US5495179A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Carrier having interchangeable substrate used for testing of semiconductor dies
Assignee: Micron Technology Inc
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Filing: 1993-09-21
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Granted: 1996-02-27
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Expires: 2013-09-21
Abstract
Abstract A carrier for testing a singularized semiconductor die prior to packaging the die utilizes a removable die supporting substrate. The die is placed in the carrier and is electrically connected to the substrate, thereby allowing for the packaging or other use of only known good die. A bridge clamp presses against a rigid cover which, in turn, bias the die against a plurality of die contacting members located on the die supporting substrate. The use of the removable die supporting substrate permits a single carrier design to accommodate different die types and further permits handling equipment to mechanically handle the one carrier design. This facilitates the handling of the carrier so that the carrier can be conveniently used during burn-in and test procedures.
Inventors
- 👤 Alan G. Wood
- 👤 Warren M. Farnworth
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 09:12
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893; B; B25; B25G; B25G3/00; B25G3/02; B25G3/12; B25G3/28; E; E02; E02F; E02F9/00; E02F9/28; E02F9/2808; E02F9/2816; E02F9/2833; G01R1/00; G01R1/02; G01R1/04; G01R1/0408; G01R1/0433; G01R1/0441; G01R1/0466; G01R1/0483; H; H05; H05K; H05K3/00; H05K3/40; H05K3/4007; H10; H10P; H10P72/00; H10P72/70; H10P72/74; H10P74/00; H10P74/23; H10W; H10W70/00; H10W70/60; H10W70/62; H10W70/65; H10W70/67; H10W70/68; H10W90/00; H10W90/701; H10W99/00; G01R3/00; G01R31/2855; G01R31/286; G01R31/2863; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0133; H05K2201/03; H05K2201/0332; H05K2201/0335; H05K2201/0347; H05K2201/0364; H05K2201/0367; H05K2201/0388; H05K2201/0394; H05K2201/09; H05K2201/09209; H05K2201/09372; H05K2201/09481; H05K2201/095; H05K2201/09563; H05K2203/00; H05K2203/03; H05K2203/0307; H05K2203/07; H05K2203/0703; H05K2203/0723; H05K3/0058; H05K3/0067; H05K3/42; H05K3/423; H10W70/654; H10W70/655; H10W70/681; H10W72/00; H10W72/071; H10W72/0711; H10W72/07178; H10W72/072; H10W72/20; H10W72/241; H10W90/20; H10W90/24; H10W90/721; H10W90/722
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
134 words
Apparatus for testing a discrete bare semiconductor die, comprising: a) a substrate for providing an electrical connection between the die and test circuitry; b) the substrate including a plurality of contacts in electrical communication with circuit traces, said contacts adapted to establish electrical communication with contact locations on the die; c) a base for retaining the die and substrate; d) a latching mechanism attached to the base for securing the substrate to the base, said latching mechanism including terminal contacts adapted to contact the substrate and establish an electrical connection between the circuit traces on the substrate and the test circuitry; and e) clamp means attached to the base for biasing the die and substrate together and forcing the contacts on the substrate against the contact locations on the die with a predetermined force.
Claim 2
Dependent Claim
134 words
Apparatus for testing a discrete bare semiconductor die, comprising: a) a substrate for providing an electrical connection between the die and test circuitry; b) the substrate including a plurality of contacts in electrical communication with circuit traces, said contacts adapted to establish electrical communication with contact locations on the die; c) a base for retaining the die and substrate; d) a latching mechanism attached to the base for securing the substrate to the base, said latching mechanism including terminal contacts adapted to contact the substrate and establish an electrical connection between the circuit traces on the substrate and the test circuitry; and e) clamp means attached to the base for biasing the die and substrate together and forcing the contacts on the substrate against the contact locations on the die with a predetermined force.
Claim 3
Dependent Claim
39 words
Apparatus as described in claim 1, and wherein: a) the circuit traces are in electrical communication with contact pads formed on the substrate; and b) the terminal contacts of said latching mechanism engage said contact pads on the substrate.
Claim 4
Dependent Claim
62 words
Apparatus as described in claim 2, and wherein: a) a release member is attached to the base, the release member being movable relative to the substrate; b) the terminal contacts are formed as latches releasable by movement of the release member; c) the relative movement of the release member is adapted to move the terminal contacts out of engagement with the substrate.
Claim 5
Dependent Claim
50 words
Apparatus as described in claim 1, wherein said substrate further comprises: a raised portion formed on each contact, the raised portion adapted to penetrate its respective contact location on the die while a top surface of the contact limits a penetration depth, thereby establishing electrical communication with said contact location.
Claim 6
Dependent Claim
22 words
Apparatus as described in claim 4, and wherein: the plurality of contacts are formed on the substrate using semiconductor circuit fabrication techniques.
Claim 7
Dependent Claim
30 words
Apparatus as described in claim 6, and wherein: the substrate is formed of silicon material, and the circuit traces are formed on the silicon material by semiconductor circuit fabrication techniques.
Claim 8
Dependent Claim
48 words
Apparatus as described in claim 4, and further comprising: a pad which is electrically conductive in a Z-axis, normal to a plane of the pad, and which provides electrical isolation across the plane of the pad, the pad being positioned between the die and the plurality of contacts.
Claim 9
Independent Claim
144 words
An apparatus for testing a discrete, unpackaged semiconductor die comprising: a base for retaining the die; a substrate placed within the base for establishing electrical communication between the die and test circuitry, the substrate including a contact adapted to penetrate a contact location on the die, and a circuit trace in electrical communication with the contact; a latching mechanism attached to the base for securing the substrate to the base and having a movable terminal contact adapted to contact the die supporting substrate to secure the die to the substrate and to establish electrical communication between the circuit trace and the test circuitry; and a bridge clamp removably attached to the base including a spring for applying a predetermined force to the die to bias the die against the substrate so that the contact on the substrate penetrates the contact location on the die.
Claim 10
Independent Claim
144 words
An apparatus for testing a discrete, unpackaged semiconductor die comprising: a base for retaining the die; a substrate placed within the base for establishing electrical communication between the die and test circuitry, the substrate including a contact adapted to penetrate a contact location on the die, and a circuit trace in electrical communication with the contact; a latching mechanism attached to the base for securing the substrate to the base and having a movable terminal contact adapted to contact the die supporting substrate to secure the die to the substrate and to establish electrical communication between the circuit trace and the test circuitry; and a bridge clamp removably attached to the base including a spring for applying a predetermined force to the die to bias the die against the substrate so that the contact on the substrate penetrates the contact location on the die.
Claim 11
Dependent Claim
29 words
The apparatus as claimed in claim 8 and further comprising: contact pads formed on the substrate in electrical communication with the circuit traces for contact with the terminal contact.
Claim 12
Dependent Claim
37 words
The apparatus as claimed in claim 8 and wherein: the contact on the substrate includes a raised portion adapted to pierce the contact location on the die while the remainder of the contact limits a penetration depth.
Claim 13
Dependent Claim
40 words
The apparatus as claimed in claim 8 and further comprising: a cover placed between the clamp and die and including an opening to permit the die to be attached to the cover for loading into the apparatus using a vacuum.
Claim 14
Dependent Claim
20 words
The apparatus as claimed in claim 8 and wherein: the substrate is formed of silicon using semiconductor circuit fabrication techniques.
Claim 15
Dependent Claim
24 words
The apparatus as claimed in claim 8 and wherein: the substrate is formed of a ceramic material and the contacts are formed by doinking.
Claim 16
Dependent Claim
21 words
The apparatus as claimed in claim 8 and further comprising: a Z-axis anisotropic interconnect material placed between the die and substrate.
Claim 17
Dependent Claim
18 words
The apparatus as claimed in claim 8 and wherein: the base includes a recess for retaining the substrate.
Claim 18
Independent Claim
152 words
An apparatus for testing a singularized, unpackaged semiconductor die comprising: a base for retaining the die; a substrate mounted within the base for establishing electrical communication between the die and test circuitry, the substrate including a contact having a raised portion adapted to penetrate a contact location on the die while a remainder of the contact limits a penetration depth, and a circuit trace in electrical communication with the contact; a latching mechanism attached to the base for securing the substrate to the base and having a movable terminal contact adapted to contact the substrate to establish electrical communication between the circuit trace and the test circuitry; and a clamp removably attached to the base and including a spring for applying a predetermined force to the die to bias the die against the substrate so that the contact on the substrate penetrates the contact location on the die to a predetermined depth.
Claim 19
Independent Claim
152 words
An apparatus for testing a singularized, unpackaged semiconductor die comprising: a base for retaining the die; a substrate mounted within the base for establishing electrical communication between the die and test circuitry, the substrate including a contact having a raised portion adapted to penetrate a contact location on the die while a remainder of the contact limits a penetration depth, and a circuit trace in electrical communication with the contact; a latching mechanism attached to the base for securing the substrate to the base and having a movable terminal contact adapted to contact the substrate to establish electrical communication between the circuit trace and the test circuitry; and a clamp removably attached to the base and including a spring for applying a predetermined force to the die to bias the die against the substrate so that the contact on the substrate penetrates the contact location on the die to a predetermined depth.
Claim 20
Dependent Claim
32 words
The apparatus as claimed in claim 16 and further comprising: a cover placed between the die and spring and including an opening for attaching the die to the cover using a vacuum.
Claim 21
Dependent Claim
20 words
The apparatus as claimed in claim 16 and wherein: the contact is formed as a bump having a pointed projection.
Claim 22
Dependent Claim
33 words
The apparatus as claimed in claim 16 and further comprising: a release member attached to the base for moving the latching mechanism to move the terminal contact out of contact with the substrate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1999-02-26 | 1999-08-28 | 2000-02-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2003-02-26 | 2003-08-28 | 2004-02-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2007-02-26 | 2007-08-28 | 2008-02-27 | $7700.00 | Window Closed / Lapsed |