US6140236A
Expired / Lapsed
US
⏱️ 0.0 years remaining
High throughput A1-Cu thin film sputtering process on small contact via for manufacturable beol wiring
Assignee: Infineon Technologies AG
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Filing: 1998-04-21
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Granted: 2000-10-31
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Expires: 2018-04-21
Abstract
Abstract A metal interconnect layer that fills in a via hole formed by first depositing a first Al--Cu film on the sidewalls of the via hole at a low temperature and a low sputtering power and then depositing a second Al--Cu film on the first Al--Cu film at a high temperature and high sputtering power. Sputtering is performed in two steps at low and high temperatures within the same sputtering chamber. The deposition at low temperature and low sputtering power provides good coverage in the via hole, and the deposition at high temperature and high sputtering power reduces the process time.
Inventors
- 👤 Darryl Restaino
- 👤 Chi-Hua Yang
- 👤 Hans W. Poetzlberger
- 👤 Tomio Katata
- 👤 Hideaki Aochi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:05
CPC Classifications
C; C23; C23C; C23C14/00; C23C14/06; C23C14/14; C23C14/16; C23C14/165; H; H10; H10P; H10P14/00; H10P14/40; H10P14/42; H10P14/44; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/033; H10W20/036; H10W20/056
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
172 words
A semiconductor device manufacturing method comprising: a first step of forming an insulating film over a surface of a semiconductor substrate; a second step of forming an opening in the insulating film; a third step of forming a first layer of metal by using a material containing at least one of aluminum and copper as a main component, on the insulating film and in the opening at a first deposition rate, at a first temperature, and at a first sputtering power, with the semiconductor substrate placed in a single chamber of a sputtering equipment; and a fourth step of forming a second layer of metal by using the material containing at least one of aluminum and copper as a main component, on the first layer of metal directly after said third step, at a second deposition rate greater than the first deposition rate, at a second temperature greater than the first temperature, and at a second sputtering power greater than the first sputtering power, in the single chamber of the sputtering equipment.
Claim 2
Dependent Claim
172 words
A semiconductor device manufacturing method comprising: a first step of forming an insulating film over a surface of a semiconductor substrate; a second step of forming an opening in the insulating film; a third step of forming a first layer of metal by using a material containing at least one of aluminum and copper as a main component, on the insulating film and in the opening at a first deposition rate, at a first temperature, and at a first sputtering power, with the semiconductor substrate placed in a single chamber of a sputtering equipment; and a fourth step of forming a second layer of metal by using the material containing at least one of aluminum and copper as a main component, on the first layer of metal directly after said third step, at a second deposition rate greater than the first deposition rate, at a second temperature greater than the first temperature, and at a second sputtering power greater than the first sputtering power, in the single chamber of the sputtering equipment.
Claim 3
Dependent Claim
22 words
The method according to claim 1, in which the second sputtering power is approximately four times greater than the first sputtering power.
Claim 4
Dependent Claim
38 words
The method according to claim 1, in which a difference between the first temperature and the second temperature is produced by changing the conductivity of heat generated by a heater provided in the chamber of the sputtering equipment.
Claim 5
Dependent Claim
44 words
The method according to claim 3, in which the conductivity of heat generated by the heater is changed by turning a backside Ar gas in the sputtering equipment off during the third step and turning the backside Ar gas on during the fourth step.
Claim 6
Dependent Claim
42 words
The method according to claim 3, in which the conductivity of heat generated by the heater is changed by turning an electrostatic chuck of the sputtering equipment off during the third step and turning the electrostatic chuck on during the fourth step.
Claim 7
Dependent Claim
29 words
The method according to claim 1, in which the first temperature is lower than 150° C., and the second temperature is in a range from 300 to 400° C.
Claim 8
Dependent Claim
46 words
The method according to claim 1, further comprising a fifth step of forming a first barrier metal layer between the second and third steps and a sixth step of forming a second barrier metal layer on the second layer of metal subsequent to the fourth step.
Claim 9
Dependent Claim
56 words
The method according to claim 7, further comprising a seventh step of forming an interconnect layer above the semiconductor substrate prior to the first step, and in which the insulating film is formed on the interconnect layer, and the opening is formed in that portion of the insulating film which is located above the interconnect layer.
Claim 10
Dependent Claim
73 words
The method according to claim 8, in which the seventh step comprises a step of forming a third barrier metal layer on the semiconductor substrate, a step of forming a third metal layer on the third barrier metal layer, a step of forming a fourth barrier metal layer on the third metal layer, and a step of patterning the third barrier metal layer, the third metal layer, and the fourth barrier metal layer.
Claim 11
Dependent Claim
32 words
The method according to claim 9, further comprising a step of forming a fifth barrier metal layer in the opening between the fourth barrier metal layer and the first barrier metal layer.
Claim 12
Dependent Claim
21 words
The method according to claim 10, in which each of the first through fifth barrier metal layers contains a refractory metal.
Claim 13
Dependent Claim
20 words
The method according to claim 9, in which each of the first through fourth barrier metal layers contains titanium nitride.
Claim 14
Dependent Claim
25 words
The method according to claim 9, in which each of the first through fourth barrier metal layers contains stacked layers of titanium and titanium nitride.
Claim 15
Dependent Claim
15 words
The method according to claim 10, in which the fifth barrier metal layer contains titanium.
Claim 16
Dependent Claim
168 words
A semiconductor device manufacturing method comprising: a first step of forming an insulating film over a surface of a semiconductor substrate; a second step of forming an opening in the insulating film; a third step of forming a first layer of metal by using a material containing at least one of aluminum and copper as a main component, on the insulating film and in the opening at a first deposition rate, at a first temperature, and at a first sputtering power, with the semiconductor substrate placed in a single chamber of a sputtering equipment; and a fourth step of forming a second layer of metal by using the material containing at least one of aluminum and copper as a main component, contiguous with the first layer of metal, at a second deposition rate greater than the first deposition rate, at a second temperature greater than the first temperature, and at a second sputtering power greater than the first sputtering power, in the single chamber of the sputtering equipment.
Claim 17
Dependent Claim
168 words
A semiconductor device manufacturing method comprising: a first step of forming an insulating film over a surface of a semiconductor substrate; a second step of forming an opening in the insulating film; a third step of forming a first layer of metal by using a material containing at least one of aluminum and copper as a main component, on the insulating film and in the opening at a first deposition rate, at a first temperature, and at a first sputtering power, with the semiconductor substrate placed in a single chamber of a sputtering equipment; and a fourth step of forming a second layer of metal by using the material containing at least one of aluminum and copper as a main component, contiguous with the first layer of metal, at a second deposition rate greater than the first deposition rate, at a second temperature greater than the first temperature, and at a second sputtering power greater than the first sputtering power, in the single chamber of the sputtering equipment.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-10-31 | 2004-05-01 | 2004-10-31 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-10-31 | 2008-05-01 | 2008-10-31 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-10-31 | 2012-05-01 | 2012-10-31 | $7700.00 | Window Closed / Lapsed |