US5985751A
Expired / Lapsed
US
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Process for fabricating interconnection of semiconductor device
Assignee: Sony Corp
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Filing: 1995-12-07
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Granted: 1999-11-16
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Expires: 2015-12-07
Abstract
Abstract A process for fabricating interconnection of a semiconductor device is provided which allows the physical vapor deposition and reflow treatment to be performed in different apparatuses and requires no surface treatment prior to the reflow treatment. The process comprises the steps of forming a metallic interconnection material layer on a substrate by means of physical vapor deposition using a metallic interconnection material; forming an oxidation preventive film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a complete solid solution of the components constituting the oxidation preventive film with those of the metallic interconnection material layer; and patterning the metallic interconnection material layer to form an interconnection.
Inventors
- 👤 Kazuhide Koyama
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 02:16
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/047; H10W20/048; H10W20/033; H10W20/036; H10W20/056; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6314
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
103 words
A process of fabricating interconnection of a semiconductor device comprising the steps of: forming a metallic interconnection material layer on a substrate using a metallic interconnection material; forming an oxidation preventative film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a solution of the components of the oxidation preventive film with those of the metallic interconnection material layer; and exposing the semiconductor device to air between the step of forming the oxidation protective film on the metallic interconnection material layer and the step of subjecting the metallic interconnection material layer to said reflow treatment.
Claim 2
Dependent Claim
103 words
A process of fabricating interconnection of a semiconductor device comprising the steps of: forming a metallic interconnection material layer on a substrate using a metallic interconnection material; forming an oxidation preventative film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a solution of the components of the oxidation preventive film with those of the metallic interconnection material layer; and exposing the semiconductor device to air between the step of forming the oxidation protective film on the metallic interconnection material layer and the step of subjecting the metallic interconnection material layer to said reflow treatment.
Claim 3
Dependent Claim
126 words
A process for fabricating an interconnection layer on a semiconductor device comprising a metallic interconnection material, said process comprising the steps of: forming an insulating layer on a substrate, said substrate having a conductive layer provided thereon, and forming an aperture portion in the insulating layer provided on the conductive layer; forming a metallic interconnection material layer on the insulating layer; forming an oxidation preventive film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a solution of the components constituting the oxidation preventive film with those of the metallic interconnection material layer and filling the aperture portion with the metallic interconnection material to form a connection hole; and patterning the complete solid solution to form an interconnection.
Claim 4
Dependent Claim
126 words
A process for fabricating an interconnection layer on a semiconductor device comprising a metallic interconnection material, said process comprising the steps of: forming an insulating layer on a substrate, said substrate having a conductive layer provided thereon, and forming an aperture portion in the insulating layer provided on the conductive layer; forming a metallic interconnection material layer on the insulating layer; forming an oxidation preventive film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a solution of the components constituting the oxidation preventive film with those of the metallic interconnection material layer and filling the aperture portion with the metallic interconnection material to form a connection hole; and patterning the complete solid solution to form an interconnection.
Claim 5
Dependent Claim
66 words
A process for fabricating interconnection of a semiconductor device as claimed in claim 2, wherein the step of forming the metallic interconnection material layer on the insulating layer is by means of physical vapor deposition and is carried out so that the aperture portion retains a void at a bottom portion thereof and is plugged by the metallic interconnection material layer at an upper portion thereof.
Claim 6
Dependent Claim
129 words
A process for fabricating interconnection of a semiconductor device which process provides an interconnection comprising a metallic interconnection material layer and a connection hole filled with metallic interconnection material constituting the metallic interconnection material layer, comprising the steps of: forming an insulating layer on a substrate having a conductive layer provided thereon, and forming a groove in the insulating layer provided on the conductive layer; forming a metallic interconnection material layer on the insulating layer; forming an oxidation preventive film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a solid solution of the components constituting the oxidation preventive film with those of the metallic interconnection material layer, and filling the groove with the metallic interconnection material to form a connection.
Claim 7
Dependent Claim
129 words
A process for fabricating interconnection of a semiconductor device which process provides an interconnection comprising a metallic interconnection material layer and a connection hole filled with metallic interconnection material constituting the metallic interconnection material layer, comprising the steps of: forming an insulating layer on a substrate having a conductive layer provided thereon, and forming a groove in the insulating layer provided on the conductive layer; forming a metallic interconnection material layer on the insulating layer; forming an oxidation preventive film on the metallic interconnection material layer; subjecting the metallic interconnection material layer to reflow treatment to form a solid solution of the components constituting the oxidation preventive film with those of the metallic interconnection material layer, and filling the groove with the metallic interconnection material to form a connection.
Claim 8
Dependent Claim
58 words
A process for fabricating an interconnection of a semiconductor device as claimed in claim 2 or claim 4, further comprising the step of: exposing the semiconductor device to air between the step of forming said oxidation protective film on the metallic interconnection material layer and the step of subjecting said metallic interconnection material layer to said reflow treatment.
Claim 9
Dependent Claim
65 words
A process for fabricating an interconnection of a semiconductor device as claimed in claim 1, claim 2 or claim 4, wherein the oxidation preventive film is made of a material which is resistant to forming a tough oxide film at room temperature, and is provided with a film thickness sufficient to form said solid solution by the reflow treatment with said metallic interconnection material layer.
Claim 10
Dependent Claim
39 words
A process for fabricating an interconnection of a semiconductor device as claimed in claim 1, claim 2 or claim 4, wherein the oxidation preventive film comprises a material selected from the group consisting of silver, copper, silicon, and germanium.
Claim 11
Dependent Claim
47 words
A process for fabricating interconnection of a semiconductor device as claimed in claim 1, claim 2 or claim 4, wherein the metallic interconnection material comprises aluminum, copper, or an Al alloy including Al--Cu alloy, an Al--Si alloy, an Al--Si--Cu alloy, an Al--Ge alloy, and an Al--Si--Ge alloy.
Claim 12
Dependent Claim
38 words
A process for fabricating interconnection of a semiconductor device as claimed in claim 1, claim 2 or claim 4, wherein said oxidation preventive film has a thickness about 0.5% of a thickness of said metallic interconnection material layer.
References Cited (Backward Citations)
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| 3.5 Years (Year 4) | 2002-11-15 | 2003-05-17 | 2003-11-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-11-15 | 2007-05-17 | 2007-11-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-11-15 | 2011-05-17 | 2011-11-16 | $7700.00 | Window Closed / Lapsed |