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US6630372B2
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US
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Method for routing die interconnections using intermediate connection elements secured to the die face
Assignee: Micron Technology Inc
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Filing: 2001-11-01
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Granted: 2003-10-07
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Expires: 2021-11-01
Abstract
Abstract A semiconductor device, such as an integrated circuit die, includes a plurality of bond pads on an active surface thereof electrically connected to internal circuitry of the semiconductor device, and a plurality of jumper pads on the active surface which are electrically isolated from internal circuitry of the die. The jumper pads effectively provide stepping stones for wire bonds to be made across the active surface between bond pads. The jumper pads may be formed directly on the semiconductor device or on a non-conductive support structure that is attached to the semiconductor device.
Inventors
- 👤 Michael B. Ball
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-07 14:27
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/90; H10W70/00; H10W70/40; H10W70/411; H10W70/415; H10W72/20; H10W72/251; H10W72/29; H10W72/50; H10W72/541; H10W72/5449; H10W72/5453; H10W72/547; H10W72/5473; H10W72/551; H10W72/552; H10W72/5522; H10W72/5524; H10W72/851; H10W72/874; H10W72/884; H10W72/931; H10W72/932; H10W90/00; H10W90/701; H10W90/751; H10W90/756
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
133 words
A method of routing external interconnections among a plurality of bond pads on an active surface of at least one semiconductor die, comprising: providing at least one electrically conductive discrete pad on said active surface of said at least one semiconductor die; electrically isolating a die facing portion of said at least one electrically conductive discrete pad and a periphery defined about said die facing portion; wire bonding from one of said plurality of bond pads to said at least one electrically conductive discrete pad; providing a lead frame including a plurality of lead fingers proximate said at least one semiconductor die; attaching said at least one semiconductor die to said lead frame; and wire bonding from said at least one electrically conductive discrete pad to one of said plurality of lead fingers.
Claim 2
Independent Claim
133 words
A method of routing external interconnections among a plurality of bond pads on an active surface of at least one semiconductor die, comprising: providing at least one electrically conductive discrete pad on said active surface of said at least one semiconductor die; electrically isolating a die facing portion of said at least one electrically conductive discrete pad and a periphery defined about said die facing portion; wire bonding from one of said plurality of bond pads to said at least one electrically conductive discrete pad; providing a lead frame including a plurality of lead fingers proximate said at least one semiconductor die; attaching said at least one semiconductor die to said lead frame; and wire bonding from said at least one electrically conductive discrete pad to one of said plurality of lead fingers.
Claim 3
Dependent Claim
31 words
The method of claim 1 , further comprising wire bonding from at least one other electrically conductive discrete pad on said active surface to another of said plurality of bond pads.
Claim 4
Dependent Claim
33 words
The method of claim 2 , further comprising wire bonding from said at least one other electrically conductive discrete pad to at least a third electrically conductive discrete pad on said active surface.
Claim 5
Dependent Claim
41 words
The method of claim 1 , wherein said at least one electrically conductive discrete pad is provided by performing at least one of the group comprising silk screening, printing, spraying, electrochemically depositing, masking and etching, electroplating, electrolessly plating, and adhesively attaching.
Claim 6
Dependent Claim
37 words
The method of claim 1 , further comprising: attaching said at least one electrically conductive discrete pad to an insulating material; and attaching said insulating material to said active surface of said at least one semiconductor die.
Claim 7
Dependent Claim
21 words
The method of claim 5 , further comprising selecting said insulating material from the group comprising thermosetting tape and adhesive tape.
Claim 8
Dependent Claim
29 words
The method of claim 1 , further comprising selecting a material comprising said at least one electrically conductive discrete pad from the group comprising metals, alloys, and conductive epoxies.
Claim 9
Dependent Claim
64 words
The method of claim 1 , further comprising: providing said lead frame with at least one bus bar, said at least one bus bar extending over at least a portion of said active surface of said at least one semiconductor die; and wire bonding from at least one other electrically conductive discrete pad on said active surface to said at least one bus bar.
Claim 10
Independent Claim
119 words
A method of routing external interconnections among a plurality of bond pads on an active surface of at least one semiconductor die, comprising: providing at least one electrically conductive discrete pad on said active surface of said at least one semiconductor die in electrical isolation from said active surface; wire bonding from one of said plurality of bond pads to said at least one electrically conductive discrete pad; providing a lead frame; attaching said at least one semiconductor die to said lead frame, said lead frame including a plurality of lead fingers proximate said at least one semiconductor die; and wire bonding from said at least one electrically conductive discrete pad to one of said plurality of lead fingers.
Claim 11
Independent Claim
119 words
A method of routing external interconnections among a plurality of bond pads on an active surface of at least one semiconductor die, comprising: providing at least one electrically conductive discrete pad on said active surface of said at least one semiconductor die in electrical isolation from said active surface; wire bonding from one of said plurality of bond pads to said at least one electrically conductive discrete pad; providing a lead frame; attaching said at least one semiconductor die to said lead frame, said lead frame including a plurality of lead fingers proximate said at least one semiconductor die; and wire bonding from said at least one electrically conductive discrete pad to one of said plurality of lead fingers.
Claim 12
Independent Claim
151 words
A method of routing external interconnections among a plurality of bond pads on an active surface of at least one semiconductor die, comprising: providing at least one electrically conductive discrete pad on said active surface of said at least one semiconductor die in electrical isolation from said active surface; wire bonding from one of said plurality of bond pads to said at least one electrically conductive discrete pad; providing a lead frame; attaching said at least one semiconductor die to said lead frame, said lead frame including a plurality of lead fingers proximate said at least one semiconductor die; providing said lead frame with at least one bus bar, said at least one bus bar extending over at least a portion of said active surface of said at least one semiconductor die; and wire bonding from said at least one electrically conductive discrete pad to said at least one bus bar.
Claim 13
Independent Claim
151 words
A method of routing external interconnections among a plurality of bond pads on an active surface of at least one semiconductor die, comprising: providing at least one electrically conductive discrete pad on said active surface of said at least one semiconductor die in electrical isolation from said active surface; wire bonding from one of said plurality of bond pads to said at least one electrically conductive discrete pad; providing a lead frame; attaching said at least one semiconductor die to said lead frame, said lead frame including a plurality of lead fingers proximate said at least one semiconductor die; providing said lead frame with at least one bus bar, said at least one bus bar extending over at least a portion of said active surface of said at least one semiconductor die; and wire bonding from said at least one electrically conductive discrete pad to said at least one bus bar.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2006-10-06 | 2007-04-07 | 2007-10-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2010-10-06 | 2011-04-07 | 2011-10-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2014-10-06 | 2015-04-07 | 2015-10-07 | $7700.00 | Window Closed / Lapsed |