Patent JPS5286342A successfully refreshed from Google Patents.
Patent US4985745A successfully refreshed from Google Patents.
US4985745A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Substrate structure for composite semiconductor device
Assignee: Toshiba Corp
•
Filing: 1989-01-03
•
Granted: 1991-01-15
•
Expires: 2009-01-03
Abstract
Abstract The main surface of a first semiconductor substrate is bonded to the main surface of a second semiconductor substrate with an insulation film interposed therebetween to form a composite substrate. The first semiconductor substrate and insulation film are selectively etched to form an etched portion which reaches at least the second semiconductor substrate. An impurity layer with an impurity concentration different from that of the first semiconductor substrate is formed on or in the surface area exposed to the etched portion of the first and second semiconductor substrates. An epitaxial layer having an impurity concentration different from that of the impurity layer is formed in the etched portion. The first semiconductor substrate, impurity layer and epitaxial layer are planarized. The first semiconductor substrate, impurity layer and epitaxial layer are etched to make a pattern of the impurity layer on the surface of the composite substrate and the composite semiconductor substrate is aligned for formation of elements based on the pattern. The elements are formed in the composite substrate thus aligned.
Inventors
- 👤 Koichi Kitahara
- 👤 Yoshinori Natsume
- 👤 Yoshinori Hosoki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 10:21
CPC Classifications
H; H10; H10W; H10W10/00; H10W10/10; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W10/01; H10W10/011; H10W10/061; H10W10/181; H10P90/1914; H10W10/041; H10W10/40
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
133 words
A semiconductor substrate for a composite semiconductor device comprising: a composite substrate formed by bonding the main surface of a first semiconductor substrate and the main surface of a second semiconductor substrate together with an insulation film interposed therebetween; an etched portion formed by selectively etching said insulation film and said first semiconductor substrate of said composite substrate to reach at least said second semiconductor substrate; an epitaxial layer formed on said second semiconductor substrate to fill said etched portion, said epitaxial layer being electrically connected to said first and second semiconductor substrates; and an impurity layer formed between said first semiconductor substrate and epitaxial layer extending to the surface of said composite substrate, said impurity layer having an etching rate different from etching rates of said first semiconductor substrate and epitaxial layer.
Claim 2
Dependent Claim
133 words
A semiconductor substrate for a composite semiconductor device comprising: a composite substrate formed by bonding the main surface of a first semiconductor substrate and the main surface of a second semiconductor substrate together with an insulation film interposed therebetween; an etched portion formed by selectively etching said insulation film and said first semiconductor substrate of said composite substrate to reach at least said second semiconductor substrate; an epitaxial layer formed on said second semiconductor substrate to fill said etched portion, said epitaxial layer being electrically connected to said first and second semiconductor substrates; and an impurity layer formed between said first semiconductor substrate and epitaxial layer extending to the surface of said composite substrate, said impurity layer having an etching rate different from etching rates of said first semiconductor substrate and epitaxial layer.
Claim 3
Dependent Claim
41 words
A semiconductor substrate for a composite semiconductor device according to claim 1, wherein said impurity layer is formed of a surface area of said first semiconductor substrate, the area facing toward said epitaxial layer, and impurity being doped into said area.
Claim 4
Dependent Claim
54 words
A semiconductor substrate for a composite semiconductor device according to claim 2, wherein said first semiconductor substrate and said epitaxial layer are of a first conductivity type, said impurity layer is of a second conductivity type, and said first semiconductor substrate is electrically isolated from said epitaxial layer by means of said impurity layer.
Claim 5
Dependent Claim
39 words
A semiconductor substrate for a composite semiconductor device according to claim 1, wherein said impurity layer comprises areas of said first and second semiconductor substrates, said areas facing toward said epitaxial layer, and impurity being doped into said areas.
Claim 6
Dependent Claim
35 words
A semiconductor substrate for a composite semiconductor device according to claim 1, wherein said impurity layer comprises an area of said epitaxial layer, the area including impurity and facing said first and second semiconductor substrates.
Claim 7
Dependent Claim
68 words
A semiconductor substrate for a composite semiconductor device according to claim 1, wherein said composite semiconductor substrate has a pattern of said impurity layer which indicates a position of said epitaxial layer in said composite substrate and said pattern is formed on the surface of said composite substrate based on the difference in the etching rates of said first semiconductor substrate, said epitaxial layer and said impurity layer.
Claim 8
Dependent Claim
58 words
A semiconductor substrate for a composite semiconductor device according to claim 6, which further comprises a power element formed in said epitaxial layer and a semiconductor element formed in said first semiconductor substrate for controlling said power element, the power element and the semiconductor element being formed by using the impurity layer as a mark for mask alignment.
Claim 9
Dependent Claim
90 words
A composite semiconductor substrate according to claim 1, further comprising an emitter formed in said epitaxial layer, and a gate formed in said epitaxial layer being insulated from said epitaxial layer, wherein said first semiconductor substrate is of N-type, said second semiconductor substrate is of P-type, said epitaxial layer is of N-type, and said impurity layer is of N-type and has an impurity concentration higher than that of said first semiconductor substrate and said epitaxial layer, and wherein said second semiconductor substrate acts as a collector, thereby forming an IGBT.
References Cited (Backward Citations)
JPS5334483A
Cited
US4261003A
Cited
US4283235A
Cited
US4408386A
Cited
JPS57133637A
Cited
US4661832A
Cited
US4501060A
Cited
US4494303A
Cited
US4624047A
Cited
EP0147626A2
Cited
US4523370A
Cited
US4638552A
Cited
US4710794A
Cited
US4601779A
Cited
JPS6276645A
Cited
EP0217288A2
Cited
JPS62177938A
Cited
US4784970A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1994-01-14 | 1994-07-16 | 1995-01-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1998-01-14 | 1998-07-16 | 1999-01-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2002-01-14 | 2002-07-16 | 2003-01-15 | $7700.00 | Window Closed / Lapsed |