US4327476A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of manufacturing semiconductor devices
Assignee: Toshiba Corp
•
Filing: 1980-11-28
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Granted: 1982-05-04
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Expires: 2000-11-28
Abstract
Abstract A method of manufacturing semiconductor devices is disclosed which comprises the steps of: forming at least one groove at a given location of a semiconductor substrate; laying an insulating film over the entire surface of the semiconductor substrate including the groove; depositing conductive material on the insulating layer to a thickness greater than half the width of an opening of the groove; and forming a MOS capacitor electrode of the conductor layer left in the groove by etching the deposited conductor layer until the insulating film other than its portion within the groove is exposed.
Inventors
- 👤 Hiroshi Iwai
- 👤 Yoshio Nishi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 11:37
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/01; H10D1/045; H10D1/047; H10B; H10B12/00; H10B12/30; H10B12/37; H10D1/60; H10D1/62; H10D1/66; H10D1/665; Y; Y10; Y10S; Y10S148/00; Y10S148/05; Y10S148/118; Y10S148/136
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
92 words
A method of manufacturing semiconductor devices comprising the steps of: forming at least one groove at a given location of a semiconductor substrate; laying an insulating film over the entire surface of said semiconductor substrate including said groove; depositing conductive material on said insulating layer to a thickness greater than half the width of an opening of said groove; and forming a MOS capacitor electrode of the conductor layer residual in said groove by etching said deposited conductor layer until the insulating film other than its portion within said groove is exposed.
Claim 2
Independent Claim
92 words
A method of manufacturing semiconductor devices comprising the steps of: forming at least one groove at a given location of a semiconductor substrate; laying an insulating film over the entire surface of said semiconductor substrate including said groove; depositing conductive material on said insulating layer to a thickness greater than half the width of an opening of said groove; and forming a MOS capacitor electrode of the conductor layer residual in said groove by etching said deposited conductor layer until the insulating film other than its portion within said groove is exposed.
Claim 3
Dependent Claim
14 words
A method according to claim 1, wherein said groove has substantially vertical side faces.
Claim 4
Dependent Claim
42 words
A method according to claim 2, wherein said groove is formed by forming a mask with a given pattern on said semiconductor substrate and etching away given part of said semiconductor substrate through said mask layer by the reactive ion etching process.
Claim 5
Dependent Claim
15 words
A method according to claim 1, wherein said groove is shaped V in cross section.
Claim 6
Dependent Claim
50 words
A method according to claim 4, wherein the thickness of said deposited conductor layer satisfied the following formula: ##EQU2## where t: the thickness of the deposited conductor layer, a: width of the groove opening, θ: the angle (°) at which the sides of the groove incline to the vertical line.
Claim 7
Dependent Claim
13 words
A method according to claim 1, wherein said groove is shaped inversely tapered.
Claim 8
Dependent Claim
23 words
A method according to claim 1, wherein said conductor layer within said groove is over-etched lower than the upper face of the substrate.
Claim 9
Dependent Claim
15 words
A method according to claim 1, wherein said groove includes two grooves with different depths.
Claim 10
Dependent Claim
34 words
A method according to claim 1, further comprising the step for forming a mask layer on that portion of said conductor layer which will be an interconnection layer to cover said groove in part.
Claim 11
Dependent Claim
33 words
A method according to claim 1, further comprising the step for forming a mask layer on that portion of said conductor layer which will be a gate electrode not to cover the groove.
Claim 12
Dependent Claim
52 words
A method according to claim 1, further comprising the step for forming a mask layer on that portion of said conductor layer which will be an interconnection layer to cover the groove in part and that portion of the conductor layer which will be a gate electrode not to cover the groove.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-05-03 | 1985-11-02 | 1986-05-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-05-03 | 1989-11-02 | 1990-05-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-05-03 | 1993-11-02 | 1994-05-04 | $7700.00 | Window Closed / Lapsed |