US5963789A
Expired / Lapsed
US
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Method for silicon island formation
Assignee: Toshiba Corp
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Filing: 1996-07-08
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Granted: 1999-10-05
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Expires: 2016-07-08
Abstract
Abstract A method is disclosed of manufacturing improved device structures which include a device structure having STI and a thin foot charge drain beneath the device area on an inexpensive bulk silicon substrate. The structures retain high speed operation of SOI devices without any adverse effects of charge build-up and floating effects as observed in conventional SOI devices, and, furthermore, are constructed without any extra process steps added to the conventional STI technology except for an isotropic etching step. The invention also contemplates construction of multi-level electronic circuit. In various embodiments, the invention includes steps of forming a photoresist pattern over a semiconductor substrate to designate a plurality of islands, anisotropic etching the substrate to form plurality of designate islands which develops thin passivation layer on the sidewall, performing successively an isotropic etching on the resulting structure to create a thin foot region under each of the plurality of the islands with the help of the passivation layer, and forming a thin thermal oxide layer to improve the interface quality between each thin foot region and the insulator. Additional layers of silicon islands may be formed on the resulting structure.
Inventors
- 👤 Masakatsu Tsuchiaki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 05:28
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10W10/011; H10W10/014; H10W10/17
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
182 words
A method of manufacturing a semiconductor device, comprising the steps of: (1) forming a resist pattern over a semiconductor substrate to designate a plurality of islands; (2) anisotropically etching the structure resulting from step (1) to form the plurality of designated islands from the semiconductor substrate; (3) isotropically etching the structure resulting from step (2), using only a deposition film formed on the sides of the islands during said anisotropic etching step as a protective mask of the sides of the islands, and creating from the structure a plurality of thin foot regions each of which connects one of the plurality of islands formed in step (2) to the semiconductor substrate; (4) removing the deposition film from the structure resulting from step (3); and (5) oxidizing the structure resulting from step (4) to form a thermal oxidation layer on the sides of the islands and the thin foot regions, while leaving the inner portion of the thin foot regions to be a non-oxidized portion which provides a conductive charge drain interface between each of the plurality of islands and the semiconductor substrate.
Claim 2
Independent Claim
182 words
A method of manufacturing a semiconductor device, comprising the steps of: (1) forming a resist pattern over a semiconductor substrate to designate a plurality of islands; (2) anisotropically etching the structure resulting from step (1) to form the plurality of designated islands from the semiconductor substrate; (3) isotropically etching the structure resulting from step (2), using only a deposition film formed on the sides of the islands during said anisotropic etching step as a protective mask of the sides of the islands, and creating from the structure a plurality of thin foot regions each of which connects one of the plurality of islands formed in step (2) to the semiconductor substrate; (4) removing the deposition film from the structure resulting from step (3); and (5) oxidizing the structure resulting from step (4) to form a thermal oxidation layer on the sides of the islands and the thin foot regions, while leaving the inner portion of the thin foot regions to be a non-oxidized portion which provides a conductive charge drain interface between each of the plurality of islands and the semiconductor substrate.
Claim 3
Dependent Claim
46 words
The method of claim 1, further comprising the step of controlling the width and resistance of each thin-foot region to satisfy the relation R tf *W<24 kΩμm, where R tf is the resistance of each thin-foot region, and W is the half-width of each thin-foot region.
Claim 4
Dependent Claim
32 words
The method of claim 1, further comprising the steps of: (6) filling voids between each of the plurality of islands with an insulator; and (7) planarizing the structure resulting from step (6).
Claim 5
Dependent Claim
17 words
The method of claim 1, wherein step (2) comprises the step of performing reactive ion etching (RIE).
Claim 6
Dependent Claim
39 words
The method of claim 1, wherein step (3) comprises the step of performing isotropic etching to a depth wherein each thin foot region has a width which is approximately 5% to 20% of the width of a corresponding island.
Claim 7
Dependent Claim
27 words
The method of claim 1, wherein step (1) comprises the step of forming a silicon nitride layer on the semiconductor substrate prior to forming the resist pattern.
Claim 8
Dependent Claim
23 words
The method of claim 1, further comprising the step of, prior to step (3), forming passivation areas on the sides of each island.
Claim 9
Dependent Claim
22 words
The method of claim 2, further comprising the step of forming an amorphous silicon layer on the structure resulting from step (7).
Claim 10
Independent Claim
171 words
A method of manufacturing a silicon-on-insulator device, comprising the steps of: (1) forming a resist pattern over a silicon substrate to designate a plurality of silicon islands; (2) anisotropically etching the structure resulting from step (1) to form the plurality of designated silicon islands from the silicon substrate and forming thereby a passivation layer on the sides of the silicon islands; (3) performing isotropic etching, using only a deposition film formed on the sides of the islands during said anisotropic etching step as a protective mask of the sides of the islands, on the structure resulting from step (3) to a depth which creates a thin foot region beneath each of the silicon islands formed in step (2); and (4) removing the deposition film from the structure resulting from step (3); and (5) oxidizing the structure resulting from step (4) to form an oxidation layer on the sides of the islands and the thin foot regions, while leaving the inner portion of the thin foot regions to be a non-oxidized portion.
Claim 11
Independent Claim
171 words
A method of manufacturing a silicon-on-insulator device, comprising the steps of: (1) forming a resist pattern over a silicon substrate to designate a plurality of silicon islands; (2) anisotropically etching the structure resulting from step (1) to form the plurality of designated silicon islands from the silicon substrate and forming thereby a passivation layer on the sides of the silicon islands; (3) performing isotropic etching, using only a deposition film formed on the sides of the islands during said anisotropic etching step as a protective mask of the sides of the islands, on the structure resulting from step (3) to a depth which creates a thin foot region beneath each of the silicon islands formed in step (2); and (4) removing the deposition film from the structure resulting from step (3); and (5) oxidizing the structure resulting from step (4) to form an oxidation layer on the sides of the islands and the thin foot regions, while leaving the inner portion of the thin foot regions to be a non-oxidized portion.
Claim 12
Dependent Claim
35 words
The method of claim 9, wherein step (3) comprises the step of etching to a depth such that each thin foot region has a width of approximately 5% of the width of each silicon island.
Claim 13
Dependent Claim
35 words
The method of claim 9, further comprising the steps of:. (6) filling voids between the islands resulting from the structure of step (5) with an insulator; and (7) planarizing the structure resulting from step (6).
Claim 14
Dependent Claim
39 words
The method of claim 11, further comprising the steps of: (8) forming an amorphous silicon layer on the structure resulting from step (7); and (9) annealing the amorphous silicon layer to create crystal silicon plates over the silicon islands.
Claim 15
Dependent Claim
22 words
The method of claim 12, further comprising the step of removing portions of the amorphous silicon layer between the crystal silicon plates.
Claim 16
Dependent Claim
54 words
The method of claim 12, further comprising the steps of: (10) forming a second set of resist patterns over the crystal silicon plates to designate a second set of silicon islands; and (11) performing an additional etching step using the second set of resist patterns and creating therefrom a second set of silicon islands.
Claim 17
Dependent Claim
32 words
The method of claim 14, further comprising the step of: (12) performing a second isotropic etching step and creating therefrom thin foot regions beneath each of the second set of silicon islands.
Claim 18
Dependent Claim
33 words
The method of claim 15, further comprising the steps of: (13) filling voids between the second set of silicon islands with an insulator material; and (14) planarizing the structure resulting from step (13).
Claim 19
Independent Claim
181 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a resist pattern over a semiconductor substrate to designate a plurality of islands; anisotropically etching the structure, resulting from said forming step, to form the plurality of designated islands from the semiconductor substrate; isotropically etching the structure resulting from said anisotropically etching step, using only a deposition film formed on the sides of the islands in said anisotropically etching step as a protective mask of the sides of the islands, and stopping said isotropically etching step thereby leaving a plurality of thin foot regions each of which connects one of the plurality of islands formed in said anisotropically etching step to the semiconductor substrate; oxidizing the structure resulting from said removing step to form a thermal oxidation layer on the sides of the islands and the thin foot regions, said oxidizing step being controlled so as to leave the inner portion of the thin foot regions to be a non-oxidized portion which provides a conductive charge drain interface between each of the plurality of islands and the semiconductor substrate.
Claim 20
Independent Claim
181 words
A method of manufacturing a semiconductor device, comprising the steps of: forming a resist pattern over a semiconductor substrate to designate a plurality of islands; anisotropically etching the structure, resulting from said forming step, to form the plurality of designated islands from the semiconductor substrate; isotropically etching the structure resulting from said anisotropically etching step, using only a deposition film formed on the sides of the islands in said anisotropically etching step as a protective mask of the sides of the islands, and stopping said isotropically etching step thereby leaving a plurality of thin foot regions each of which connects one of the plurality of islands formed in said anisotropically etching step to the semiconductor substrate; oxidizing the structure resulting from said removing step to form a thermal oxidation layer on the sides of the islands and the thin foot regions, said oxidizing step being controlled so as to leave the inner portion of the thin foot regions to be a non-oxidized portion which provides a conductive charge drain interface between each of the plurality of islands and the semiconductor substrate.
Claim 21
Dependent Claim
23 words
The method of claim 17, further comprising the step of removing the deposition film from the structure resulting from said isotropically etching step.
Claim 22
Dependent Claim
31 words
The method of claim 17, further comprising the steps of: filing voids between each of the plurality of islands with an insulator; and planarizing the structure resulting from said filing step.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-10-04 | 2003-04-05 | 2003-10-05 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-10-04 | 2007-04-05 | 2007-10-05 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-10-04 | 2011-04-05 | 2011-10-05 | $7700.00 | Window Closed / Lapsed |