US4522662A
Expired / Lapsed
US
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CVD lateral epitaxial growth of silicon over insulators
Assignee: Avago Technologies International Sales Pte Ltd
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Filing: 1983-08-12
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Granted: 1985-06-11
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Expires: 2003-08-12
Abstract
Abstract A method for growing Silicon On Insulator (SOI) films using only conventional very large scale integration (VLSI) techniques is provided. By sequentially varying the flow of HCL gas during the vertical-growth, lateral-overgrowth, coalescence, and planarization stages of the epitaxial deposition process allows the formation of high-quality SOI films on wider oxide stripes suitable for general transistor applications.
Inventors
- 👤 Donald R. Bradbury
- 👤 Chi-Wing Tsao
- 👤 Theodore I. Kamins
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 05:20
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/24; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411; Y; Y10; Y10S; Y10S117/00; Y10S117/913; Y10S148/00; Y10S148/025; Y10S148/026; Y10S148/05
Claims Analysis
Total Claims: 25
Claim 1
Independent Claim
133 words
A method for producing a semiconductor structure comprising the steps of: forming a non-nucleating insulating layer over a semiconductor substrate; removing a portion of said insulating layer to form an insulating region, said insulating region being surrounded by an exposed surface region of the semiconductor substrate; forming a first epitaxial semiconductor layer over said exposed surface region to form an essentially flat surface with said insulating layer, said first semiconductor layer being formed in an environment having a first concentration of reactant; and forming a second epitaxial semiconductor layer over said first semiconductor layer and laterally covering a portion of said insulating region substantially without voids therebetween, said second semiconductor layer being formed in an environment having a second concentration of reactant, said second concentration being different than the first concentration of reactant.
Claim 2
Independent Claim
133 words
A method for producing a semiconductor structure comprising the steps of: forming a non-nucleating insulating layer over a semiconductor substrate; removing a portion of said insulating layer to form an insulating region, said insulating region being surrounded by an exposed surface region of the semiconductor substrate; forming a first epitaxial semiconductor layer over said exposed surface region to form an essentially flat surface with said insulating layer, said first semiconductor layer being formed in an environment having a first concentration of reactant; and forming a second epitaxial semiconductor layer over said first semiconductor layer and laterally covering a portion of said insulating region substantially without voids therebetween, said second semiconductor layer being formed in an environment having a second concentration of reactant, said second concentration being different than the first concentration of reactant.
Claim 3
Dependent Claim
14 words
A method as in claim 1, wherein said first semiconductor layer comprises epitaxial silicon.
Claim 4
Dependent Claim
20 words
A method as in claim 1, wherein said reactant comprises hydrogen chloride gas in combination with a silicon containing gas.
Claim 5
Dependent Claim
14 words
A method as in claim 1, wherein said second semiconductor layer comprises epitaxial silicon.
Claim 6
Dependent Claim
20 words
A method as in claim 1, wherein said reactant comprises hydrogen chloride gas in combination with a silicon containing gas.
Claim 7
Dependent Claim
15 words
A method as in claim 1, wherein both of said semiconductor layers comprise epitaxial silicon.
Claim 8
Dependent Claim
61 words
A method as in claim 1 further comprising the step of: forming a third epitaxial semiconductor layer over said second semiconductor layer and laterally covering remaining portions of said insulating region substantially without voids therebetween, said third semiconductor layer being formed in an environment having a third concentration of reactant, said third concentration of reactant being different than the second concentration.
Claim 9
Dependent Claim
13 words
A method as in claim 1, wherein said insulating layer comprises silicon dioxide.
Claim 10
Dependent Claim
13 words
A method as in claim 2, wherein said insulating layer comprises silicon dioxide.
Claim 11
Dependent Claim
40 words
A method as in claim 3, wherein said first concentration of reactant is obtained by a range of ratio of flows of 0.1-0.3 of hydrogen chloride gas to 0.1 of silicon containing gas, to 100 of an inert carrier gas.
Claim 12
Dependent Claim
13 words
A method as in claim 4, wherein said insulating layer comprises silicon dioxide.
Claim 13
Dependent Claim
40 words
A method as in claim 5, wherein said second concentration of reactant is obtained by a range of ratio of flows of 0.05-0.2 of hydrogen chloride gas to 0.1 of silicon containing gas to 100 of an inert carrier gas.
Claim 14
Dependent Claim
13 words
A method as in claim 6, wherein said insulating layer comprises silicon dioxide.
Claim 15
Dependent Claim
42 words
A method as in claim 6 wherein said first concentration of reactant is obtained by a range of ratio of flows of 0.1 to 0.3 of hydrogen chloride gas to 0.1 of silicon containing gas to 100 of an inert carrier gas.
Claim 16
Dependent Claim
40 words
A method as in claim 14, wherein said second concentration of reactant is obtained by a range of ratio of flows of 0.05-0.2 of hydrogen chloride gas to 0.1 of silicon containing gas to 100 of an inert carrier gas.
Claim 17
Dependent Claim
20 words
A method as in claim 7, wherein said reactant comprises hydrogen chloride gas in combination with a silicon containing gas.
Claim 18
Dependent Claim
63 words
A method as in claim 7 further comprising the step of: forming a fourth epitaxial semiconductor layer over said third semiconductor layer to form an essentially flat surface substantially parallel to the surface of said semiconductor substrate, said fourth semiconductor layer being formed in an environment having a fourth concentration of reactant, said fourth concentration of reactant being different than the third concentration.
Claim 19
Dependent Claim
14 words
A method as in claim 7, wherein said third semiconductor layer comprises epitaxial silicon.
Claim 20
Dependent Claim
13 words
A method as in claim 18, wherein said insulating layer comprises silicon dioxide.
Claim 21
Dependent Claim
37 words
A method as in claim 16, wherein said third concentration of reactant is obtained with substantially zero flow of HCl and by a ratio of 0.1 of silicon containing gas to 100 of an inert carrier gas.
Claim 22
Dependent Claim
14 words
A method as in claim 17, wherein said fourth semiconductor layer comprises epitaxial silicon.
Claim 23
Dependent Claim
13 words
A method as in claim 21, wherein said insulating layer comprises silicon dioxide.
Claim 24
Dependent Claim
20 words
A method as in claim 17, wherein said reactant comprises hydrogen chloride gas in combination with a silicon containing gas.
Claim 25
Dependent Claim
40 words
A method as in claim 23, wherein said fourth concentration of reactant is obtained by a range of ratio of flows of 0.3-0.7 of hydrogen chloride gas to 0.1 of silicon containing gas to 100 of an inert carrier gas.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1988-06-10 | 1988-12-10 | 1989-06-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1992-06-10 | 1992-12-10 | 1993-06-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1996-06-10 | 1996-12-10 | 1997-06-11 | $7700.00 | Window Closed / Lapsed |