US6714828B2
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and system for designing a probe card
Assignee: FormFactor Inc
•
Filing: 2001-09-17
•
Granted: 2004-03-30
•
Expires: 2021-09-17
Abstract
Abstract A method and system for designing a probe card from data provided by prospective customers via the Internet is provided. Design specifications are entered into the system by prospective customers and compiled into a database. The collective feasibility of each set of design specifications is determined by an automated computer system and communicated to the prospective customer. If feasible, additional software enables prospective customers to create verification packages according to their respective design specifications. These verification packages further consist of drawing files visually describing the final design and verification files confirming wafer bonding pad data. Verification packages are reviewed and forwarded to an applications engineer after customer approval. An interactive simulation of probe card performance is also provided. Data on probe card performance is incorporated into an overall modeling exercise, which includes not only the probe card, but data on the device(s) under test and wafer, as well as data on automated test equipment.
Inventors
- 👤 Benjamin N. Eldridge
- 👤 Mark W. Brandemuehl
- 👤 Stefan Graef
- 👤 Yves Parent
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 19:53
CPC Classifications
G; G06; G06Q; G06Q50/00; G06Q50/04; G01; G01R; G01R3/00; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07342; G06Q30/00; G06Q30/06; G06Q30/0601; G06Q30/0609; G06Q30/0621; G06Q30/0633; G06Q50/10; G06Q50/18; G06Q50/188
Claims Analysis
Total Claims: 57
Claim 1
Independent Claim
82 words
An automated system for enabling a customer to design a probe card, comprising: a server coupled to a network; an application operable with said server to provide functions comprising: receiving over said network from a prospective customer information describing a wafer to be tested; automatically generating from said information a verification package comprising a proposed design of a probe card for testing said wafer; and communicating over said network with said prospective customer regarding the acceptability of said proposed probe card design.
Claim 2
Dependent Claim
82 words
An automated system for enabling a customer to design a probe card, comprising: a server coupled to a network; an application operable with said server to provide functions comprising: receiving over said network from a prospective customer information describing a wafer to be tested; automatically generating from said information a verification package comprising a proposed design of a probe card for testing said wafer; and communicating over said network with said prospective customer regarding the acceptability of said proposed probe card design.
Claim 3
Dependent Claim
37 words
The system of claim 1 , wherein said application further provides the function of providing a graphical interface for use by said prospective customer to enable the input of said information describing a wafer to be tested.
Claim 4
Dependent Claim
17 words
The system of claim 2 , wherein said graphical interface further comprises at least one Web page.
Claim 5
Dependent Claim
28 words
The system of claim 1 , wherein said application further provides the function of accepting an order from said prospective customer to manufacture said proposed probe card design.
Claim 6
Dependent Claim
22 words
The system of claim 4 , wherein said function of accepting an order further comprises billing said prospective customer for said order.
Claim 7
Dependent Claim
20 words
The system of claim 1 , wherein said application further provides the function of verifying said proposed probe card design.
Claim 8
Dependent Claim
20 words
The system of claim 6 , wherein said verifying function further comprises simulating operation of said proposed probe card design.
Claim 9
Dependent Claim
22 words
The system of claim 6 , wherein said verifying function further comprises performing an automated simulation of said proposed probe card design.
Claim 10
Dependent Claim
24 words
The system of claim 6 , wherein said verifying function further comprises performing a simulation based on particular specifications designated by said prospective customer.
Claim 11
Dependent Claim
18 words
The system of claim 6 , wherein said application verifies signal integrity of said proposed probe card design.
Claim 12
Dependent Claim
19 words
The system of claim 1 , wherein said verification package further comprises drawings of said proposed probe card design.
Claim 13
Dependent Claim
25 words
The system of claim 1 , wherein said communicating function further comprises notifying said prospective customer of proposed modifications to said proposed probe card design.
Claim 14
Dependent Claim
23 words
The system of claim 1 , wherein said communicating function further comprises forwarding said verification package over said network to said prospective customer.
Claim 15
Dependent Claim
22 words
The system of claim 1 , wherein said application further provides the function of determining acceptability of said proposed probe card design.
Claim 16
Dependent Claim
20 words
The system of claim 1 , wherein said information describing a wafer comprises information regarding contact features on said wafer.
Claim 17
Dependent Claim
23 words
The system of claim 1 , wherein said function of receiving further comprises receiving from said customer information describing desired probe card characteristics.
Claim 18
Dependent Claim
22 words
The system of claim 16 , wherein said desired probe card characteristics comprise information regarding interfacing said probe card to a tester.
Claim 19
Dependent Claim
21 words
The system of claim 1 , wherein said proposed probe card design comprises a layout of probes for contacting said wafer.
Claim 20
Dependent Claim
20 words
The system of claim 1 , wherein said application further provides the function of simulating said proposed probe card design.
Claim 21
Dependent Claim
28 words
The system of claim 19 , wherein said application simulates said proposed probe card design in response to a command received over the network from said prospective customer.
Claim 22
Dependent Claim
35 words
The system of claim 20 , wherein said application simulates said proposed probe card design in accordance with a selected one of a plurality of selectable simulations, wherein said prospective user selects said selected simulation.
Claim 23
Independent Claim
75 words
A method for enabling a customer to design a probe card, said method comprising: receiving at a computer over a computer network from a prospective customer information describing a wafer to be tested; automatically generating at said computer from said information a verification package comprising a proposed design of a probe card for testing said wafer; and communicating over said computer network with said prospective customer regarding the acceptability of said proposed probe card design.
Claim 24
Independent Claim
75 words
A method for enabling a customer to design a probe card, said method comprising: receiving at a computer over a computer network from a prospective customer information describing a wafer to be tested; automatically generating at said computer from said information a verification package comprising a proposed design of a probe card for testing said wafer; and communicating over said computer network with said prospective customer regarding the acceptability of said proposed probe card design.
Claim 25
Dependent Claim
30 words
The method of claim 22 further comprising providing a graphical interface for use by said prospective customer to enable the input of said information describing a wafer to be tested.
Claim 26
Dependent Claim
30 words
The method of claim 23 , wherein said step of providing a graphical interface further comprises delivering at least one Web page to a browser application operated by said user.
Claim 27
Dependent Claim
25 words
The method of claim 22 , further comprising the step of accepting an order from said prospective customer to manufacture said proposed probe card design.
Claim 28
Dependent Claim
22 words
The method of claim 25 , wherein said step of accepting an order further comprises billing said prospective customer for said order.
Claim 29
Dependent Claim
17 words
The method of claim 22 , further comprising the step of verifying said proposed probe card design.
Claim 30
Dependent Claim
20 words
The method of claim 27 , wherein said verifying step further comprises simulating operation of said proposed probe card design.
Claim 31
Dependent Claim
22 words
The method of claim 27 , wherein said verifying step further comprises performing an automated simulation of said proposed probe card design.
Claim 32
Dependent Claim
24 words
The method of claim 27 , wherein said verifying step further comprises performing a simulation based on particular specifications designated by said prospective customer.
Claim 33
Dependent Claim
19 words
The method of claim 22 , wherein said verification package further comprises drawings of said proposed probe card design.
Claim 34
Dependent Claim
25 words
The method of claim 22 , wherein said communicating step further comprises notifying said prospective customer of proposed modifications to said proposed probe card design.
Claim 35
Dependent Claim
23 words
The method of claim 22 , wherein said communicating step further comprises forwarding over said network said verification package to said prospective customer.
Claim 36
Dependent Claim
19 words
The method of claim 22 , further comprising the step of determining acceptability of said proposed probe card design.
Claim 37
Dependent Claim
20 words
The method of claim 22 , further comprising making a probe card in accordance with said proposed probe card design.
Claim 38
Dependent Claim
20 words
The method of claim 22 , wherein said information describing a wafer comprises information regarding contact features on said wafer.
Claim 39
Dependent Claim
23 words
The method of claim 22 , wherein said step of receiving further comprises receiving from said customer information describing desired probe card characteristics.
Claim 40
Dependent Claim
22 words
The method of claim 37 , wherein said desired probe card characteristics comprise information regarding interfacing said probe card to a tester.
Claim 41
Dependent Claim
21 words
The method of claim 22 , wherein said proposed probe card design comprises a layout of probes for contacting said wafer.
Claim 42
Dependent Claim
13 words
The method of claim 22 further comprising simulating said proposed probe card design.
Claim 43
Dependent Claim
32 words
The method of claim 40 further comprising receiving over said network from said prospective customer a simulation command, wherein said simulation command initiates said step of simulating said proposed probe card design.
Claim 44
Dependent Claim
19 words
The method of claim 41 , wherein said simulation command further identifies one of a plurality of selectable simulations.
Claim 45
Dependent Claim
16 words
The method of claim 22 further comprising verifying signal integrity of said proposed probe card design.
Claim 46
Dependent Claim
108 words
An electronic device for enabling a customer to design a probe card, said electronic device comprising: a customer computer connectable to a network; and an application operable with said computer to provide functions comprising: sending over said network to a computer of a probe card supplier information describing a wafer to be tested, receiving over said network a verification package automatically generated by said computer of said probe card supplier using said information, said verification package comprising a proposed design of a probe card for testing said wafer, and receiving over said network from said probe card supplier communication regarding the acceptability of said proposed probe card design.
Claim 47
Dependent Claim
108 words
An electronic device for enabling a customer to design a probe card, said electronic device comprising: a customer computer connectable to a network; and an application operable with said computer to provide functions comprising: sending over said network to a computer of a probe card supplier information describing a wafer to be tested, receiving over said network a verification package automatically generated by said computer of said probe card supplier using said information, said verification package comprising a proposed design of a probe card for testing said wafer, and receiving over said network from said probe card supplier communication regarding the acceptability of said proposed probe card design.
Claim 48
Dependent Claim
19 words
The device of claim 44 , wherein said verification package further comprises drawings of said proposed probe card design.
Claim 49
Dependent Claim
20 words
The device of claim 44 , wherein said information describing a wafer comprises information regarding contact features on said wafer.
Claim 50
Dependent Claim
12 words
The device of claim 46 , wherein said contact features are pads.
Claim 51
Dependent Claim
25 words
The device of claim 44 , wherein said function of sending further comprises sending to said probe card supplier information describing desired probe card characteristics.
Claim 52
Dependent Claim
22 words
The device of claim 48 , wherein said desired probe card characteristics comprise information regarding interfacing said probe card to a tester.
Claim 53
Dependent Claim
21 words
The device of claim 44 , wherein said proposed probe card design comprises a layout of probes for contacting said wafer.
Claim 54
Dependent Claim
31 words
The device of claim 44 , wherein said application further provides the function of providing a graphical interface to enable the input of said information describing a wafer to be tested.
Claim 55
Dependent Claim
35 words
The device of claim 44 , wherein said application further provides the function of sending over said network to said computer of said probe card supplier a command to simulate said proposed probe card design.
Claim 56
Dependent Claim
18 words
The device of claim 52 , wherein said simulation verifies signal integrity of said proposed probe card design.
Claim 57
Dependent Claim
30 words
The device of claim 52 , wherein said application further provides the function of receiving over said network from said computer of said probe card supplier results of said simulation.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2007-03-30 | 2007-09-29 | 2008-03-30 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2011-03-30 | 2011-09-29 | 2012-03-30 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2015-03-30 | 2015-09-29 | 2016-03-30 | $7700.00 | Window Closed / Lapsed |