Process for etching a metal oxide coating and simultaneous deposition of a polymer film, application of this process to the production of a thin film transistor

Claim 2

Process for the anisotropic etching of a patterned metal oxide coating (102) by the formation of organametallic compounds located on a substrate (100) and the simultaneous deposition of a polymer film (110) on the parts of the substrate not provided with oxide and consisting of subjecting the complete entity to a plasma formed from a gaseous mixture containing hydrogen and at least one hydrocarbon which, by dissocation, leads to the formation of the polymer (110) and to said etching by chemically reacting with the oxide coating.

Claim 3

Process according to claim 1, characterized in that the gaseous mixture contains by volume 10 to 88% hydrogen, 2 to 30% of at least one hydrocarbon and 10 to 50% of at least one inert vector gas.

Claim 4

Process according to claim 1, characterized in that the gaseous mixture contains by volume 45 to 81% hydrogen, 4 to 20% of at least one hydrocarbon and 15 to 35% of at least one inert vector gas.

Claim 5

Process according to claim 1, characterized in that the hydrocarbon is methane.

Claim 6

Process according to claim 1, characterized in that the gaseous mixture contains argon.

Claim 7

Process according to claim 1, characterized in that the gaseous mixture contains 72% hydrogen, 10% methane and 18% argon.

Claim 8

Process according to claim 1, characterized in that the gaseous mixture has a pressure from 1.35 to 13.5 kPa.

Claim 9

Process according to claim 1, characterized in that a polarization voltage of substrate (100) below 250 V is used.

Claim 10

Process according to claim 1, characterized in that the oxide coating (102) is formed from a transparent, electric conductive material chosen from among ITO, SnO 2 and In 2 O 3 .

Claim 11

Process according to claim 1, characterized in that the substrate is a transparent insulating material.

Claim 12

Process for the production of a thin film transistor on an insulating substrate (100) comprising the following steps: (a) formation on a substrate (100) of a source (106) and a drain (108) of the transistor consisting of a conductive metal oxide (102), (b) partial anisotropic chemical etching of the metal oxide and simultaneous deposition of a polymer film (110) on portions of the substrate on which said metal oxide is not formed by subjecting the complete entity to a plasma formed from a gaseous mixture containing hydrogen and at least one hydrocarbon which by dissociation leads to the formation of the polymer, said polymer deposit constituting a passivation of the substrate (100) and/or an optical mask beneath the transistor channel, (c) successive depositions on the substrate obtained in (b) of an amorphous hydrogenated silicon coating (112), an electrically insulating coating (114) and a conductive coating (116) and (d) photoetching the conductive coating to form the transistor gate.

Claim 13

Process for the production of a thin film transistor on an insulating substrate (100) comprising the following steps: (a) formation on a substrate (100) of a source (106) and a drain (108) of the transistor consisting of a conductive metal oxide (102), (b) partial anisotropic chemical etching of the metal oxide and simultaneous deposition of a polymer film (110) on portions of the substrate on which said metal oxide is not formed by subjecting the complete entity to a plasma formed from a gaseous mixture containing hydrogen and at least one hydrocarbon which by dissociation leads to the formation of the polymer, said polymer deposit constituting a passivation of the substrate (100) and/or an optical mask beneath the transistor channel, (c) successive depositions on the substrate obtained in (b) of an amorphous hydrogenated silicon coating (112), an electrically insulating coating (114) and a conductive coating (116) and (d) photoetching the conductive coating to form the transistor gate.

Claim 14

Process according to claim 11, characterized in that steps (a) to (d) are performed by the dry etching technique.

Claim 15

Process according to claim 11, characterized in that the deposited polymer thickness and the metal oxide thickness left after etching are equal so as to obtain a transistor with a planar structure.