Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
109 words
A method of forming a semiconductor package comprising the steps of: providing a semiconductor chip having first and second major surfaces with input and output bonding pads on the first major surface; providing a lead frame having a plurality of leads adjacent said chip; electrically connecting respective ones of the leads to respective ones of the bonding pads on the chip by conductive bonding wires therebetween; coating the entire length of each of said wires, said pads, and that portion of the respective leads to which said wires are connected with a dielectric material having a Young's modulus in the range of about 10 psi to about 500 psi.
Claim 2
Independent Claim
109 words
A method of forming a semiconductor package comprising the steps of: providing a semiconductor chip having first and second major surfaces with input and output bonding pads on the first major surface; providing a lead frame having a plurality of leads adjacent said chip; electrically connecting respective ones of the leads to respective ones of the bonding pads on the chip by conductive bonding wires therebetween; coating the entire length of each of said wires, said pads, and that portion of the respective leads to which said wires are connected with a dielectric material having a Young's modulus in the range of about 10 psi to about 500 psi.
Claim 3
Independent Claim
146 words
A method of forming a semiconductor package comprising the steps of: securing an electrically insulating layer on a major surface of a semiconductor chip having input and output bonding pads on the major surface; securing a lead frame having a plurality of leads on the insulating layer; electrically connecting respective ones of the leads to respective ones of the bonding pads on the chip by conductive bonding wires therebetween applying a stress buffer, comprising a dielectric material having a Young's modulus in the range of about 10 psi to 500 psi, a glass transition temperature of at least as low as -40° C., and a coefficient of thermal expansion in the range of 0 ppm/° F. to 1000 ppm/° F. around the entire length of each of said wires, over said pads, and over that portion of the respective leads to which said wires are connected.
Claim 4
Independent Claim
146 words
A method of forming a semiconductor package comprising the steps of: securing an electrically insulating layer on a major surface of a semiconductor chip having input and output bonding pads on the major surface; securing a lead frame having a plurality of leads on the insulating layer; electrically connecting respective ones of the leads to respective ones of the bonding pads on the chip by conductive bonding wires therebetween applying a stress buffer, comprising a dielectric material having a Young's modulus in the range of about 10 psi to 500 psi, a glass transition temperature of at least as low as -40° C., and a coefficient of thermal expansion in the range of 0 ppm/° F. to 1000 ppm/° F. around the entire length of each of said wires, over said pads, and over that portion of the respective leads to which said wires are connected.
Claim 5
Dependent Claim
12 words
The method of claim 1 wherein the dielectric material comprises a silicone.
Claim 6
Dependent Claim
20 words
The method of claim 1 wherein the dielectric material comprises a silicone having a Young's modulus of about 25 psi.
Claim 7
Dependent Claim
22 words
The method of claim 1 wherein the vertical loop height of the bonding wires is at least as short as 0.015 inches.
Claim 8
Dependent Claim
12 words
The method of claim 2 wherein the dielectric material comprises a silicone.
Claim 9
Dependent Claim
20 words
The method of claim 2 wherein the dielectric material comprises a silicone having a Young's modulus of about 25 psi.
Claim 10
Dependent Claim
22 words
The method of claim 2 wherein the vertical loop height of the bonding wires is at least as short as 0.015 inches.