Static random access memory device with memory cell testing circuit

Claim 1

A static random access memory device comprising: a plurality of read-out data bus lines; a plurality of writing data bus lines independent from said plurality of read-out data bus lines; a plurality of memory cell blocks each of which has plurality of memory cell sections; a plurality of write circuits which respectively write data forwarded from said plurality of write data bus lines, said plurality of memory cell blocks; a plurality of sense amplifiers which respectively amplify the data read out from the memory cell blocks and forward the amplified data to said plurality of read-out data bus lines; an input circuit which is connected to said plurality of write data bus lines and which, in a normal mode, supplies an input data to a selected memory cell section among said plurality of memory cell sections via one of said plurality of write circuits corresponding to said selected memory cell section; an output circuit which is connected to said plurality of read-out data bus lines and, in the normal mode, outputs read out data which is read out from a selected memory cell section among said plurality of memory cell sections by one of said plurality of sense amplifiers corresponding to said selected memory cell section; a test mode setting circuit which, in a test mode, activates all of said plurality of write circuits for performing the data writing of the same data in all of said plurality of memory cell sections simultaneously, and activates said plurality of sense amplifiers for performing the data reading from all of said plurality of memory cell sections simultaneously; a test mode switching circuit which, in the test mode, logically processes the data supplied from all of said plurality of sense amplifiers activated by said test mode setting circuit and causes said output circuit to output an output signal which indicates information as to a presence or an absence of any defective memory cells; a plurality of transfer gates having input nodes which are connected to said plurality of sense amplifiers, respectively, and output nodes which are commonly connected together; an inverter circuit having an output node and an input node which is connected to the output nodes of said plurality of transfer gates; an output buffer circuit having an input node which is coupled to the output node of said inverter circuit via said test mode switching circuit, and a signal output terminal for outputting said output signal; said test mode switching circuit comprising: a first transfer gate circuit for interrupting a data path from the output node of said inverter circuit to the input node of said output buffer circuit in the test mode; a coincidence circuit for taking a logical exclusive OR and a logical NAND of the data supplied from said plurality of sense amplifiers; and a second transfer gate circuit for transferring an output from said coincidence circuit to the input node of said output buffer circuit.