Method and circuitry for enabling and permanently disabling test mode access in a flash memory device

Claim 1

A method of enabling access to a test mode of a semiconductor memory, the semiconductor memory having a first multiplicity of address pins and a second multiplicity of data pins for inputting data signals, the semiconductor memory including a user interface for analyzing the data signals to determine if they represent one of a multiplicity of commands, the multiplicity of commands including a first test mode enable command, a second test mode enable command, and a trap door command, the user interface ignoring the trap door command unless enabled to recognize the test mode access command, the method comprising the steps of: (A) determining if the first test mode enable command has been received in the user interface; (B) if the first test mode enable command has been received in the user interface, then determining if a first confirmation code has been received in the user interface; (C) if the first confirmation code has been received in the user interface, then determining if the second test mode enable command has been received in the user interface; (D) if the second test mode enable command has been received in the user interface, then determining if a second confirmation code has been received in the user interface, wherein the second confirmation code is different from the first confirmation code; (E) if the second confirmation code has been received in the user interface, then enabling the user interface to recognize the trap door command.

Claim 2

A method of enabling access to a test mode of a semiconductor memory, the semiconductor memory having a first multiplicity of address pins and a second multiplicity of data pins for inputting data signals, the semiconductor memory including a user interface for analyzing the data signals to determine if they represent one of a multiplicity of commands, the multiplicity of commands including a first test mode enable command, a second test mode enable command, and a trap door command, the user interface ignoring the trap door command unless enabled to recognize the test mode access command, the method comprising the steps of: (A) determining if the first test mode enable command has been received in the user interface; (B) if the first test mode enable command has been received in the user interface, then determining if a first confirmation code has been received in the user interface; (C) if the first confirmation code has been received in the user interface, then determining if the second test mode enable command has been received in the user interface; (D) if the second test mode enable command has been received in the user interface, then determining if a second confirmation code has been received in the user interface, wherein the second confirmation code is different from the first confirmation code; (E) if the second confirmation code has been received in the user interface, then enabling the user interface to recognize the trap door command.

Claim 5

A method of enabling access to a test mode of a semiconductor memory, the semiconductor memory having a first multiplicity of address pins and a second multiplicity of data pins, the semiconductor memory including control registers for setting the internal status of the semiconductor memory, the semiconductor memory including a user interface for analyzing signals applied to the data pins to determine if they represent a one of a third multiplicity of commands, the third multiplicity of commands including a first test mode enable command, a second test mode enable command, and a trap door command, the user interface ignoring the trap door command unless enabled to recognize the trap door command, the trap door command giving the user interface access to the control registers, the method comprising the steps of: a) if the first test mode enable command is received: 1) determining whether a first group of signals applied to the data pins represent a first confirmation code; 2) determining whether a second group of signals applied to the address pins represent a second confirmation code; 3) starting to toll a time period if the first group of signals represents the first confirmation code and the second group of signals represents the second confirmation code; b) if the second test mode enable command is received before the time period tolls: 1) determining whether a third group of signals applied to the data pins represent a third confirmation code; 2) determining whether a fourth group of signals applied to the address pins represent a fourth confirmation code; 3) enabling the user interface to recognize the trap door command if the third group of signals represents the third confirmation code and the fourth group of signals represents the fourth confirmation code.

Claim 6

A method of enabling access to a test mode of a semiconductor memory, the semiconductor memory having a first multiplicity of address pins and a second multiplicity of data pins, the semiconductor memory including control registers for setting the internal status of the semiconductor memory, the semiconductor memory including a user interface for analyzing signals applied to the data pins to determine if they represent a one of a third multiplicity of commands, the third multiplicity of commands including a first test mode enable command, a second test mode enable command, and a trap door command, the user interface ignoring the trap door command unless enabled to recognize the trap door command, the trap door command giving the user interface access to the control registers, the method comprising the steps of: a) if the first test mode enable command is received: 1) determining whether a first group of signals applied to the data pins represent a first confirmation code; 2) determining whether a second group of signals applied to the address pins represent a second confirmation code; 3) starting to toll a time period if the first group of signals represents the first confirmation code and the second group of signals represents the second confirmation code; b) if the second test mode enable command is received before the time period tolls: 1) determining whether a third group of signals applied to the data pins represent a third confirmation code; 2) determining whether a fourth group of signals applied to the address pins represent a fourth confirmation code; 3) enabling the user interface to recognize the trap door command if the third group of signals represents the third confirmation code and the fourth group of signals represents the fourth confirmation code.

Claim 7

A method of eliminating access to a test mode of a semiconductor memory device, the semiconductor memory device including a main memory array and an array controller for reading and writing to the main memory array, the array controller including a nonvolatile instruction memory and a logic unit, the instruction memory providing instruction words to the logic unit, the logic unit executing the instructions words, the instruction memory storing at a first address a first pointer pointing to a second address, the instruction memory storing at the second address a test mode algorithm for operating the semiconductor memory device in the test mode, the method of eliminating access to the test mode comprising the steps of: (a) loading a first algorithm for programming the instruction memory into a buffer, wherein the buffer is coupled to the logic unit: (b) enabling the buffer to provide instruction words to the logic unit in place of the instruction memory such that the instruction memory is enabled to be programmed; (c) issuing a command to execute the first algorithm to program a second pointer in the instruction memory at the first address that is not pointing to the second address so as to eliminate the access to the instruction memory at the second address for the test mode algorithm.

Claim 8

A method of eliminating access to a test mode of a semiconductor memory device, the semiconductor memory device including a main memory array and an array controller for reading and writing to the main memory array, the array controller including a nonvolatile instruction memory and a logic unit, the instruction memory providing instruction words to the logic unit, the logic unit executing the instructions words, the instruction memory storing at a first address a first pointer pointing to a second address, the instruction memory storing at the second address a test mode algorithm for operating the semiconductor memory device in the test mode, the method of eliminating access to the test mode comprising the steps of: (a) loading a first algorithm for programming the instruction memory into a buffer, wherein the buffer is coupled to the logic unit: (b) enabling the buffer to provide instruction words to the logic unit in place of the instruction memory such that the instruction memory is enabled to be programmed; (c) issuing a command to execute the first algorithm to program a second pointer in the instruction memory at the first address that is not pointing to the second address so as to eliminate the access to the instruction memory at the second address for the test mode algorithm.