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US5010033A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for producing compound semiconductor using an amorphous nucleation site

Assignee: Canon Inc
•
Filing: 1990-04-30
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Granted: 1991-04-23
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Expires: 2010-04-30
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Abstract

Abstract A process for producing a compound semiconductor comprises applying a crystal forming treatment on a substrate having a free surface comprising a nonnucleation surface (S NDS ) with smaller nucleation density and a nucleation surface (S NDL ) arranged adjacent thereto having a sufficiently small area for a crystal to grow only from a single nucleus and a larger nucleation density (ND L ) than the nucleation density (ND S ) of said nonnucleation surface (S NDS ), by exposing the substrate to either of the gas phases: (a) gas phase (a) containing a starting material (II) for feeding the group II atoms of the periodic table and a starting material (VI) for feeding the group VI atoms of the periodic table and (b) gas phase (b) containing a starting material (III) for feeding the group III atoms of the periodic table and a starting material (V) for feeding the group V atoms of the periodic table, thereby forming only a single nucleus on said nucleation surface (S NDL ) and permitting a monocrystal of the compound semiconductor to grow from said single nucleus, characterized in that a semiconductor junction is formed in said monocrystal by feeding a starting material (Dn) for feeding a dopant for controlling to one electroconduction type and a starting material (Dp) for feeding a dopant for controlling to the electroconduction type opposite to said electrocondition type with change-over to one another into said gas phase, during said crystal forming treatment.

Inventors

  • 👤 Hiroyuki Tokunaga
  • 👤 Kenji Yamagata
  • 👤 Takao Yonehara

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 22:45
CPC Classifications
C; C30; C30B; C30B23/00; C30B23/02; C30B23/04; C30B25/00; C30B25/02; C30B25/04; H; H10; H10P; H10P14/00; H10P14/20; H10P14/24; H10P14/27; H10P14/271; H10P14/276; H10P14/29; H10P14/2901; H10P14/2921; H10P14/2922; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3424; H10P14/3431; H10P14/3438; H10P14/3441; Y; Y10; Y10S; Y10S148/00; Y10S148/152; Y10S438/00; Y10S438/914; Y10S438/925

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 270 words
A process for producing a compound semiconductor, which comprises applying a crystal forming treatment on a substrate having a free surface comprising a non-nucleation surface (S NDS ) with a smaller nucleation density and an amorphous nucleation surface (S NDL ) arranged adjacent thereto having a sufficiently small area so as to form a single nucleus from which a single crystal is grown and a larger nucleation density (ND L ) than the nucleation density (ND S ) of said nonnucleation surface (S NDS ) so as to form only a single nucleus from which a single crystal is grown, by exposing the substrate to either of the gas phases: (a) gas phase (a) containing a starting material (II) for feeding the group II atoms of the periodic table and a starting material (VI) for feeding the group VI atoms of the periodic table; and (b) gas phase (b) containing a starting material (III) for feeding the group III atoms of the periodic table and a starting material (V) for feeding the group V atoms of the periodic table, thereby forming a single nucleus on said nucleation surface (S NDL ) and permitting a monocrystal of the compound semiconductor to grow only from said single nucleus, characterized in that a semiconductor junction is formed in said monocrystal by feeding a starting material (Dn) for feeding a dopant for controlling to a first electroconduction type and a starting material (Dp) for feeding a dopant for controlling to a second electroconduction type opposite to said first electroconduction type with change-over to one another into said gas phase, during said crystal forming treatment.
Claim 2
Dependent Claim 270 words
A process for producing a compound semiconductor, which comprises applying a crystal forming treatment on a substrate having a free surface comprising a non-nucleation surface (S NDS ) with a smaller nucleation density and an amorphous nucleation surface (S NDL ) arranged adjacent thereto having a sufficiently small area so as to form a single nucleus from which a single crystal is grown and a larger nucleation density (ND L ) than the nucleation density (ND S ) of said nonnucleation surface (S NDS ) so as to form only a single nucleus from which a single crystal is grown, by exposing the substrate to either of the gas phases: (a) gas phase (a) containing a starting material (II) for feeding the group II atoms of the periodic table and a starting material (VI) for feeding the group VI atoms of the periodic table; and (b) gas phase (b) containing a starting material (III) for feeding the group III atoms of the periodic table and a starting material (V) for feeding the group V atoms of the periodic table, thereby forming a single nucleus on said nucleation surface (S NDL ) and permitting a monocrystal of the compound semiconductor to grow only from said single nucleus, characterized in that a semiconductor junction is formed in said monocrystal by feeding a starting material (Dn) for feeding a dopant for controlling to a first electroconduction type and a starting material (Dp) for feeding a dopant for controlling to a second electroconduction type opposite to said first electroconduction type with change-over to one another into said gas phase, during said crystal forming treatment.
Claim 3
Dependent Claim 23 words
A process for producing a compound semiconductor according to claim 1, wherein said crystal growth treatment is performed according to the MOCVD method.
Claim 4
Dependent Claim 28 words
A process for producing a compound semiconductor according to claim 1, wherein said nucleation surface (S NDL ) is formed internally of said nonnucleation surface (S NDS ).
Claim 5
Dependent Claim 26 words
A process for producing a compound semiconductor according to claim 1, wherein said nucleation surface (S NDL ) is formed in a plural number as sectionalized.
Claim 6
Dependent Claim 27 words
A process for producing a compound semiconductor according to claim 1, wherein said nucleation surface (S NDL ) is formed in a plural number as sectionalized regularly.
Claim 7
Dependent Claim 27 words
A process for producing a compound semiconductor according to claim 1, wherein said nucleation surface (S NDL ) is formed in a plural number as sectionalized irregularly.
Claim 8
Dependent Claim 26 words
A process for producing a compound semiconductor according to claim 1, wherein said nucleation surface (S NDL ) is formed in the shape of a lattice.
Claim 9
Dependent Claim 41 words
A process for producing a compound semiconductor according to claim 1, wherein the monocrystal formed on the nucleation surface (S NDL ) is grown in the direction of the nucleation surface (S NDL ) beyond said nucleation surface (S NDL ).
Claim 10
Dependent Claim 39 words
A process for producing a compound semiconductor according to claim 4, wherein the monocrystal grown from the each nucleation surface (S NDL ) is grown to the size to be adjacent to the adjoining nucleation surface (S NDL ).
Claim 11
Dependent Claim 37 words
A process for producing a compound semiconductor according to claim 1, wherein said nucleation surface (S NDL ) is formed of a material which is modified from the material for producing said nonnucleation surface (S NDS ).
Claim 12
Dependent Claim 21 words
A process for producing a compound semiconductor according to claims 1, wherein said compound semiconductor is a binary system compound semiconductor.
Claim 13
Dependent Claim 21 words
A process for producing a compound semiconductor according to claim 1, wherein said compound semiconductor is a mixed crystal compound semiconductor.
Claim 14
Dependent Claim 247 words
A process for producing a compound semiconductor, which comprises applying a crystal forming treatment on a substrate having a free surface comprising a nonnucleation surface (S NDS ) with a smaller nucleation density and an amorphous nucleation surface (S NDL ) arranged adjacent thereto having a sufficiently small area so as to form a single nucleus from which a single crystal is grown and a larger nucleation density (ND L ) than the nucleation density (ND S ) of said non-nucleation surface (S NDS ), so as to form a single nucleus from which a single crystal is grown by exposing the substrate to either of the gas phases; (a) gas phase (a) containing a starting material (II) for feeding the group II atoms of the periodic table and a starting material (VI) for feeding the group VI atoms of the periodic table; and (b) gas phase (b) containing a starting material (III) for feeding the group III atoms of the periodic table and a starting material (V) for feeding the group V atoms of the periodic table, thereby forming a single nucleus on said nucleation surface (S NDL ) and permitting a monocrystal of the compound semiconductor to grow only from said single nucleus, characterized in that a semiconductor junction is formed in said monocrystal by feeding a starting material (Dn) for feeding a dopant for controlling to one electroconduction type while changing the introduced amount of said starting material (Dn) with the lapse of time.
Claim 15
Dependent Claim 247 words
A process for producing a compound semiconductor, which comprises applying a crystal forming treatment on a substrate having a free surface comprising a nonnucleation surface (S NDS ) with a smaller nucleation density and an amorphous nucleation surface (S NDL ) arranged adjacent thereto having a sufficiently small area so as to form a single nucleus from which a single crystal is grown and a larger nucleation density (ND L ) than the nucleation density (ND S ) of said non-nucleation surface (S NDS ), so as to form a single nucleus from which a single crystal is grown by exposing the substrate to either of the gas phases; (a) gas phase (a) containing a starting material (II) for feeding the group II atoms of the periodic table and a starting material (VI) for feeding the group VI atoms of the periodic table; and (b) gas phase (b) containing a starting material (III) for feeding the group III atoms of the periodic table and a starting material (V) for feeding the group V atoms of the periodic table, thereby forming a single nucleus on said nucleation surface (S NDL ) and permitting a monocrystal of the compound semiconductor to grow only from said single nucleus, characterized in that a semiconductor junction is formed in said monocrystal by feeding a starting material (Dn) for feeding a dopant for controlling to one electroconduction type while changing the introduced amount of said starting material (Dn) with the lapse of time.
Claim 16
Dependent Claim 20 words
A process for producing a compound semiconductor according to claim 1, wherein said substrate is constituted of an amorphous material.
Claim 17
Dependent Claim 19 words
A process for producing a compound semiconductor according to claim 14, wherein said amorphous material is SiO 2 .

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-04-22 1994-10-22 1995-04-23 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-04-22 1998-10-22 1999-04-23 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-04-22 2002-10-22 2003-04-23 $7700.00 Window Closed / Lapsed

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