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US5296390A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for fabricating a semiconductor device having a vertical channel of carriers

Assignee: Fujitsu Ltd
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Filing: 1993-05-17
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Granted: 1994-03-22
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Expires: 2013-05-17
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Abstract

Abstract A semiconductor device comprises a substrate having a stepped upper major surface, an emitter layer of a semiconductor material provided on the stepped upper major surface of the substrate and having a corresponding stepped upper major surface, a base layer provided on stepped upper major surface of the emitter layer and comprising a plurality of channels of carriers and a plurality of control regions for controlling the passage of carriers through the control regions, and a collector layer of a semiconductor material provided on the base layer for collecting the carriers that have passed through the channels. Each channel extends from the emitter layer to the collector layer, and at least one channel and one control region are provided adjacent with each other in correspondence to each step of the upper major surface of the emitter layer.

Inventors

  • 👤 Yuji Awano

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 22:29
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/40; H10D30/47; H10D30/202; H10D62/00; H10D62/10; H10D62/17; H10D62/213; H10D62/221; H10D30/471; Y; Y10; Y10S; Y10S148/00; Y10S148/072

Claims Analysis

Total Claims: 3
Claim 1
Independent Claim 201 words
A method for fabricating a semiconductor device, comprising the steps of: providing a substrate having a stepped upper major surface; growing a semiconductor material epitaxially on the stepped upper major surface of the substrate as an emitter layer, said emitter layer releasing carriers, said step of growing the emitter layer being achieved in a crystal growth apparatus; forming a base layer comprising a plurality of regions of different compositions on the stepped upper major surface of the substrate, said plurality of regions including a channel of the carriers that have been released by the emitter layer, said step of forming the base layer being achieved in said same crystal growth apparatus such that said plurality of regions are repeated in each step of the stepped upper major surface of the emitter layer and such that each region extend from a lower major surface of the base layer to an upper major surface of the base layer; and growing a semiconductor material epitaxially on an upper major surface of the base layer as a collector layer, said collector layer collecting the carriers passed through the base layer, said step of growing the semiconductor material being achieved in the same crystal growth apparatus.
Claim 2
Independent Claim 201 words
A method for fabricating a semiconductor device, comprising the steps of: providing a substrate having a stepped upper major surface; growing a semiconductor material epitaxially on the stepped upper major surface of the substrate as an emitter layer, said emitter layer releasing carriers, said step of growing the emitter layer being achieved in a crystal growth apparatus; forming a base layer comprising a plurality of regions of different compositions on the stepped upper major surface of the substrate, said plurality of regions including a channel of the carriers that have been released by the emitter layer, said step of forming the base layer being achieved in said same crystal growth apparatus such that said plurality of regions are repeated in each step of the stepped upper major surface of the emitter layer and such that each region extend from a lower major surface of the base layer to an upper major surface of the base layer; and growing a semiconductor material epitaxially on an upper major surface of the base layer as a collector layer, said collector layer collecting the carriers passed through the base layer, said step of growing the semiconductor material being achieved in the same crystal growth apparatus.
Claim 3
Dependent Claim 63 words
A method as claimed in claim 1 in which said step of forming the base layer comprises the steps of growing the regions of different compositions consecutively in each step forming the stepped upper major surface of the emitter layer from a first edge of the step to an opposing, second edge of the step, along an upper major surface of the step.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1997-03-21 1997-09-20 1998-03-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2001-03-21 2001-09-20 2002-03-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2005-03-21 2005-09-20 2006-03-22 $7700.00 Window Closed / Lapsed

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