US5307010A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Wafer burn-in and test system
Assignee: Texas Instruments Inc
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Filing: 1992-09-30
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Granted: 1994-04-26
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Expires: 2012-09-30
Abstract
Abstract An interconnection system and method of testing and performing burn-in of semiconductor devices prior to separation from the semiconductor wafer on which the devices are formed includes forming interconnection layers of contacts and conductors over the devices and then testing and performing burn-in on the devices. Faulty devices are disconnected from the conductors prior to performing additional test and burn-in. The interconnections are removed prior to separating the device on the wafer, and prior to further possible tests and packaging.
Inventors
- 👤 Anthony M. Chiu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 18:17
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2855; G01R31/2856; H; H10; H10P; H10P74/00; G01R31/286; G01R31/2863
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
173 words
An interconnection system for burn-in and testing of semiconductor devices prior to separation from a semiconductor wafer, comprising: a semiconductor wafer having a plurality of semiconductor devices thereon, each semiconductor device having a plurality of bond pads and a plurality of edges defining a top surface of the semiconductor device; a first layer of a plurality of conductors on the wafer insulated from the semiconductor devices, each of the plurality of conductors of said first layer overlaying one of said semiconductor devices without extending past said plurality of edges of that semiconductor device and connected to a bond pad; a second layer of a plurality of conductors on the wafer insulated from the first layer of plurality of conductors; an interconnection between each conductor of said first layer of conductors and one conductor of said second layer of a plurality of conductors; and a plurality of contact test points on said wafer, each of said contact test points connected to one of said conductors in said second layer of a plurality of conductors.
Claim 2
Dependent Claim
173 words
An interconnection system for burn-in and testing of semiconductor devices prior to separation from a semiconductor wafer, comprising: a semiconductor wafer having a plurality of semiconductor devices thereon, each semiconductor device having a plurality of bond pads and a plurality of edges defining a top surface of the semiconductor device; a first layer of a plurality of conductors on the wafer insulated from the semiconductor devices, each of the plurality of conductors of said first layer overlaying one of said semiconductor devices without extending past said plurality of edges of that semiconductor device and connected to a bond pad; a second layer of a plurality of conductors on the wafer insulated from the first layer of plurality of conductors; an interconnection between each conductor of said first layer of conductors and one conductor of said second layer of a plurality of conductors; and a plurality of contact test points on said wafer, each of said contact test points connected to one of said conductors in said second layer of a plurality of conductors.
Claim 3
Dependent Claim
21 words
The interconnection system of claim 1 in which said semiconductor devices are arranged in rows and columns on said semiconductor wafer.
Claim 4
Dependent Claim
31 words
The interconnection system of claim 2 in which the conductors of said first layer extend in the row direction and the conductors of said second layer extend in the column direction.
Claim 5
Dependent Claim
40 words
The interconnection system of claim 1 in which each of said conductors of said first layer is connected to a bond pad by a fuse link of a low power carrying conductor which opens when an overload occurs during burn-in.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1997-04-25 | 1997-10-25 | 1998-04-26 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2001-04-25 | 2001-10-25 | 2002-04-26 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2005-04-25 | 2005-10-25 | 2006-04-26 | $7700.00 | Window Closed / Lapsed |