← Back to Patent Explorer
US4638552A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of manufacturing semiconductor substrate

Assignee: Toshiba Corp
•
Filing: 1985-02-14
•
Granted: 1987-01-27
•
Expires: 2005-02-14
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A method of manufacturing a semiconductor substrate having a modified layer therein comprises the steps of mirror-polishing one surface of each of first and second semiconductor plates, forming a modified layer on at least one of the polished surfaces of the first and second semiconductor plates, and bonding the polished surfaces of the first and second semiconductor plates with each other in a clean atmosphere.

Inventors

  • 👤 Masaru Shimbo
  • 👤 Kiyoshi Fukuda
  • 👤 Yoshiaki Ohwada

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 13:01
CPC Classifications
H; H10; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10P90/1914; H10P10/00; H10P10/12; H10P10/128; H10P52/00; H10W; H10W10/00; H10W10/10; H10W10/181; H10W15/00; H10W15/01; Y; Y10; Y10S; Y10S148/00; Y10S148/012; Y10S148/159

Claims Analysis

Total Claims: 17
Claim 1
Independent Claim 75 words
A method of manufacturing a semiconductor substrate having a modified layer therein, comprising the steps of: mirror-polishing one surface of each of first and second semiconductor plates; forming a modified layer on at least one of the polished surfaces of said first and second semiconductor plates; and bonding the polished surfaces of said first and second semiconductor plates with each other in a clean atmosphere without thermal fusing of said first and second semiconductor plates.
Claim 2
Independent Claim 75 words
A method of manufacturing a semiconductor substrate having a modified layer therein, comprising the steps of: mirror-polishing one surface of each of first and second semiconductor plates; forming a modified layer on at least one of the polished surfaces of said first and second semiconductor plates; and bonding the polished surfaces of said first and second semiconductor plates with each other in a clean atmosphere without thermal fusing of said first and second semiconductor plates.
Claim 3
Dependent Claim 16 words
A method according to claim 1, wherein the step of mirror-polishing is performed by optical polishing.
Claim 4
Dependent Claim 19 words
A method according to claim 1, wherein a roughness of the polished surface is not more than 500 Å.
Claim 5
Dependent Claim 33 words
A method according to claim 1, wherein the polished surface is washed before bonding with at least one member selected from the group consisting of water, an organic solvent and an acid solution.
Claim 6
Dependent Claim 18 words
A method according to claim 1, wherein said modified layer is an impurity layer formed by impurity diffusion.
Claim 7
Dependent Claim 18 words
A method according to claim 1, wherein said modified layer is an oxide layer formed by thermal oxidation.
Claim 8
Dependent Claim 29 words
A method according to claim 1, wherein the clean atmosphere is an atmosphere which contains a foreign substance in an amount of not more than 20 particles/m 3 .
Claim 9
Dependent Claim 31 words
A method according to claim 1, further comprising the step of heating a bonded structure of said first and second semiconductor plates to a temperature of not lower than 200° C.
Claim 10
Independent Claim 104 words
A method of manufacturing a semiconductor substrate having a modified layer therein, comprising the steps of: mirror-polishing one surface of each of first and second semiconductor plates; forming at least one groove in at least one of the polished surfaces of said first and second semiconductor plates, the groove opening to end faces of the semiconductor plate; bonding the polished surfaces of said first and second semiconductor plates in a clean atmosphere so as to obtain a bonded structure; and placing said bonded structure in an atmosphere containing a semiconductor modifying gas so as to form a modified layer in and around said groove.
Claim 11
Independent Claim 104 words
A method of manufacturing a semiconductor substrate having a modified layer therein, comprising the steps of: mirror-polishing one surface of each of first and second semiconductor plates; forming at least one groove in at least one of the polished surfaces of said first and second semiconductor plates, the groove opening to end faces of the semiconductor plate; bonding the polished surfaces of said first and second semiconductor plates in a clean atmosphere so as to obtain a bonded structure; and placing said bonded structure in an atmosphere containing a semiconductor modifying gas so as to form a modified layer in and around said groove.
Claim 12
Dependent Claim 16 words
A method according to claim 9, wherein the step of mirror-polishing is performed by optical polishing.
Claim 13
Dependent Claim 19 words
A method according to claim 9, wherein a roughness of the polished surface is not more than 500 Å.
Claim 14
Dependent Claim 35 words
A method according to claim 9, wherein the polished surface is washed before bonding with at least one member selected from the group consisting of water, a surfactant, an organic solvent and an acid solution.
Claim 15
Dependent Claim 23 words
A method according to claim 9, wherein the semiconductor modifying gas is an impurity gas, and said modified layer is an impurity layer.
Claim 16
Dependent Claim 22 words
A method according to claim 9, wherein the semiconductor modifying gas is oxygen gas, and said modified layer is an oxide layer.
Claim 17
Dependent Claim 29 words
A method according to claim 9, wherein the clean atmosphere is an atmosphere which contains a foreign substance in an amount of not more than 20 particles/m 3 .

References Cited (Backward Citations)

US3239908A Cited
US3332137A Cited
JPS42425Y1 Cited
US3355636A Cited
US4103273A Cited
US4169000A Cited
US4291293A Cited
US4317091A Cited
US4441115A Cited
US4426768A Cited
US4501060A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1990-01-26 1990-07-28 1991-01-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1994-01-26 1994-07-28 1995-01-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1998-01-26 1998-07-28 1999-01-27 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag