Complex probe card for testing a semiconductor wafer

Claim 1

A probe card for testing semiconductor wafers comprising: a printed circuit plate having an aperture at the center thereof and a ring fixed around said aperture on a bottom side of said printed circuit plate, said ring having an underside with an inwardly declining surface, probe needles arranged in radial arrays with respect to said aperture, each of said radial arrays having multiple layers of probe needles, an adhesive layer for suspending said multiple layers of probe needles parallel to the inwardly declining surface of said ring, said probe needles having tapered terminal tips aligned on a plane in parallel with but spaced from said printed circuit plate and opposite uniformly thick terminal ends connected to said printed circuit plate for external connection, wherein said probe needles in inner layers are longer than said probe needles in outer layers, and wherein said aperture is large sufficiently to allow said tapered terminal tips of said probe needles to be visually located and readily adjusted from both behind and in front of said printed circuit plate.