US3810016A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Test probe for semiconductor devices
Assignee: AT&T Inc
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Filing: 1971-12-17
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Granted: 1974-05-07
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Expires: 1991-12-17
Abstract
Abstract An intricate micro-probe for testing beam-lead semiconductor devices such as integrated circuits is formed from a molded insulator, a die-cut compensating member and photo-etched contact elements. The configuration of the various elements of the probe is such that mechanized fabrication and assembly of the small probe are possible. The contact elements are photo-etched from a blank which also yields a connected frame having a unique expansion feature permitting three-dimensional shaping of the elements without stretching the elements. The contact elements are thermally embedded into the plastic insulator. A shaping of the contact elements is accomplished with a pyramidal shaping tool and a cut-off blade which trims the contact elements against the pyramidal shaping tool.
Inventors
- 👤 G Chayka
- 👤 E Persson
- 👤 N Ziobro
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 16:27
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07342
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
170 words
An electrical test probe comprising: an annular frame of thermoplastic material, said frame having opposing surfaces generally parallel to the plane defined by said frame; and groups of electrical leads extending from the outer edge of said frame toward the inner edge along only one of said opposing surfaces, and having ends projecting in cantilevered fashion into the open center of the frame, each said projecting lead end having a bend therein such that the portion closest to the tip of each lead is inclined away from said plastic frame; different ones of said lead groups being disposed around the periphery of said frame at approximately integral multiples of ninety degrees from each other. segments of all said leads being embedded in the one surface such that the embedded portions of the segments are contiguous with and retained by the thermoplastic material at and adjacent to said one surface; and an annular resilient member sandwiched between said one surface and a portion of each said lead extending along said surface.
Claim 2
Dependent Claim
170 words
An electrical test probe comprising: an annular frame of thermoplastic material, said frame having opposing surfaces generally parallel to the plane defined by said frame; and groups of electrical leads extending from the outer edge of said frame toward the inner edge along only one of said opposing surfaces, and having ends projecting in cantilevered fashion into the open center of the frame, each said projecting lead end having a bend therein such that the portion closest to the tip of each lead is inclined away from said plastic frame; different ones of said lead groups being disposed around the periphery of said frame at approximately integral multiples of ninety degrees from each other. segments of all said leads being embedded in the one surface such that the embedded portions of the segments are contiguous with and retained by the thermoplastic material at and adjacent to said one surface; and an annular resilient member sandwiched between said one surface and a portion of each said lead extending along said surface.
Claim 3
Dependent Claim
180 words
An electrical test probe comprising: an annular frame of thermoplastic material, said frame having opposing surfaces generally parallel to the plane defined by said frame; and groups of electrical leads extending from the outer edge of said frame toward the inner edge along only one of said opposing surfaces, and having ends projecting in cantilevered fashion into the open center of the frame, each said projecting lead end having a bend therein such that the portion closest to the tip of each lead is inclined away from said plastic frame, different ones of said lead groups being disposed around the periphery of said frame at approximately integral multiples of ninety degrees from each other, segments of all said leads being embedded in the one surface such that the embedded portions of the segments are contiguous with and retained by the thermoplastic material at and adjacent to said one surface; and said one surface having two generally concentric levels, the inner concentric level protruding relative to the outer concentric level in a direction away from the surface opposite said one surface.
Claim 4
Dependent Claim
180 words
An electrical test probe comprising: an annular frame of thermoplastic material, said frame having opposing surfaces generally parallel to the plane defined by said frame; and groups of electrical leads extending from the outer edge of said frame toward the inner edge along only one of said opposing surfaces, and having ends projecting in cantilevered fashion into the open center of the frame, each said projecting lead end having a bend therein such that the portion closest to the tip of each lead is inclined away from said plastic frame, different ones of said lead groups being disposed around the periphery of said frame at approximately integral multiples of ninety degrees from each other, segments of all said leads being embedded in the one surface such that the embedded portions of the segments are contiguous with and retained by the thermoplastic material at and adjacent to said one surface; and said one surface having two generally concentric levels, the inner concentric level protruding relative to the outer concentric level in a direction away from the surface opposite said one surface.
Claim 5
Dependent Claim
43 words
The apparatus of claim 1, wherein each said lead is embedded in said surface only along two spaced-apart segments, and the portion of each lead intermediate said embedded segments bridges said resilient member and holds said member in place adjacent said one surface.
Claim 6
Dependent Claim
21 words
The apparatus of claim 2, wherein segments of each said lead are embedded in said one surface at both said levels.
Claim 7
Dependent Claim
16 words
The apparatus of claim 4, further comprising an annular resilient member positioned adjacent said outer level.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1977-05-06 | 1977-11-05 | 1978-05-07 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1981-05-06 | 1981-11-05 | 1982-05-07 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1985-05-06 | 1985-11-05 | 1986-05-07 | $7700.00 | Window Closed / Lapsed |