Semiconductor device and method of manufacturing same

Claim 2

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconducor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, the buried second layer consisting at least partly of silicon nitride, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer.

Claim 3

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconductor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, the first layer being monocrystalline where located above the substrate and polycrystalline where located over the buried second layer, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer.

Claim 4

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconductor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, the first layer being monocrystalline where located above the substrate and polycrystalline where located over the buried second layer, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer.

Claim 5

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconductor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer, and at least a part of the isolation zone comprising two inset insulating layers present one above the other and separated from each other by an insulating layer of silicon nitride.

Claim 6

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconductor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer, and at least a part of the isolation zone comprising two inset insulating layers present one above the other and separated from each other by an insulating layer of silicon nitride.

Claim 7

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconductor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, a doped channel-interrupting zone present below the buried second layer, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer.

Claim 8

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer consisting of silicon semiconductor material on a surface of said substrate, at least part of said first layer being monocrystalline, a second layer of insulating material located at only part of the said substrate surface and buried within the body, a doped channel-interrupting zone present below the buried second layer, and means forming an isolation zone for isolating part of the first semiconductor layer which is monocrystalline from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer consisting of silicon oxide formed by in situ conversion of the semiconductor material of the first semiconductor layer, the lateral extent of the second layer being different from the lateral extent of the third layer where it adjoins the second layer.

Claim 9

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer of semiconductor material on a surface of said substrate, a second layer of insulating material located at only part of the said substrate surface and buried within the body, and means forming an isolation zone for isolating part of the first semiconductor layer from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer being constituted of insulating material formed by in situ conversion of the semiconductor material of the first semiconductor layer, the second insulating layer comprising throughout an impurity which has a preference for absorption in the material of the inset third layer.

Claim 10

A semiconductor device comprising a body, said body comprising a monocrystalline substrate, at least a first layer of semiconductor material on a surface of said substrate, a second layer of insulating material located at only part of the said substrate surface and buried within the body, and means forming an isolation zone for isolating part of the first semiconductor layer from another part of the semiconductor layer, said isolation zone comprising at least partly a third layer of insulating material inset in the first semiconductor layer from its surface and extending down to and at least partly adjoining the second insulating layer, said third layer being constituted of insulating material formed by in situ conversion of the semiconductor material of the first semiconductor layer, the second insulating layer comprising throughout an impurity which has a preference for absorption in the material of the inset third layer.

Claim 11

A semiconductor device as claimed in claim 5 wherein the semiconductor layer consists of silicon, the inset third layer consists of silicon oxide, and the buried second layer comprises boron.

Claim 12

A semiconductor device as claimed in claim 2, wherein the second layer is inset in the substrate to a depth of more than 0.5μ.

Claim 13

A semiconductor device as claimed in claim 2, wherein in the substrate beside the buried second layer is a highly doped semiconductor zone, and a semiconductor circuit element is built into the part of the first layer over the said semiconductor zone.

Claim 14

A semiconductor device as claimed in claim 2, wherein the inset third layer entirely overlaps the buried second layer at least locally.

Claim 15

A semiconductor device as claimed in claim 2, wherein the polycrystalline part of the first layer is doped with an impurity throughout its thickness and has a low resistivity.

Claim 16

A semiconductor device as claimed in claim 10, wherein the polycrystalline part adjoins laterally a monocrystalline part of the semiconductor layer and constitutes a vertical conductor for a deep zone in the adjoining monocrystalline part.

Claim 17

A semiconductor device as claimed in claim 2, wherein the inset isolation layer comprises strip-shaped parts which do not adjoin the buried second layer on their lower side and which are separated laterally from a part which does adjoin the buried second layer.

Claim 18

A semiconductor device as claimed in claim 12, wherein the said strip-shaped parts of the isolation zone which do not adjoin the buried second layer divides the region of the first layer in which it is inset into two parts, one region part comprising a p-n junction between two zones of opposite conductivity types present one above the other of which the lowermost zone is connected to the surface of the body along a path underneath the inset insulation layer and via an ohmic connection in the other region part of semiconductor material and is conductively connected to a contact at the surface.

Claim 19

A semiconductor device as claimed in claim 13, wherein the p-n junction is substantially flat and is bounded on all sides by the inset third layer.

Claim 20

A semiconductor device as claimed in claim 13, wherein the lowermost zone is the collector zone of a transistor and the p-n junction is the base-collector junction, or the lowermost zone is the base zone of a transistor and the p-n junction is the emitter-base junction.

Claim 21

A semiconductor device as claimed in claim 2 wherein the body comprises at least one transistor in which the collector zone is at the surface and the emitter zone is buried in the body, the isolation zone comprises insulating material which laterally bounds the base zone, and the buried emitter zone is connected to a contact provided on the semiconductor surface along a path underneath said isolation zone and via an upwardly conducting path through the semiconductor on the other side of the isolation zone.

Claim 22

A semiconductor device as claimed in claim 16, wherein at least two transistors are present with a common buried emitter zone, and in which the transistor base and collector zones are separated by isolation zones of insulating material.

Claim 23

A semiconductor device as claimed in claim 16, wherein the emitter-base junction is substantially flat and is bounded along its circumference by insulating material.

Claim 24

A semiconductor device as claimed in claim 16, wherein the collector zone is separated laterally at least over a part of its thickness from an upwardly conducted base contacting zone by an isolation zone which comprises at least one inset insulation layer.

Claim 25

A semiconductor device as claimed in claim 2 and further comprising an interconnecting zone of an electrically conducting material and having an intermediate section buried in an isolation zone and bounded on all sides by insulating material.

Claim 26

A semiconductor device as claimed in claim 20 wherein the buried zone of electrically conducting material has the form of a strip which extends in the longitudinal direction of the isolation zone.

Claim 27

A semiconductor device as claimed in claim 21 wherein the body comprises plural circuit elements interconnected by the buried zone.

Claim 28

A semiconductor device as claimed in claim 21 wherein the buried zone consists of a high-ohmic material constructed as a resistor.

Claim 29

A semiconductor device as claimed in claim 20, wherein the buried zone of an electrically conducting material extends transversely through the isolation zone and connects two semiconductor zones present on either side of the isolation zone.

Claim 30

A semiconductor device as claimed in claim 20 wherein the buried conductive zone consists at least partly of metal.

Claim 31

A semiconductor device as claimed in claim 25 wherein the buried conductive zone forms an ohmic connection between two semiconductor zones of opposite conductivity types.

Claim 32

A semiconductor device as claimed in claim 26 wherein the buried conductive zone interconnects the collectors of an n-p-n and a p-n-p transistor.

Claim 33

A semiconductor device as claimed in claim 20 wherein the conductive zone buried in the isolation zone consists of polycrystalline semiconductor material.

Claim 34

A semiconductor device as claimed in claim 1, wherein active zones of a semiconductor circuit element are provided in the monocrystalline part of the first layer.

Claim 35

A semiconductor device as claimed in claim 2, wherein active zones of a semiconductor circuit element are provided in the monocrystalline part of the first layer.

Claim 36

A semiconductor device as claimed in claim 3, wherein active zones of a semiconductor circuit element are provided in the monocrystalline part of the first layer.

Claim 37

A semiconductor device as claimed in claim 4, wherein active zones of a semiconductor circuit element are provided in the monocrystalline part of the first layer.