Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
130 words
A method of fabricating a transistor device of the type comprising a single type of semiconductor material divided into emitter and collector regions by a metal base layer, the method comprising: growing a single semiconductor crystal to form a first emitter or collector region of the transistor; providing a Schottky barrier metal base layer on a surface of the crystal, the thickness of the metal base layer being in the order of 10% of the zero bias depletion width in the semiconductor, the metal base layer having slits therein of a width in the order of the zero bias depletion width of the semiconductor; and growing a single semiconductor crystal from the first region over the metal base layer to provide a second collector or emitter region of the transistor.
Claim 2
Independent Claim
130 words
A method of fabricating a transistor device of the type comprising a single type of semiconductor material divided into emitter and collector regions by a metal base layer, the method comprising: growing a single semiconductor crystal to form a first emitter or collector region of the transistor; providing a Schottky barrier metal base layer on a surface of the crystal, the thickness of the metal base layer being in the order of 10% of the zero bias depletion width in the semiconductor, the metal base layer having slits therein of a width in the order of the zero bias depletion width of the semiconductor; and growing a single semiconductor crystal from the first region over the metal base layer to provide a second collector or emitter region of the transistor.
Claim 3
Dependent Claim
62 words
A method of fabricating a transistor device as claimed in claim 1 wherein the metal base layer is provided by forming a striated relief structure on a semiconductor surface, and coating both sides of ridges of the relief structure by a directed metal deposition, the transverse dimension of the deposition on each ridge being limited by the shadow of an adjacent ridge.
Claim 4
Dependent Claim
60 words
A method of fabricating a transistor device as claimed in claim 1 wherein the single semiconductor crystal is grown from the first region over the metal base layer by depositing an amorphous or polycrystalline layer over the metal base layer and scanning that layer with an electromagnetic beam to recrystallize the layer as a single crystal from the first region.
Claim 5
Dependent Claim
22 words
A method of fabricating a transistor device as claimed in claim 1 wherein the second region is grown by vapor phase epitaxy.
Claim 6
Independent Claim
142 words
A method of fabricating a transistor device of the type comprising a single type of semiconductor material divided into emitter and collector regions by a metal base layer, the method comprising: growing a single semiconductor crystal to form a first emitter or collector region of the transistor; providing a Schottky barrier metal base layer on a surface of the crystal the thickness of the metal base layer being in the order of 10% of the zero bias depletion width in the semiconductor; removing portions of the metal base layer to provide openings therein to expose the underlying semiconductor crystal the openings having a width in the order of the zero bias depletion width of the semiconductor; and growing a single semiconductor crystal from the first region over the metal base layer to provide a second collector or emitter region of the transistor.
Claim 7
Independent Claim
142 words
A method of fabricating a transistor device of the type comprising a single type of semiconductor material divided into emitter and collector regions by a metal base layer, the method comprising: growing a single semiconductor crystal to form a first emitter or collector region of the transistor; providing a Schottky barrier metal base layer on a surface of the crystal the thickness of the metal base layer being in the order of 10% of the zero bias depletion width in the semiconductor; removing portions of the metal base layer to provide openings therein to expose the underlying semiconductor crystal the openings having a width in the order of the zero bias depletion width of the semiconductor; and growing a single semiconductor crystal from the first region over the metal base layer to provide a second collector or emitter region of the transistor.
Claim 8
Dependent Claim
26 words
A method of fabricating a transistor device as claimed in claim 5 wherein the removed portions of the metal base layer form slits in that layer.