Patent US4751557A successfully refreshed from Google Patents.
US4751557A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Dram with FET stacked over capacitor
Assignee: Hitachi Ltd
•
Filing: 1986-09-08
•
Granted: 1988-06-14
•
Expires: 2006-09-08
Abstract
Abstract A semiconductor memory wherein a part of each capacitor is formed on side walls of an island region surrounded with a recess formed in a semiconductor substrate, and the island region and other regions are electrically isolated by the recess.
Inventors
- 👤 Hideo Sunami
- 👤 Tokuo Kure
- 👤 Yoshifumi Kawamoto
- 👤 Masao Tamura
- 👤 Masanobu Miyao
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 04:58
CPC Classifications
H; H10; H10B; H10B12/00; G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; H10B12/30; H10B12/39; H10B12/395; H10P; H10P76/00; H10P76/40; H10W; H10W10/00; H10W10/01; H10W10/041; H10W10/40
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
201 words
A semiconductor memory which is formed in a semiconductor substrate comprising: capacitors for storing information and insulated-gate field effect transistors for reading out the signal charges stored in said capacitors, wherein the capacitors each include electrodes formed at the sidewalls of a recess provided in the semiconductor substrate, wherein the sidewalls of the recess are covered by an insulating layer and a layer of conductive material is formed over said insulating material to form a capacitor plate separated from said sidewalls of the recess by said insulating layer, and wherein different sidewalls of the recess form electrodes for memory cells which are independent of one another so that the electrodes formed by said sidewalls of said recess form respective capacitors for said independent memory cells, wherein a source or drain of each of said insulated-gate field effect transistors is connected to one of said electrodes of the recess, wherein a drain or source of each of said insulated-gate field effect transistors is connected to a data line, wherein a gate electrode of each of said insulated-gate field effect transistors is connected to a word line, and wherein each said insulated-gate field effect transistors is formed respectively on one of said capacitors.
Claim 2
Dependent Claim
201 words
A semiconductor memory which is formed in a semiconductor substrate comprising: capacitors for storing information and insulated-gate field effect transistors for reading out the signal charges stored in said capacitors, wherein the capacitors each include electrodes formed at the sidewalls of a recess provided in the semiconductor substrate, wherein the sidewalls of the recess are covered by an insulating layer and a layer of conductive material is formed over said insulating material to form a capacitor plate separated from said sidewalls of the recess by said insulating layer, and wherein different sidewalls of the recess form electrodes for memory cells which are independent of one another so that the electrodes formed by said sidewalls of said recess form respective capacitors for said independent memory cells, wherein a source or drain of each of said insulated-gate field effect transistors is connected to one of said electrodes of the recess, wherein a drain or source of each of said insulated-gate field effect transistors is connected to a data line, wherein a gate electrode of each of said insulated-gate field effect transistors is connected to a word line, and wherein each said insulated-gate field effect transistors is formed respectively on one of said capacitors.
Claim 3
Dependent Claim
32 words
The semiconductor memory according to claim 1, wherein said insulated-gate field effect transistors are formed in a single crystalline semiconductor layer extending on an interlayer insulation film deposited on said semiconductor substrate.
Claim 4
Dependent Claim
18 words
The semiconductor memory according to claim 2, wherein said interlayer insulation film is deposited on said capacitor plate.
Claim 5
Dependent Claim
37 words
The semiconductor memory according to claim 3, wherein the upper edges of said recesses are rounded by a wet etching of the substrate previous to a dry etching step for forming the deeper portions of the recesses.
Claim 6
Dependent Claim
31 words
The semiconductor memory according to claim 4, wherein a highly doped zone having the same conductivity type as the substrate is provided in said substrate at the bottom of the recesses.
Claim 7
Dependent Claim
31 words
The semiconductor memory according to claim 5, wherein a highly doped zone having the same conductivity type as a substrate surrounds the source and drain regions of said field effect transistors.
Claim 8
Dependent Claim
48 words
The semiconductor memory according to claim 6, wherein the recesses are surrounded by highly doped capacitor electrode regions having a conductivity type opposite to the substrate, and a doped zone having the same conductivity type as the substrate being provided between the substrate and said capacitor electrode regions.
Claim 9
Dependent Claim
17 words
The semiconductor memory according to claim 7, wherein each of the recesses has corrugated or interdigitated sidewalls.
Claim 10
Dependent Claim
18 words
The semiconductor memory according to claim 7, wherein two or more apertures are formed within a capacitor region.
Claim 11
Dependent Claim
18 words
The semiconductor memory according to claim 7, wherein an aperture within the capacitor region has an inward protrusion.
Claim 12
Dependent Claim
20 words
The semiconductor memory according to claim 7, wherein an island-like column exists in an aperture formed in the capacitor region.
References Cited (Backward Citations)
US3962713A
Cited
US4065742A
Cited
US4017885A
Cited
JPS51130178A
Cited
US4467450A
Cited
JPS5376686A
Cited
US4140558A
Cited
JPS54121080A
Cited
JPS5511365A
Cited
US4329704A
Cited
JPS5555557A
Cited
US4462040A
Cited
JPS5630763A
Cited
US4470062A
Cited
US4262298A
Cited
US4271418A
Cited
JPS5681974A
Cited
US4455740A
Cited
US4327476A
Cited
US4353086A
Cited
JPS5710973A
Cited
US4397075A
Cited
US4409608A
Cited
US4511911A
Cited
US4505026A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1991-06-14 | 1991-12-14 | 1992-06-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1995-06-14 | 1995-12-14 | 1996-06-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1999-06-14 | 1999-12-14 | 2000-06-14 | $7700.00 | Window Closed / Lapsed |