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US5679595A
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Self-registered capacitor bottom plate-local interconnect scheme for DRAM
Assignee: Chang Liao Holdings LLC
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Filing: 1996-07-24
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Granted: 1997-10-21
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Expires: 2016-07-24
Abstract
Abstract A method and structure for a lower capacitor electrode for a dynamic random access integrated circuit. A polysilicon gate layer is formed over a thin layer of oxide in a first region of a semiconductor substrate. Another oxide layer is then formed overlying the polysilicon gate layer. A polysilicon layer which was doped by S/D implant including the lower capacitor electrode self-aligns and forms overlying a second region of the semiconductor substrate and over the oxide layer on the polysilicon gate layer. A nitride layer forms on the lower capacitor electrode portion overlying the second region. Exposed portions of the polysilicon layer are then oxidized. The S/D was formed by driving dopant from implanted second layer polysilicon. Portions of polysilicon under the nitride layer corresponding to the lower capacitor electrode oxidizes at a slower rate than the exposed portions of the polysilicon. Such sequence of steps forms a self-aligned lower capacitor electrode for a dynamic random access memory integrated circuit.
Inventors
- 👤 Min-Liang Chen
- 👤 Nan-Hsiung Tsai
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-03 23:06
CPC Classifications
H; H10; H10B; H10B12/00; H10B12/01; H10B12/02; H10B12/03; H10B12/033; H10D; H10D1/00; H10D1/60; H10D1/68; H10D1/692
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
175 words
A method of forming a semiconductor device comprising the steps of: providing a semiconductor substrate having a first region and a second region; forming a first polysilicon layer over said first region, said first polysilicon layer comprising a gate electrode; forming a first oxide layer overlying said first polysilicon layer; forming a second polysilicon layer overlying said second region and over said first oxide layer, said second polysilicon layer comprising a lower capacitor electrode; forming a second oxide layer overlying said second polysilicon layer; forming a nitride layer on said second oxide layer overlying a first portion of said second polysilicon layer overlying said second region; oxidizing said second polysilicon layer, a second portion of said second polysilicon layer over said first region oxidizing at a substantially faster rate than said first portion of said second polysilicon layer under said nitride layer; removing said second oxide layer overlying said second polysilicon layer; removing said nitride layer; and forming a capacitor dielectric layer overlying said first portion of said second polysilicon layer over said second region.
Claim 2
Independent Claim
175 words
A method of forming a semiconductor device comprising the steps of: providing a semiconductor substrate having a first region and a second region; forming a first polysilicon layer over said first region, said first polysilicon layer comprising a gate electrode; forming a first oxide layer overlying said first polysilicon layer; forming a second polysilicon layer overlying said second region and over said first oxide layer, said second polysilicon layer comprising a lower capacitor electrode; forming a second oxide layer overlying said second polysilicon layer; forming a nitride layer on said second oxide layer overlying a first portion of said second polysilicon layer overlying said second region; oxidizing said second polysilicon layer, a second portion of said second polysilicon layer over said first region oxidizing at a substantially faster rate than said first portion of said second polysilicon layer under said nitride layer; removing said second oxide layer overlying said second polysilicon layer; removing said nitride layer; and forming a capacitor dielectric layer overlying said first portion of said second polysilicon layer over said second region.
Claim 3
Dependent Claim
14 words
The method of claim 1 wherein said capacitor dielectric layer is a oxide layer.
Claim 4
Dependent Claim
19 words
The method of claim 2 wherein said capacitor dielectric layer has a thickness between about 50 to 120 Å.
Claim 5
Dependent Claim
17 words
The method of claim 2 wherein said capacitor dielectric layer has a thickness of about 75 Å.
Claim 6
Dependent Claim
29 words
The method of claim 1 further comprising a step of forming a third polysilicon layer overlying said capacitor dielectric layer, said third polysilicon layer comprising an upper capacitor electrode.
Claim 7
Dependent Claim
32 words
The method of claim 5 wherein said second polysilicon layer overlying said second region, said capacitor dielectric layer, and said third polysilicon layer define a capacitor for a DRAM integrated circuit structure.
Claim 8
Dependent Claim
52 words
The method of claim 1 wherein said step of forming said first oxide layer comprises: forming a cap oxide layer overlying said first polysilicon layer; and forming a sidewall spacer on an edge of said first polysilicon layer, said edge being at an intersection of said first region and said second region.
Claim 9
Dependent Claim
18 words
The method of claim 1 wherein said nitride layer has a thickness from about 1,000 to 1,600 Å.
Claim 10
Dependent Claim
15 words
The method of claim 1 further comprising a step of doping said first polysilicon layer.
Claim 11
Dependent Claim
15 words
The method of claim 1 further comprising a step of doping said second polysilicon layer.
Claim 12
Dependent Claim
25 words
The method of claim 10 wherein said step of oxidizing said second polysilicon layer diffuses dopants from said second polysilicon layer into said second region.
Claim 13
Dependent Claim
14 words
The method of claim 1 wherein said capacitor dielectric layer comprises an ONO structure.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2000-10-20 | 2001-04-21 | 2001-10-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2004-10-20 | 2005-04-21 | 2005-10-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2008-10-20 | 2009-04-21 | 2009-10-21 | $7700.00 | Window Closed / Lapsed |