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US5439844A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for forming deposited film

Assignee: Canon Inc
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Filing: 1993-05-12
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Granted: 1995-08-08
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Expires: 2013-05-12
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Abstract

Abstract A process for forming a deposited film comprises the steps: (a) arranging a substrate having crystal orientability uniformly on its surface in a film forming space for formation of a deposited film; (b) introducing into said film forming space an activated species (A) formed by decomposition of a compound (SX) containing silicon and a halogen and an activated species (B) formed from a chemical substance (B) for film formation which is chemically mutually reactive with said activated species (A) separately from each other, thus permitting both the species to react chemically with each other thereby to form a deposited film on the above substrate; and (c) introducing into said film forming space a gaseous substance (E) having etching action on said deposited film to be formed or a gaseous substance (E2) forming said gaseous substance (E) during the above film formation step (b), thus exposing the surface for deposited film growth to said gaseous substance (E) and thereby effecting an etching action to conduct crystal growth preferentially in a specific face direction.

Inventors

  • 👤 Akira Sakai

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 08:22
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; C; C23; C23C; C23C16/00; C23C16/22; C23C16/24; C23C16/44; C23C16/448; C23C16/452; H10P14/24; H10P14/29; H10P14/2901; H10P14/2913; H10P14/2915; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; H10P14/3466

Claims Analysis

Total Claims: 11
Claim 1
Independent Claim 202 words
A process for forming a silicon containing polycrystalline film on a substrate in a film forming space which comprises: (a) arranging said substrate having an exposed surface which has a crystal orientability with a specific face direction in said film forming space; (b) forming said silicon containing polycrystalline film on said exposed surface of said substrate by separately introducing into said film forming space an activated species (A) formed by decomposition of a compound (SX) containing silicon and halogen in a first activation space separate from said film forming space and an activated substance (B) formed in a second activation space separate from said film forming space from a chemical species (B) for film formation which is chemically mutually reactive with said activated species (A) to form a mixture and effect a chemical reaction therebetween to thereby effect the formation of the polycrystalline deposited film, said polycrystalline deposited film having a film growth surface; and (c) exposing the film growth surface of the polycrystalline deposited film to a gaseous substance (E) capable of effecting an etching action thereon and thereby effecting crystal growth in a specific face direction wherein said gaseous substance (E) is irradiated with light energy to enhance its activity.
Claim 2
Dependent Claim 202 words
A process for forming a silicon containing polycrystalline film on a substrate in a film forming space which comprises: (a) arranging said substrate having an exposed surface which has a crystal orientability with a specific face direction in said film forming space; (b) forming said silicon containing polycrystalline film on said exposed surface of said substrate by separately introducing into said film forming space an activated species (A) formed by decomposition of a compound (SX) containing silicon and halogen in a first activation space separate from said film forming space and an activated substance (B) formed in a second activation space separate from said film forming space from a chemical species (B) for film formation which is chemically mutually reactive with said activated species (A) to form a mixture and effect a chemical reaction therebetween to thereby effect the formation of the polycrystalline deposited film, said polycrystalline deposited film having a film growth surface; and (c) exposing the film growth surface of the polycrystalline deposited film to a gaseous substance (E) capable of effecting an etching action thereon and thereby effecting crystal growth in a specific face direction wherein said gaseous substance (E) is irradiated with light energy to enhance its activity.
Claim 3
Dependent Claim 50 words
A process for forming a deposited film according to claim 1, wherein said compound (SX) is a chain halogenated silicon represented by the formula Si u Y 2u+2 (wherein u is an integer of 1 or more, Y is at least one element selected from F, Cl, Br and I).
Claim 4
Dependent Claim 59 words
A process for forming a deposited film according to claim 1, wherein said compound (SX) is a chain or cyclic halogenated silicon represented by the formula Si u H x Y y (wherein u, x, y are integers of 1 or more, x+y=2u or x+y=2u+2, and Y is at least one element selected from F, Cl, Br and I).
Claim 5
Dependent Claim 32 words
A process for forming a deposited film according to claim 1, wherein either one of hydrogen and halogen is used in addition to said compound (SX) during decomposition of said compound (SX).
Claim 6
Dependent Claim 28 words
A process for forming a deposited film according to claim 1, wherein said chemical substance (B) for film formation is either one of hydrogen gas and halogen gas.
Claim 7
Dependent Claim 36 words
A process for forming a deposited film according to claim 1, wherein the flow rate ratio of said active species (A) and said active species (B) when introduced into the film-forming space is 10:1 to 1:10.
Claim 8
Dependent Claim 36 words
A process for forming a deposited film according to claim 1, wherein a compound containing an impurity element as the component is permitted to coexist with said compound (SX) during formation of said activated species (A).
Claim 9
Dependent Claim 40 words
A process for forming a deposited film according to claim 1, wherein a compound containing an impurity element as the component is permitted to coexist with said chemical substance (B) for film formation during formation of said activated species (B).
Claim 10
Dependent Claim 32 words
A process for forming a deposited film according to claim 1, further comprising introducing into said film forming space an activated species (D) formed from a compound containing an impurity element component.
Claim 11
Dependent Claim 35 words
A process for forming a deposited film according to claim 1, wherein said gaseous substance (E) is formed from a gaseous substance (E2), said gaseous substance (E2) having been introduced into said film forming space.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-08-07 1999-02-06 1999-08-08 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-08-07 2003-02-06 2003-08-08 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-08-07 2007-02-06 2007-08-08 $7700.00 Window Closed / Lapsed

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