Patent US5878485A successfully refreshed from Google Patents.
US5878485A
Expired / Lapsed
US
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Method for fabricating a carrier for testing unpackaged semiconductor dice
Assignee: Micron Technology Inc
•
Filing: 1996-03-13
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Granted: 1999-03-09
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Expires: 2016-03-13
Abstract
Abstract A method for fabricating a carrier for testing an unpackaged semiconductor die is provided. The carrier includes a carrier base for supporting the die; an interconnect for establishing a temporary electrical connection with the die; and a force distribution mechanism for biasing the die and interconnect together. In an illustrative embodiment the carrier is formed with a laminated ceramic base. The ceramic base includes internal conductive lines that are wire bonded to the interconnect and metal plated external contacts that are connected to external test circuitry. In an alternate embodiment the carrier is formed with an injection molded plastic base and includes 3-D circuitry formed by a metallization and photolithographic process. In either case, the carrier is adapted for testing different die configurations by interchanging different interconnects.
Inventors
- 👤 Alan G. Wood
- 👤 Warren M. Farnworth
- 👤 David R. Hembree
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 06:14
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433; G01R1/0441; G01R1/0466; G01R1/0483; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893; H; H05; H05K; H05K3/00; H05K3/40; H05K3/4007; H10; H10P; H10P72/00; H10P72/70; H10P72/74; H10P74/00; H10P74/23; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/65; H10W70/67; H10W70/68; H10W90/00; H10W90/701; H10W99/00; G01R3/00; G01R31/2855; G01R31/286; G01R31/2863; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0133; H05K2201/03; H05K2201/0332; H05K2201/0335; H05K2201/0347; H05K2201/0364; H05K2201/0367; H05K2201/0388; H05K2201/0394; H05K2201/09; H05K2201/09209; H05K2201/09372; H05K2201/09481; H05K2201/095; H05K2201/09563; H05K2203/00; H05K2203/03; H05K2203/0307; H05K2203/07; H05K2203/0703; H05K2203/0723; H05K3/0058; H05K3/0067; H05K3/42; H05K3/423; H10W70/654; H10W70/655; H10W70/681; H10W72/00; H10W72/071; H10W72/0711; H10W72/07178; H10W72/075; H10W72/07502; H10W72/07504; H10W72/07551; H10W72/50; H10W72/90; H10W72/931; H10W72/932; H10W74/00; H10W90/20; H10W90/24; H10W90/721; H10W90/722; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/49155; Y10T29/49158; Y10T29/49169; Y10T29/49171; Y10T29/49172
Claims Analysis
Total Claims: 33
Claim 1
Independent Claim
144 words
A method for fabricating a carrier for testing a semiconductor die, comprising: providing an interconnect comprising a plurality of first contacts configured to electrically contact a plurality of second contacts on the die; molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, and a plurality of vias extending from the first surface to the second surface; forming a plurality of first conductors on the first surface configured for electrical communication with the first contacts, and a plurality of second conductors on the second surface configured for electrical communication with external contacts on the base; forming an electrically conductive material within the vias to electrically connect the first conductors to the second conductors; and mounting the interconnect to the base with the first contacts in electrical communication with the first conductors and the external contacts.
Claim 2
Independent Claim
144 words
A method for fabricating a carrier for testing a semiconductor die, comprising: providing an interconnect comprising a plurality of first contacts configured to electrically contact a plurality of second contacts on the die; molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, and a plurality of vias extending from the first surface to the second surface; forming a plurality of first conductors on the first surface configured for electrical communication with the first contacts, and a plurality of second conductors on the second surface configured for electrical communication with external contacts on the base; forming an electrically conductive material within the vias to electrically connect the first conductors to the second conductors; and mounting the interconnect to the base with the first contacts in electrical communication with the first conductors and the external contacts.
Claim 3
Dependent Claim
32 words
The method of claim 1 wherein molding the base includes forming a plurality of ribs proximate to the second surface configured to support the external contacts for electrically contacting an electrical socket.
Claim 4
Dependent Claim
32 words
The method of claim 1 wherein molding the base includes forming a plurality of flanges at least partially enclosing the first surface and configured to protect a force mechanism of the carrier.
Claim 5
Dependent Claim
24 words
The method of claim 1 wherein molding the base includes forming an opening in the base for mounting a force mechanism to the base.
Claim 6
Dependent Claim
22 words
The method of claim 1 wherein forming the electrically conductive material in the vias comprises depositing a metal using a plating process.
Claim 7
Dependent Claim
34 words
The method as claimed in claim 1 further comprising during the molding step, forming a third surface on the base configured to mount a bar code for tracking the die during a test procedure.
Claim 8
Independent Claim
167 words
A method for fabricating a carrier for testing a semiconductor die, comprising: providing an interconnect comprising a plurality of first contacts configured to electrically engage a plurality of second contacts on the die; molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, a plurality of vias extending from the first surface to the second surface, and a plurality of ribs configured to engage a socket in electrical communication with test circuitry; forming a plurality of first conductors on the first surface and a plurality of second conductors on the second surface; forming a plurality of external contacts on the ribs in electrical communication with the second conductors and configured for electrical communication with the test circuitry; forming an electrically conductive material within the vias to electrically connect the first conductors to the second conductors; and mounting the interconnect to the base with the first contacts in electrical communication with the first conductors and with the external contacts.
Claim 9
Independent Claim
167 words
A method for fabricating a carrier for testing a semiconductor die, comprising: providing an interconnect comprising a plurality of first contacts configured to electrically engage a plurality of second contacts on the die; molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, a plurality of vias extending from the first surface to the second surface, and a plurality of ribs configured to engage a socket in electrical communication with test circuitry; forming a plurality of first conductors on the first surface and a plurality of second conductors on the second surface; forming a plurality of external contacts on the ribs in electrical communication with the second conductors and configured for electrical communication with the test circuitry; forming an electrically conductive material within the vias to electrically connect the first conductors to the second conductors; and mounting the interconnect to the base with the first contacts in electrical communication with the first conductors and with the external contacts.
Claim 10
Dependent Claim
32 words
The method of claim 7 further comprising during the molding step, forming a third surface on the base configured to mount a bar code for tracking the die during a test procedure.
Claim 11
Dependent Claim
32 words
The method of claim 7 wherein molding the base comprises forming a plurality of flanges at least partially enclosing the first surface and configured to protect a force mechanism of the carrier.
Claim 12
Dependent Claim
24 words
The method of claim 7 wherein molding the base comprises forming an opening in the base for mounting a force mechanism to the base.
Claim 13
Dependent Claim
13 words
The method of claim 7 wherein the base comprises a glass filled plastic.
Claim 14
Dependent Claim
34 words
The method of claim 7 wherein the base comprises a material selected from the group consisting of polyetherimide (PEI), polyethersulfone (PES), polyarylsulfone (PAS), polyphenylene sulfide (PPS), liquid crystal polymer (LCP) and polyether-ether ketone (PPEK).
Claim 15
Dependent Claim
14 words
The method of claim 7 wherein forming the first conductors comprises a plating process.
Claim 16
Dependent Claim
45 words
The method of claim 7 wherein forming the first conductors comprises plating a first layer of metal, forming a first layer of resist, exposing the first layer of resist to form a first mask, and then etching the first layer of metal using the mask.
Claim 17
Dependent Claim
52 words
The method of claim 14 wherein forming the second conductors comprises plating a second layer of metal, forming a second layer of resist on the second layer of metal, exposing the second layer of resist to form a second mask, and then etching the second layer of metal using the second mask.
Claim 18
Independent Claim
185 words
A method for fabricating a carrier for testing a semiconductor die, comprising: providing a force mechanism for applying a force to the die held in the carrier; molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, a plurality of vias extending from the first surface to the second surface, a plurality of ribs configured to engage a socket, and a plurality of flanges at least partially enclosing the first surface and configured to protect the force mechanism; forming a plurality of first conductors on the first surface and a plurality of second conductors on the second surface by plating a first layer of metal on the first surface and a second layer of metal on the second surface and etching the first layer and the second layer; forming an electrically conductive material within the vias to electrically connect the first conductors to the second conductors; and forming a plurality of external contacts on the ribs in electrical communication with the second conductors and configured to electrically engage test circuitry in electrical communication with the socket.
Claim 19
Independent Claim
185 words
A method for fabricating a carrier for testing a semiconductor die, comprising: providing a force mechanism for applying a force to the die held in the carrier; molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, a plurality of vias extending from the first surface to the second surface, a plurality of ribs configured to engage a socket, and a plurality of flanges at least partially enclosing the first surface and configured to protect the force mechanism; forming a plurality of first conductors on the first surface and a plurality of second conductors on the second surface by plating a first layer of metal on the first surface and a second layer of metal on the second surface and etching the first layer and the second layer; forming an electrically conductive material within the vias to electrically connect the first conductors to the second conductors; and forming a plurality of external contacts on the ribs in electrical communication with the second conductors and configured to electrically engage test circuitry in electrical communication with the socket.
Claim 20
Dependent Claim
17 words
The method of claim 16 wherein plating the first layer and the second layer comprises electroless plating.
Claim 21
Dependent Claim
29 words
The method of claim 16 wherein the first layer and the second layer comprise a material selected from the group consisting of copper, nickel, gold, silver and alloys thereof.
Claim 22
Dependent Claim
29 words
The method of claim 16 wherein etching the first layer and the second layer comprises electroplating layers of resists and patterning the layers of resists to form etch masks.
Claim 23
Dependent Claim
35 words
The method of claim 16 wherein the plastic base comprises a material selected from the group consisting of polyetherimide (PEI), polyethersulfone (PES), polyarylsulfone (PAS), polyphenylene sulfide (PPS), liquid crystal polymer (LCP) and polyether-ether ketone (PPEK).
Claim 24
Dependent Claim
34 words
The method of claim 16 further comprising mounting an interconnect to the first surface configured to make temporary electrical connections to the die and placing the interconnect in electrical communication with the first conductors.
Claim 25
Dependent Claim
16 words
The method of claim 21 wherein the interconnect comprises penetrating contact members on a silicon substrate.
Claim 26
Dependent Claim
20 words
The method of claim 21 wherein the interconnect comprises microbump contact members mounted on tape and attached to a substrate.
Claim 27
Independent Claim
160 words
A method for fabricating a carrier for testing a semiconductor die, comprising: molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, a plurality of vias extending from the first surface to the second surface, and a third surface configured to mount a bar code for tracking the die during a test procedure; forming a plurality of first conductors on the first surface and a plurality of second conductors on the second surface; interconnecting the first conductors to the second conductors by at least partially filling the vias with a metal; mounting an interconnect to the base comprising a plurality of first contacts in electrical communication with the first conductors and configured to make temporary electrical connections with a plurality of second contacts on the die; and forming a plurality of external contacts on the base in electrical communication with the second conductors and configured to electrically connect to test circuitry.
Claim 28
Independent Claim
160 words
A method for fabricating a carrier for testing a semiconductor die, comprising: molding a plastic base for retaining the die for testing, the base comprising a first surface, a second surface, a plurality of vias extending from the first surface to the second surface, and a third surface configured to mount a bar code for tracking the die during a test procedure; forming a plurality of first conductors on the first surface and a plurality of second conductors on the second surface; interconnecting the first conductors to the second conductors by at least partially filling the vias with a metal; mounting an interconnect to the base comprising a plurality of first contacts in electrical communication with the first conductors and configured to make temporary electrical connections with a plurality of second contacts on the die; and forming a plurality of external contacts on the base in electrical communication with the second conductors and configured to electrically connect to test circuitry.
Claim 29
Dependent Claim
14 words
The method of claim 24 wherein the plastic base comprises a glass filled plastic.
Claim 30
Dependent Claim
24 words
The method of claim 24 wherein molding the plastic base comprises molding a plurality of external ribs on which the external contacts are formed.
Claim 31
Dependent Claim
20 words
The method of claim 24 wherein molding the plastic base comprises forming an indentation for mounting a pin one indicator.
Claim 32
Dependent Claim
22 words
The method of claim 24 wherein the first contacts comprise projections for penetrating into the second contacts to a limited penetration depth.
Claim 33
Dependent Claim
19 words
The method of claim 24 wherein the first contacts comprise microbumps mounted on tape and attached to a substrate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-03-08 | 2002-09-07 | 2003-03-09 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-03-08 | 2006-09-07 | 2007-03-09 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-03-08 | 2010-09-07 | 2011-03-09 | $7700.00 | Window Closed / Lapsed |