Apparatus for performing wafer-level testing of integrated circuits where test pads lie within integrated circuit die but overly no active circuitry for improved yield

Claim 2

A semiconductor wafer comprising: a substrate region; a plurality of N integrated circuits formed over the substrate wherein the N integrated circuits are separated by scribe lines which isolate one integrated circuit from all other integrated circuits adjacent the one integrated circuit, the N integrated circuits being divided into M sub-groups of integrated circuits wherein N and M are finite positive integers wherein N>M; a plurality of L interconnect conductive regions formed overlying the integrated circuits within each of the M sub-groups, L being any finite positive integer, each interconnect conductive region overlying a single sub-group, being isolated from all other interconnect conductive regions which overly adjacent subgroups, and having at least one pad contact area coupled to the plurality of L interconnect conductive regions, the at least one pad contact area directly overlying at least one of the N integrated circuits; and wherein the at least one pad contact area lies within a perimeter of the at least one of the N integrated circuits where no active circuitry is positioned directly underneath the pad contact area.

Claim 3

The semiconductor wafer of claim 1 wherein the at least one pad contact area lies partially over a scribe line area.

Claim 4

The semiconductor wafer of claim 1 wherein each connection between one interconnect conductive region and one sub-group contains a resistor element between the one interconnect conductive region and the one sub-group.

Claim 5

The semiconductor wafer of claim 1 wherein the pads are coupled to conductive elements which provide test-related signals to the sub-groups through the plurality of L interconnect conductive regions.

Claim 6

A semiconductor wafer comprising: a first plurality of integrated circuits arranged over a surface of the wafer in a two-dimensional manner, the integrated circuits containing areas void of active circuitry which are surrounded by active circuitry; a first plurality of metallic contact regions directly over a second plurality of the integrated circuits wherein the second plurality of integrated circuits contains a portion of the integrated circuits from the first plurality of integrated circuits and contains fewer integrated circuits than the first plurality of integrated circuits; a first plurality of metallic interconnects coupling each metallic contact region of the first plurality of metallic contact regions to each integrated circuit in the second plurality of integrated circuits so that the plurality of metallic contact regions communicates signals to the second plurality of integrated circuits to test the second plurality of integrated circuits while other conductors which are electrically separated from the first plurality of metallic contact regions are used to test any integrated circuits not within the second plurality of integrated circuits; and wherein the plurality of metallic contact regions comprise pad regions overlying the areas void of active circuitry.

Claim 7

A semiconductor wafer comprising: a first plurality of integrated circuits arranged over a surface of the wafer in a two-dimensional manner, the integrated circuits containing areas void of active circuitry which are surrounded by active circuitry; a first plurality of metallic contact regions directly over a second plurality of the integrated circuits wherein the second plurality of integrated circuits contains a portion of the integrated circuits from the first plurality of integrated circuits and contains fewer integrated circuits than the first plurality of integrated circuits; a first plurality of metallic interconnects coupling each metallic contact region of the first plurality of metallic contact regions to each integrated circuit in the second plurality of integrated circuits so that the plurality of metallic contact regions communicates signals to the second plurality of integrated circuits to test the second plurality of integrated circuits while other conductors which are electrically separated from the first plurality of metallic contact regions are used to test any integrated circuits not within the second plurality of integrated circuits; and wherein the plurality of metallic contact regions comprise pad regions overlying the areas void of active circuitry.

Claim 8

The semiconductor wafer of claim 5 wherein a third plurality of integrated circuits comprises integrated circuits which are both mutually exclusive to all integrated circuits within the second plurality of integrated circuits and selected from the first plurality of integrated circuits, the third plurality of integrated circuits being coupled to a second plurality of metallic interconnects which are physically separated and electrically isolated on the semiconductor wafer from the first plurality of metallic interconnects.

Claim 9

The semiconductor wafer of claim 5 wherein a third plurality of integrated circuits comprises integrated circuits which are both mutually exclusive to all integrated circuits within the second plurality of integrated circuits and selected from the first plurality of integrated circuits, the third plurality of integrated circuits being coupled to a second plurality of metallic interconnects which are physically separated and electrically isolated on the semiconductor wafer from the first plurality of metallic interconnects.

Claim 10

A semiconductor wafer, comprising: a semiconductor substrate having an upper major surface; a plurality of integrated circuit die having an upper surface, said plurality of integrated circuit die being formed on said semiconductor substrate, the integrated circuit die being separated by scribe lines; and a first plurality of wafer conductors, electrically coupled to a first integrated circuit die of the plurality of integrated circuit die, a first plurality of contact regions of the first plurality of wafer conductors being formed overlying the upper surface of the first integrated circuit die, the first plurality of wafers conductors being wired to provide a plurality of signals to the first integrated circuit, the first plurality of contact regions overlying a portion of the substrate that is void of active circuitry and the first plurality of contact regions not overlying any portion of the scribe lines; a second plurality of wafer conductors, electrically coupled to a second integrated circuit die of the plurality of integrated circuit die, a second plurality of contact regions of the wafer conductor being formed overlying the upper surface of the second integrated circuit die, the second plurality of wafer conductors being wired to provide the same plurality of signals to the second integrated circuit but the first plurality of wafer conductors being disjoined, on the semiconductor wafer, from the second plurality of wafer conductors; and whereby electrical contact can be made to the first one of the plurality of integrated circuit die by way of the wafer conductor for purposes of testing.

Claim 11

A semiconductor wafer, comprising: a semiconductor substrate having an upper major surface; a plurality of integrated circuit die having an upper surface, said plurality of integrated circuit die being formed on said semiconductor substrate, the integrated circuit die being separated by scribe lines; and a first plurality of wafer conductors, electrically coupled to a first integrated circuit die of the plurality of integrated circuit die, a first plurality of contact regions of the first plurality of wafer conductors being formed overlying the upper surface of the first integrated circuit die, the first plurality of wafers conductors being wired to provide a plurality of signals to the first integrated circuit, the first plurality of contact regions overlying a portion of the substrate that is void of active circuitry and the first plurality of contact regions not overlying any portion of the scribe lines; a second plurality of wafer conductors, electrically coupled to a second integrated circuit die of the plurality of integrated circuit die, a second plurality of contact regions of the wafer conductor being formed overlying the upper surface of the second integrated circuit die, the second plurality of wafer conductors being wired to provide the same plurality of signals to the second integrated circuit but the first plurality of wafer conductors being disjoined, on the semiconductor wafer, from the second plurality of wafer conductors; and whereby electrical contact can be made to the first one of the plurality of integrated circuit die by way of the wafer conductor for purposes of testing.

Claim 12

The semiconductor wafer of claim 8, wherein the semiconductor wafer further comprises: a first plurality of bond pads formed overlying said semiconductor substrate, said first plurality of bond pads being coupled to said first plurality of wafer conductors through at least two distinct layers of metal.

Claim 13

A semiconductor wafer as in claim 8, wherein each of said plurality of integrated circuit die comprises: a predetermined number of bonding pads formed via a layer of conductive material, the bonding pads being coupled to the first plurality of wafer conductors via at least one contact opening.

Claim 14

A semiconductor wafer as in claim 8, wherein the semiconductor wafer further comprises: a current limiting means having a first terminal coupled to one wafer conductor in the first plurality of wafer conductors and having a second terminal coupled to at least one bonding pad on the first integrated circuit die.

Claim 15

A semiconductor wafer as in claim 8, wherein each of said plurality of integrated circuit die is a data processor.

Claim 16

A semiconductor wafer as in claim 8, wherein during testing, each data processor executes a plurality of data processor instructions at a temperature above room temperature.

Claim 17

A semiconductor wafer as in claim 8, wherein said wafer conductor supplies a signal to said plurality of integrated circuit die, the signal being selected from a group consisting of: a reset signal, a clock signal, a data input signal, a data output signal, and a voltage supply.