US5489547A
Expired / Lapsed
US
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Method of fabricating semiconductor device having polysilicon resistor with low temperature coefficient
Assignee: Texas Instruments Inc
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Filing: 1994-05-23
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Granted: 1996-02-06
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Expires: 2014-05-23
Abstract
Abstract A semiconductor device having a p type polysilicon resistor (56) with a moderate sheet resistance and low temperature coefficient of resistance is formed by a double-level polysilicon process. The process also produces n and p-channel transistors (44, 50), a capacitor having upper and lower n type polysilicon capacitor plates (36, 26), an n type polysilicon resistor (32) having a high sheet resistance, and an n type resistor (34) having a low sheet resistance. The p type doping used to form the source/drain regions (48) of p-channel transistor (50) counterdopes n type second level polysilicon to form p type polysilicon resistor (56) without effecting capacitor plates (36, 26) or the n type resistors (32, 34).
Inventors
- 👤 John P. Erdeljac
- 👤 Louis N. Hutter
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 01:26
CPC Classifications
H; H10; H10D; H10D1/00; H10D1/40; H10D1/47; H10D88/00; H10P; H10P32/00; H10P32/30; H10P32/302; Y; Y10; Y10S; Y10S148/00; Y10S148/136; Y10S148/146; Y10S257/00; Y10S257/903; Y10S257/904; Y10S438/00; Y10S438/934
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
277 words
A method of forming a semiconductor device, comprising the steps of: forming a first polysilicon resistor over and insulated from a semiconductor layer, said first polysilicon resistor being of a first conductivity type and having a first temperature coefficient of resistance, said step of forming said first polysilicon resistor including forming a layer of polysilicon over and insulated from said semiconductor layer, doping said layer of polysilicon with a dopant of said first conductivity type, and patterning and etching said layer of polysilicon to define said first polysilicon resistor and to define second and third resistors; doping said first polysilicon resistor with a dopant of a second conductivity type opposite said first conductivity type, said step of doping said first polysilicon resistor causing said first polysilicon resistor to be of said second conductivity type and to have a second temperature coefficient of resistance, said second temperature coefficient of resistance being closer to zero than said first temperature coefficient of resistance; masking said first polysilicon resistor, a center portion of said second resistor so that end portions of said second resistor adjacent said center portion are exposed, and a first portion of said semiconductor layer, a second portion of said semiconductor layer being exposed; doping said third resistor, said end portions of said second resistor, and said second portion of said semiconductor layer with material of said first conductivity type so that said third resistor and said end portions of said second resistor have a sheet resistance less than that of said center portion of said second resistor and at least one region of said first conductivity type is formed in said second portion of said semiconductor layer.
Claim 2
Independent Claim
277 words
A method of forming a semiconductor device, comprising the steps of: forming a first polysilicon resistor over and insulated from a semiconductor layer, said first polysilicon resistor being of a first conductivity type and having a first temperature coefficient of resistance, said step of forming said first polysilicon resistor including forming a layer of polysilicon over and insulated from said semiconductor layer, doping said layer of polysilicon with a dopant of said first conductivity type, and patterning and etching said layer of polysilicon to define said first polysilicon resistor and to define second and third resistors; doping said first polysilicon resistor with a dopant of a second conductivity type opposite said first conductivity type, said step of doping said first polysilicon resistor causing said first polysilicon resistor to be of said second conductivity type and to have a second temperature coefficient of resistance, said second temperature coefficient of resistance being closer to zero than said first temperature coefficient of resistance; masking said first polysilicon resistor, a center portion of said second resistor so that end portions of said second resistor adjacent said center portion are exposed, and a first portion of said semiconductor layer, a second portion of said semiconductor layer being exposed; doping said third resistor, said end portions of said second resistor, and said second portion of said semiconductor layer with material of said first conductivity type so that said third resistor and said end portions of said second resistor have a sheet resistance less than that of said center portion of said second resistor and at least one region of said first conductivity type is formed in said second portion of said semiconductor layer.
Claim 3
Dependent Claim
57 words
The method of claim 1 in which said semiconductor layer includes a first region of said first conductivity type and said step of doping said first polysilicon resistor includes doping said first region with a dopant of said second conductivity type to form at least one second region of said second conductivity type in said semiconductor layer.
Claim 4
Dependent Claim
19 words
The method of claim 2 in which said at least one second region includes a pair of source/drain regions.
Claim 5
Dependent Claim
23 words
The method of claim 1 in which said at least one region of said first conductivity type includes a pair of source/drain regions.
Claim 6
Dependent Claim
57 words
The method of claim 1 in which said step of doping said third resistor, said end portions of said second resistor, and an unmasked portion of said semiconductor layer includes implanting said third resistor, said end portions of said second resistor, and an unmasked portion of said semiconductor layer with a dopant of said first conductivity type.
Claim 7
Dependent Claim
22 words
The method of claim 1 in which said first conductivity type is n type and said second conductivity type is p type.
Claim 8
Dependent Claim
29 words
The method of claim 1 in which said step of doping said first polysilicon resistor includes implanting said first polysilicon resistor with a dopant of said second conductivity type.
Claim 9
Dependent Claim
16 words
The method of claim 1 in which said semiconductor layer is an epitaxial layer of silicon.
Claim 10
Independent Claim
230 words
A method of forming a semiconductor device, comprising the steps of: forming a first polysilicon resistor over and insulated from a semiconductor layer, said first polysilicon resistor being of a first conductivity type and having a first temperature coefficient of resistance, said step of forming said first polysilicon resistor including forming a layer of polysilicon over and insulated from said semiconductor layer, doping said layer of polysilicon with a dopant of said first conductivity type, and patterning and etching said layer of polysilicon to define said first polysilicon resistor and to define a second polysilicon resistor; doping said first polysilicon resistor with a dopant of a second conductivity type opposite said first conductivity type, said step of doping said first polysilicon resistor causing said first polysilicon resistor to be of said second conductivity type and to have a second temperature coefficient of resistance, said second temperature coefficient of resistance being closer to zero than said first temperature coefficient of resistance; masking said second polysilicon resistor prior to said step of doping said first polysilicon resistor so that after said step of doping said first polysilicon resistor, said second polysilicon resistor is of said first conductivity type and has a first sheet resistance and said first polysilicon resistor is of said second conductivity type and has a second sheet resistance, said second sheet resistance being less than said first sheet resistance.
Claim 11
Independent Claim
230 words
A method of forming a semiconductor device, comprising the steps of: forming a first polysilicon resistor over and insulated from a semiconductor layer, said first polysilicon resistor being of a first conductivity type and having a first temperature coefficient of resistance, said step of forming said first polysilicon resistor including forming a layer of polysilicon over and insulated from said semiconductor layer, doping said layer of polysilicon with a dopant of said first conductivity type, and patterning and etching said layer of polysilicon to define said first polysilicon resistor and to define a second polysilicon resistor; doping said first polysilicon resistor with a dopant of a second conductivity type opposite said first conductivity type, said step of doping said first polysilicon resistor causing said first polysilicon resistor to be of said second conductivity type and to have a second temperature coefficient of resistance, said second temperature coefficient of resistance being closer to zero than said first temperature coefficient of resistance; masking said second polysilicon resistor prior to said step of doping said first polysilicon resistor so that after said step of doping said first polysilicon resistor, said second polysilicon resistor is of said first conductivity type and has a first sheet resistance and said first polysilicon resistor is of said second conductivity type and has a second sheet resistance, said second sheet resistance being less than said first sheet resistance.
Claim 12
Dependent Claim
30 words
The method of claim 9 in which said first sheet resistance is greater than about 500 ohms/square and said second sheet resistance is in the range of about 150-350 ohms/square,
Claim 13
Dependent Claim
15 words
The method of claim 10 in which said second sheet resistance is about 170 ohms/square,
Claim 14
Dependent Claim
16 words
The method of claim 1 in which said second temperature coefficient of resistance is about zero.
References Cited (Backward Citations)
US4416049A
Cited
US4208781A
Cited
US4209716A
Cited
US4377819A
Cited
US4370798A
Cited
US4391650A
Cited
US4467519A
Cited
US4419812A
Cited
US4577390A
Cited
US4579600A
Cited
US4679170A
Cited
US5198382A
Cited
US5365099A
Cited
US5196233A
Cited
US5187559A
Cited
US5273924A
Cited
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