US4851767A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Detachable high-speed opto-electronic sampling probe
Assignee: International Business Machines Corp
•
Filing: 1988-01-15
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Granted: 1989-07-25
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Expires: 2008-01-15
Abstract
Abstract A testing or sampling probe to determine the response of electrical circuits or devices to ultrafast electrical pulses. The probe is detachable from the device being tested. The probe includes a transparent substrate though which optical pulses are focused or directed onto a photoconducting gap. The probe further includes a transmission line associated with the photoconductive gap, and which terminates at a tapered end of the probe in contacts which are placed on the device under test.
Inventors
- 👤 Jean-Marc Halbout
- 👤 Mark B. Ketchen
- 👤 Paul A. Moskowitz
- 👤 Michael R. Scheuermann
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 00:32
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06772
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
173 words
Electrical signal sampling probe apparatus responsive to electrical signals at selected points in an electrical circuit comprising: a transparent substrate, electrically conductive signal transmission means disposed on said transparent substrate, said electrically conductive signal transmission means extending to the one end of said substrate, electrical contacts connected to said electrically conductive signal transmission means at said end of said transparent substrate, an electrical signal conductive line disposed on said substrate and separated from said electrically conductive signal transmission means by a photoconductive radiant energy responsive conductive gap, a source of a radiant energy beam, means for directing said radiant energy beam from said source onto said photoconductive radiant energy responsive conductive gap to electrically connect said conductive line to said signal transmission means through said gap, said substrate being adapted to place said electrical contacts onto elected points on an electrical circuit, whereby electrical signals from said selected points of said electrical circuit are transmitted through said electrical contacts, said transmission means and through said conductive gap to said electrical signal conductive line.
Claim 2
Dependent Claim
173 words
Electrical signal sampling probe apparatus responsive to electrical signals at selected points in an electrical circuit comprising: a transparent substrate, electrically conductive signal transmission means disposed on said transparent substrate, said electrically conductive signal transmission means extending to the one end of said substrate, electrical contacts connected to said electrically conductive signal transmission means at said end of said transparent substrate, an electrical signal conductive line disposed on said substrate and separated from said electrically conductive signal transmission means by a photoconductive radiant energy responsive conductive gap, a source of a radiant energy beam, means for directing said radiant energy beam from said source onto said photoconductive radiant energy responsive conductive gap to electrically connect said conductive line to said signal transmission means through said gap, said substrate being adapted to place said electrical contacts onto elected points on an electrical circuit, whereby electrical signals from said selected points of said electrical circuit are transmitted through said electrical contacts, said transmission means and through said conductive gap to said electrical signal conductive line.
Claim 3
Dependent Claim
27 words
An electrical signal sampling probe apparatus according to claim 1 wherein said source of a radiant energy beam is a source of a light frequency photo beam.
Claim 4
Dependent Claim
29 words
An electrical signal sampling probe according to claim 2 wherein said substrate is radiant energy transparent and said light frequency beam is directed through said substrate into said gap.
Claim 5
Dependent Claim
22 words
An electrical signal sampling probe apparatus according to claim 2 wherein said source of light frequency photo beam is a laser apparatus.
Claim 6
Dependent Claim
20 words
An electrical signal sampling probe apparatus according to claim 3 wherein said substrate is composed of silicon disposed on sapphire.
Claim 7
Dependent Claim
20 words
An electrical signal sampling probe apparatus according to claim 3 wherein said substrate is composed of silicon disposed on quartz.
Claim 8
Dependent Claim
20 words
An electrical signal sampling probe apparatus according to claim 3 wherein said substrate is composed of infrared radiation transparent silicon.
References Cited (Backward Citations)
US3405361A
Cited
US4065717A
Cited
US4021112A
Cited
US4128843A
Cited
US4141756A
Cited
US4301409A
Cited
US4218618A
Cited
US4417203A
Cited
US4446425A
Cited
US4712057A
Cited
US4510675A
Cited
US4709141A
Cited
JPH0673366A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-07-24 | 1993-01-23 | 1993-07-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-07-24 | 1997-01-23 | 1997-07-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-07-24 | 2001-01-23 | 2001-07-25 | $7700.00 | Window Closed / Lapsed |