-crystal semiconductor layer on a non-porous single-crystal semiconductor region; b) expitaxially growing a non-porous single-crystal semiconductor layer on said porous single-crystal semiconductor layer; c) bringing the surface of said non-porous single-crystal semiconductor layer into close contact with the surface of an insulator substrate and then bonding both to each other without heating; d) grinding down said non-porous single-crystal semiconductor region to remove part of said non-porous single-crystal semiconductor region; e) heating the whole to strengthen the bond between said non-porous single-crystal semiconductor layer and said insulator substrate; f) etching said non-porous single-crystal semiconductor region remaining after the grinding step d), to entirely remove said non-porous single-crystal semiconductor region to expose said porous single-crystal semiconductor layer; and g) selectively etching said porous single-crystal semiconductor layer to remove said porous single-crystal semiconductor layer.
Claim 2
Dependent Claim
166 words
A process for producing a semiconductor substrate, comprising successively the steps of: a) anodizing a surface layer on one side of a single-crystal semiconductor substrate to make the surface layer porous to form a porous single-crystal semiconductor layer on a non-porous single-crystal semiconductor region; b) expitaxially growing a non-porous single-crystal semiconductor layer on said porous single-crystal semiconductor layer; c) bringing the surface of said non-porous single-crystal semiconductor layer into close contact with the surface of an insulator substrate and then bonding both to each other without heating; d) grinding down said non-porous single-crystal semiconductor region to remove part of said non-porous single-crystal semiconductor region; e) heating the whole to strengthen the bond between said non-porous single-crystal semiconductor layer and said insulator substrate; f) etching said non-porous single-crystal semiconductor region remaining after the grinding step d), to entirely remove said non-porous single-crystal semiconductor region to expose said porous single-crystal semiconductor layer; and g) selectively etching said porous single-crystal semiconductor layer to remove said porous single-crystal semiconductor layer.
Claim 3
Dependent Claim
47 words
The process for producing a semiconductor substrate according to claim 1, wherein the etching is carried out in any of an alkali solution, an organic alkali solution and an acid solution containing hydrofluoric acid and nitric acid, kept at 100° C. or below in the step f).
Claim 4
Dependent Claim
52 words
The process for producing a semiconductor substrate according to claim 1, wherein grinding said non-porous single-crystal semiconductor region to remove part of said non-porous single-crystal semiconductor region is carried out in the manner that said non-porous single-crystal semiconductor region remains in a thickness of 100 μm or more in the step d).
Claim 5
Dependent Claim
26 words
The process for producing a semiconductor substrate according to claim 1, wherein the bonding is carried out by pressing the both substrates in the step c).
Claim 6
Dependent Claim
35 words
The process for producing a semiconductor substrate according to claim 1, wherein the selective etching of said porous single-crystal semiconductor layer is carried out in an etching solution including hydrofluoric acid in the step g).
Claim 7
Dependent Claim
46 words
The process for producing a semiconductor substrate according to claim 1, wherein the surface of said non-porous single-crystal semiconductor layer is oxidized to form a surface oxide layer and the surface oxide layer is brought into close contact with the insulator substrate in the step c).
Claim 8
Dependent Claim
20 words
The process for producing a semiconductor substrate according to claim 1, wherein said insulator substrate is a light-transmitting insulator substrate.
Claim 9
Dependent Claim
21 words
The process for producing a semiconductor substrate according to claim 1, wherein said single-crystal semiconductor substrate is mainly composed of silicon.
Claim 10
Dependent Claim
16 words
The semiconductor substrate obtained by a process according to any one of claims 1 and 2-8.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2000-12-08 | 2001-06-09 | 2001-12-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-12-08 | 2005-06-09 | 2005-12-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-12-08 | 2009-06-09 | 2009-12-09 | $7700.00 | Window Closed / Lapsed |