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US5042148A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing a probing card for wafer testing

Assignee: Mitsubishi Electric Corp
•
Filing: 1990-10-23
•
Granted: 1991-08-27
•
Expires: 2010-10-23
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Abstract

Abstract A probing card for wafer testing has a plurality of probes arranged so as to correspond to and come in contact with a plurality of bonding pads of semiconductor devices fabricated on a semiconductor wafer. The probing card comprises a base plate, contact fingers and wiring sections. The base plate is formed of photosensitive glass. The base plate defines through holes extending from one of its main surfaces to the other. The contact fingers are formed as columnar elements filling the through holes and having a cross-sectional area decreasing from opposite ends to an intermediate position thereof. Each contact finger has one end thereof projecting from one of the main surfaces of the base plate. This projecting end of each contact finger at least defines a substantially planar end face. The wiring sections comprise conductive layers formed in a predetermined pattern on the other main surface of the base plate and connected respectively to the other ends of the contact fingers. The through holes are formed in the photosensitive glass base plate by photolithography. The contact fingers may be positioned with high precision relative to a plurality of bonding pads. A stable contact is secured between the bonding pads and contact fingers.

Inventors

  • 👤 Tetsuo Tada
  • 👤 Ryouichi Takagi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 00:48
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/49155; Y10T29/49165

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 159 words
A method of manufacturing a probing card for wafer testing having a plurality of probes arranged so as to correspond to and come in contact with a plurality of bonding pads of semiconductor devices fabricated on a semiconductor wafer, comprising the steps of: forming through holes, by photolithography, in a base plate having two main surfaces and electrically insulating, transparent and photosensitive properties, so that said through holes extend form one of said main surfaces to the other, with a cross-sectional area thereof decreasing from opposite ends to an intermediate position; forming conductive layers filling said through holes and extending over said main surfaces of said base plate; removing only said conductive layers formed on one of said main surfaces of said base plate; and removing portions of said base plate from said one of the main surfaces so that said conductive layers filling said through holes project from said one of the main surfaces of said base plate.
Claim 2
Independent Claim 159 words
A method of manufacturing a probing card for wafer testing having a plurality of probes arranged so as to correspond to and come in contact with a plurality of bonding pads of semiconductor devices fabricated on a semiconductor wafer, comprising the steps of: forming through holes, by photolithography, in a base plate having two main surfaces and electrically insulating, transparent and photosensitive properties, so that said through holes extend form one of said main surfaces to the other, with a cross-sectional area thereof decreasing from opposite ends to an intermediate position; forming conductive layers filling said through holes and extending over said main surfaces of said base plate; removing only said conductive layers formed on one of said main surfaces of said base plate; and removing portions of said base plate from said one of the main surfaces so that said conductive layers filling said through holes project from said one of the main surfaces of said base plate.
Claim 3
Dependent Claim 40 words
A method of manufacturing a probing card according to claim 1, wherein the step of forming said through holes includes the steps of: exposing predetermined regions of said base plate to light; and removing said predetermined regions having been exposed.
Claim 4
Dependent Claim 53 words
A method of manufacturing a probing card according to claim 2, wherein the step of exposing the predetermined regions of said base plate includes the steps of: selectively radiating light to one of the main surfaces of said base plate; and selectively radiating light to the other main surface of said base plate.
Claim 5
Dependent Claim 37 words
A method of manufacturing a probing card according to claim 1, wherein the step of forming the conductive layers includes the step of successively forming a first conductive layer and a second conductive layer of different materials.
Claim 6
Dependent Claim 39 words
A method of manufacturing a probing card according to claim 1, wherein the step of removing portions of said base plate includes the step of radiating light to and exposing one of said main surfaces of said base plate.

References Cited (Backward Citations)

US3813773A Cited
US4059480A Cited
US4066491A Cited
US4647476A Cited
JPS60189949A Cited
JPS6310536A Cited
JPS64699A Cited
JPS63263738A Cited
JPS6439559A Cited
US4851767A Cited
US4961052A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1994-08-26 1995-02-25 1995-08-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1998-08-26 1999-02-25 1999-08-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2002-08-26 2003-02-25 2003-08-27 $7700.00 Window Closed / Lapsed

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