Short channel fermi-threshold field effect transistors

Claim 2

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth,(at least one of said first and second depths being selected to minimize the static electric field perpendicular to said substrate surface,) from said substrate surface to said second depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 3

A field effect transistor according to claim 1 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 4

A field effect transistor according to claim 1 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 5

A field effect transistor according to claim 2 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 6

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to minimize the static electric field perpendicular to said substrate surface, from said substrate surface to said second depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 7

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to minimize the static electric field perpendicular to said substrate surface, from said substrate surface to said second depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 8

A field effect transistor according to claim 5 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 9

A field effect transistor according to claim 6 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 10

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to produce a threshold voltage for said field effect transistor which is twice the Fermi potential of said semiconductor substrate; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 11

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to produce a threshold voltage for said field effect transistor which is twice the Fermi potential of said semiconductor substrate; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 12

A field effect transistor according to claim 8 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 13

A field effect transistor according to claim 8 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 14

A field effect transistor according to claim 10 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 15

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to produce a threshold voltage for said field effect transistor which is twice the Fermi potential of said semiconductor substrate; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 16

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to produce a threshold voltage for said field effect transistor which is twice the Fermi potential of said semiconductor substrate; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 17

A field effect transistor according to claim 12 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 18

A field effect transistor according to claim 13 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 19

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to allow carriers of said second conductivity type to flow from said source region to said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 20

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to allow carriers of said second conductivity type to flow from said source region to said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 21

A field effect transistor according to claim 15 wherein said first depth is further selected to allow said carriers of said second conductivity type to flow from said source region to said drain region in said channel region, extending from said second depth towards said substrate surface upon application of voltage to said gate electrode beyond the threshold voltage of said field effect transistor.

Claim 22

A field effect transistor according to claim 15 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 23

A field effect transistor according to claim 15 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 24

A field effect transistor according to claim 18 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 25

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to allow carriers of said second conductivity type to flow from said source region to said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 26

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to allow carriers of said second conductivity type to flow from said source region to said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 27

A field effect transistor according to claim 15 wherein said first depth is further selected to allow said carriers of said second conductivity type to flow from said source region to said drain region in said channel region, extending from said second depth towards said substrate surface upon application of voltage to said gate electrode beyond the threshold voltage of said field effect transistor.

Claim 28

A field effect transistor according to claim 20 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 29

A field effect transistor according to claim 22 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 30

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to allow carriers of said second conductivity type to flow within said channel region, from said source region to said drain region and beneath said substrate surface, without creating an inversion layer in said channel; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 31

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to allow carriers of said second conductivity type to flow within said channel region, from said source region to said drain region and beneath said substrate surface, without creating an inversion layer in said channel; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 32

A field effect transistor according to claim 24 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 33

A field effect transistor according to claim 24 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 34

A field effect transistor according to claim 26 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 35

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to allow carriers of said second conductivity type to flow within said channel region, from said source region to said drain region and beneath said substrate surface, without creating an inversion layer in said channel; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 36

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth, at least one of said first and second depths being selected to allow carriers of said second conductivity type to flow within said channel region, from said source region to said drain region and beneath said substrate surface, without creating an inversion layer in said channel; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively.

Claim 37

A field effect transistor according to claim 28 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 38

A field effect transistor according to claim 29 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 39

A field effect transistor comprising: a semiconductor substrate of first conductivity type having an intrinsic carrier concentration n i at temperature T degrees Kelvin and a permittivity ε s ; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth V T from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth and being doped at a doping concentration N + ; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, having an effective channel length L eff and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions, and having a thickness T ox and permittivity ε i ; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively, said gate electrode including a polysilicon layer which is doped said first conductivity type at a doping concentration N poly ; said first depth Y T being less than or equal to ##EQU18## where V g-s is the work function difference between said gate and source electrodes and is equal to kT/q Ln (N + N poly /n i 2 ), where V jff is the barrier potential for the Fermi-FET and is equal to kT/q Ln(N + n i ), where V d is the voltage applied to the drain electrode, q is 1.6×10 -19 coulomb and K is 1.38×10 -23 Joules/°Kelvin.

Claim 40

A field effect transistor comprising: a semiconductor substrate of first conductivity type having an intrinsic carrier concentration n i at temperature T degrees Kelvin and a permittivity ε s ; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth V T from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth and being doped at a doping concentration N + ; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, having an effective channel length L eff and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions, and having a thickness T ox and permittivity ε i ; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively, said gate electrode including a polysilicon layer which is doped said first conductivity type at a doping concentration N poly ; said first depth Y T being less than or equal to ##EQU18## where V g-s is the work function difference between said gate and source electrodes and is equal to kT/q Ln (N + N poly /n i 2 ), where V jff is the barrier potential for the Fermi-FET and is equal to kT/q Ln(N + n i ), where V d is the voltage applied to the drain electrode, q is 1.6×10 -19 coulomb and K is 1.38×10 -23 Joules/°Kelvin.

Claim 41

A field effect transistor according to claim 31 wherein Y T is equal to ##EQU19## where V g-s is the work function difference between said gate and source electrodes and is equal to kT/q Ln(N + N poly /n i 2 ), where V jff is the barrier potential for the Fermi-FET and is equal to kT/q Ln(N + /n i ), where V d is the voltage applied to the drain electrode, q is 1.6×10 -19 coulomb and K is 1.38×10 -23 Joules/°Kelvin.

Claim 42

A field effect transistor according to claim 31 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 43

A field effect transistor according to claim 31 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 44

A field effect transistor according to claim 34 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 45

A field effect transistor comprising: a semiconductor substrate of first conductivity type having an intrinsic carrier concentration n i at temperature T degrees Kelvin and a permittivity ε s ; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth and being doped at a doping concentration N + ; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, having an effective channel length L eff and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions and having a thickness T ox and permittivity ε i ; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively, said first depth Y T being less than or equal to ##EQU20## where V g-s is the work function difference between said gate and source electrodes and is equal to kT/q Ln(N + N poly /n i 2 ), where V jff is the barrier potential for the Fermi-FET and is equal to kT/q Ln(N + /n i ), where V d is the voltage applied to the drain electrode, q is 1.6×10 -19 coulomb and K is 1.38×10 -23 Joules/°Kelvin.

Claim 46

A field effect transistor comprising: a semiconductor substrate of first conductivity type having an intrinsic carrier concentration n i at temperature T degrees Kelvin and a permittivity ε s ; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth and being doped at a doping concentration N + ; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, having an effective channel length L eff and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions and having a thickness T ox and permittivity ε i ; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively, said first depth Y T being less than or equal to ##EQU20## where V g-s is the work function difference between said gate and source electrodes and is equal to kT/q Ln(N + N poly /n i 2 ), where V jff is the barrier potential for the Fermi-FET and is equal to kT/q Ln(N + /n i ), where V d is the voltage applied to the drain electrode, q is 1.6×10 -19 coulomb and K is 1.38×10 -23 Joules/°Kelvin.

Claim 47

A field effect transistor according to claim 36 wherein Y T is equal to ##EQU21## where V g-s is the work function difference between said gate and source electrodes and is equal to kT/q Ln(N + N poly /n i 2 ), where V jff is the barrier potential for the Fermi-FET and is equal to kT/q Ln(N + /n i ), where V d is the voltage applied to the drain electrode, q is 1.6×10 -19 coulomb and K is 1.38-10.sup.×23 Joules/°Kelvin.

Claim 48

A field effect transistor according to claim 36 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 49

A field effect transistor according to claim 38 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 50

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; and a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 51

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; and a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 52

A field effect transistor according to claim 40 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 53

A field effect transistor according to claim 40 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 54

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; and a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 55

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; and a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 56

A field effect transistor according to claim 43 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 57

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof; spaced apart source and drain regions of said second conductivity type in said tub region; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending from said substrate surface; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively, and a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 58

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof; spaced apart source and drain regions of said second conductivity type in said tub region; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending from said substrate surface; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively, and a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 59

A field effect transistor according to claim 45 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 60

A field effect transistor according to claim 45 wherein said tub region has nonuniform tub depth.

Claim 61

A field effect transistor according to claim 45 wherein said tub region extends a first predetermined depth from said substrate surface to below at least one of said spaced apart source and drain regions and extends a second predetermined depth from said substrate surface to below said channel region, wherein said second predetermined depth is less than said first predetermined depth.

Claim 62

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending from said substrate surface; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; and a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 63

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending from said substrate surface; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; and a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 64

A field effect transistor according to claim 49 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 65

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to initiate flow of carriers of said second conductivity type from said source region towards said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 66

A field effect transistor comprising: a semiconductor substrate of first conductivity type; a tub region of second conductivity type in said substrate at a surface thereof, and extending a first depth from said substrate surface; spaced apart source and drain regions of said second conductivity type in said tub region, said spaced apart source and drain regions extending from said substrate surface to beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to initiate flow of carriers of said second conductivity type from said source region towards said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 67

A field effect transistor according to claim 51 wherein said first depth is further selected to allow said carriers of said second conductivity type to flow from said source region to said drain region in said channel region, extending from said second depth towards said substrate surface upon application of voltage to said gate electrode beyond the threshold voltage of said field effect transistor.

Claim 68

A field effect transistor according to claim 51 wherein said spaced apart source and drain regions further extend laterally away from one another, to beyond said tub region.

Claim 69

A field effect transistor according to claim 51 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending into said channel region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 70

A field effect transistor according to claim 54 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.

Claim 71

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to initiate flow of carriers of said second conductivity type from said source region towards said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 72

A field effect transistor comprising: a semiconductor substrate of first conductivity type; spaced apart source and drain regions of second conductivity type in said semiconductor substrate at a surface thereof; a tub region of said second conductivity type in said substrate at a surface thereof, between said spaced apart source and drain regions, said tub region extending a first depth from said substrate surface, said source and drain regions extending into said substrate beyond said first depth; a channel region of said second conductivity type in said tub region, between said spaced apart source and drain regions, and extending a second depth from said substrate surface, wherein said second depth is less than said first depth; a gate insulating layer on said substrate surface, between said spaced apart source and drain regions; and source, drain and gate electrodes contacting said source and drain regions and said gate insulating layer, respectively; said first depth being selected to initiate flow of carriers of said second conductivity type from said source region towards said drain region in said channel region, at said second depth upon application of the threshold voltage of said field effect transistor to said gate electrode.

Claim 73

A field effect transistor according to claim 51 wherein said first depth is further selected to allow said carriers of said second conductivity type to flow from said source region to said drain region in said channel region, extending from said second depth towards said substrate surface upon application of voltage to said gate electrode beyond the threshold voltage of said field effect transistor.

Claim 74

A field effect transistor according to claim 56 further comprising a source extension region in said substrate at said substrate face adjacent said source region and extending toward said drain region, said source region and said source extension region being doped said second conductivity type at same doping concentration.

Claim 75

A field effect transistor according to claim 58 further comprising a drain extension region in said substrate at said substrate face adjacent said drain region and extending into said channel region, said drain region and said drain extension region being doped said second conductivity type at same doping concentration.