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US6080264A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Combination of semiconductor interconnect
Assignee: Micron Technology Inc
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Filing: 1997-03-14
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Granted: 2000-06-27
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Expires: 2017-03-14
Abstract
Abstract An apparatus and method for increasing integrated circuit density comprising utilizing chips with both direct (flip chip type) chip to conductors connection technology and wire bonds and/or TAB. An aspect of the present invention comprises at least one semiconductor die with a face surface having both flip chip type electric connections and bond pads for wirebonding or TAB attachment thereof to at least one leadframe. Another aspect of the present invention comprises using two pair of back to back attached dice with leadframe lead fingers disposed between the dice pairs. The die face surfaces adjacent to the lead fingers are in direct electrical communication therewith via flip-chip type connectors. Bond pads on the die face surface facing outward from the lead fingers are electrically connected to the leadframe via wire bonds and/or TAB.
Inventors
- 👤 Michael B. Ball
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 19:52
CPC Classifications
H; H10; H10W; H10W99/00; H10W70/00; H10W70/40; H10W70/451; H10W70/464; H10W70/465; H10W70/466; H10W90/00; H10W90/811; H10W72/00; H10W72/071; H10W72/072; H10W72/07251; H10W72/20; H10W72/50; H10W72/551; H10W72/552; H10W72/5522; H10W72/5524; H10W72/851; H10W72/853; H10W72/859; H10W72/865; H10W72/90; H10W72/941; H10W72/9415; H10W74/00; H10W90/701; H10W90/731; H10W90/736; H10W90/751; H10W90/756; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T29/49146
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
96 words
A method of constructing a semiconductor die assembly comprising: providing a first semiconductor die having at least one direct-to-substrate conductor type electrical connector; providing a second semiconductor die having at least one bond pad; directly adhering said first semiconductor die and said second semiconductor die back-to-back; providing at least one substrate including a plurality of conductors; directly connecting said at least one direct-to-substrate conductor type electrical connector to one of said plurality of conductors; and connecting said at least one bond pad to a second one of said plurality of conductors through an intermediate conductive element.
Claim 2
Independent Claim
96 words
A method of constructing a semiconductor die assembly comprising: providing a first semiconductor die having at least one direct-to-substrate conductor type electrical connector; providing a second semiconductor die having at least one bond pad; directly adhering said first semiconductor die and said second semiconductor die back-to-back; providing at least one substrate including a plurality of conductors; directly connecting said at least one direct-to-substrate conductor type electrical connector to one of said plurality of conductors; and connecting said at least one bond pad to a second one of said plurality of conductors through an intermediate conductive element.
Claim 3
Dependent Claim
19 words
The method of claim 1, wherein connecting said at least one direct-to-substrate conductor type electrical connector comprises refluxing solder.
Claim 4
Dependent Claim
24 words
The method of claim 1, wherein connecting said at least one direct-to-substrate conductor type electrical connector comprises adhering a polymer having a conductive capability.
Claim 5
Dependent Claim
36 words
The method of claim 1, wherein connecting said at least one bond pad comprises attaching at least one bond wire between said at least one bond pad and said second one of said plurality of conductors.
Claim 6
Dependent Claim
41 words
The method of claim 1, wherein connecting said at least one bond pad comprises attaching at least one metal trace carried on a dielectric film between said at least one bond pad and said second one of said plurality of conductors.
Claim 7
Dependent Claim
93 words
The method of claim 1, further comprising: providing a third semiconductor die having at least one direct-to-substrate conductor type electrical connector; providing a fourth semiconductor die having at least one bond pad; adhering said third semiconductor die and said fourth semiconductor die back-to-back; directly connecting said at least one direct-to-substrate conductor type electrical connector of said third semiconductor die to one of said plurality of conductors; and connecting said at least one bond pad of said fourth semiconductor die to a second one of said plurality of conductors through an intermediate conductive element.
Claim 8
Independent Claim
183 words
A method of constructing a semiconductor die assembly comprising: providing a first semiconductor die having at least one direct-to-substrate conductor type electrical connector and at least one bond pad; providing a second semiconductor die having at least one direct-to-substrate conductor type electrical connector; directly adhering said first semiconductor die and said second semiconductor die back-to-back; providing at least one substrate including a first plurality of conductors and a second plurality of conductors, each of said first and said second plurality of conductors having a first conductive surface and a second conductive surface; directly connecting said at least one direct-to-substrate conductor type electrical connector of said first semiconductor die to a first conductive surface of one of said first plurality of conductors; connecting said at least one bond pad of said first semiconductor die to a second conductive surface of a second one of said first plurality of conductors through an intermediate conductive element; and directly connecting said at least one direct-to-substrate conductor type electrical connector of said second semiconductor die to a first conductive surface of one of said second plurality of conductors.
Claim 9
Independent Claim
183 words
A method of constructing a semiconductor die assembly comprising: providing a first semiconductor die having at least one direct-to-substrate conductor type electrical connector and at least one bond pad; providing a second semiconductor die having at least one direct-to-substrate conductor type electrical connector; directly adhering said first semiconductor die and said second semiconductor die back-to-back; providing at least one substrate including a first plurality of conductors and a second plurality of conductors, each of said first and said second plurality of conductors having a first conductive surface and a second conductive surface; directly connecting said at least one direct-to-substrate conductor type electrical connector of said first semiconductor die to a first conductive surface of one of said first plurality of conductors; connecting said at least one bond pad of said first semiconductor die to a second conductive surface of a second one of said first plurality of conductors through an intermediate conductive element; and directly connecting said at least one direct-to-substrate conductor type electrical connector of said second semiconductor die to a first conductive surface of one of said second plurality of conductors.
Claim 10
Dependent Claim
44 words
The method of claim 7, wherein connecting said at least one direct-to-substrate conductor type electrical connector of said first semiconductor die comprises reflowing solder; and wherein connecting said at least one direct-to-substrate conductor type electrical connector of said second semiconductor die comprises refluxing solder.
Claim 11
Dependent Claim
54 words
The method of claim 7, wherein connecting said at least one direct-to-substrate conductor type electrical connector of said first semiconductor die comprises adhering a polymer having a conductive capability; and wherein connecting said at least one direct-to-substrate conductor type electrical connector of said second semiconductor die comprises adhering a polymer having a conductive capability.
Claim 12
Dependent Claim
42 words
The method of claim 7, wherein connecting said at least one bond pad of said first semiconductor die comprises attaching at least one bond wire between said at least one bond pad and said second one of said first plurality of conductors.
Claim 13
Dependent Claim
47 words
The method of claim 7, wherein connecting said at least one bond pad of said first semiconductor die comprises attaching at least one metal trace carried on a dielectric film between said at least one bond pad and said second one of said first plurality of conductors.
Claim 14
Dependent Claim
118 words
The method of claim 7, further comprising: providing a third semiconductor die having at least one direct-to-substrate conductor type electrical connector and at least one bond pad; wherein said at least one substrate includes a third plurality of conductors, each of said third plurality of conductors having a first conductive surface and a second conductive surface; directly connecting said at least one direct-to-substrate conductor type electrical connector of said third semiconductor die to a first conductive surface of one of said third plurality of conductors; and connecting said at least one bond pad of said third semiconductor die to a second conductive surface of a second one of said third plurality of conductors through an intermediate conductive element.
Claim 15
Dependent Claim
24 words
The method of claim 12, wherein connecting said at least one direct-to-substrate conductor type electrical connector of said third semiconductor die comprises reflowing solder.
Claim 16
Dependent Claim
29 words
The method of claim 12, wherein connecting said at least one direct-to-substrate conductor type electrical connector of said third semiconductor die comprises adhering a polymer having a conductive capability.
Claim 17
Dependent Claim
42 words
The method of claim 12, wherein connecting said at least one bond pad of said third semiconductor die comprises attaching at least one bond wire between said at least one bond pad and said second one of said third plurality of conductors.
Claim 18
Dependent Claim
47 words
The method of claim 12, wherein connecting said at least one bond pad of said third semiconductor die comprises attaching at least one metal trace carried on a dielectric film between said at least one bond pad and said second one of said third plurality of conductors.
References Cited (Backward Citations)
JPS5240062A
Cited
US4264917A
Cited
JPS5662351A
Cited
JPS5818949A
Cited
US4746392A
Cited
US4701236A
Cited
US4862245A
Cited
JPS62126661A
Cited
JPH01123428A
Cited
JPH02211643A
Cited
JPH0322544A
Cited
US5239198A
Cited
US5012323A
Cited
JPH03169062A
Cited
US5147815A
Cited
US5146308A
Cited
US5229647A
Cited
US5331235A
Cited
US5252857A
Cited
US5266833A
Cited
US5438224A
Cited
US5422435A
Cited
EP0576708A1
Cited
US5399898A
Cited
US5311057A
Cited
US5484959A
Cited
US5340771A
Cited
US5328087A
Cited
US5291061A
Cited
US5323060A
Cited
US5471369A
Cited
US5483024A
Cited
US5491612A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-06-27 | 2003-12-27 | 2004-06-27 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-06-27 | 2007-12-27 | 2008-06-27 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-06-27 | 2011-12-27 | 2012-06-27 | $7700.00 | Window Closed / Lapsed |