Patent US6027995A successfully refreshed from Google Patents.
US6027995A
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Method for fabricating an interconnect structure with hard mask and low dielectric constant materials
Assignee: Intel Corp
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Filing: 1998-08-18
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Granted: 2000-02-22
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Expires: 2018-08-18
Abstract
Abstract An interconnect system is provided. The interconnect system includes a silicon substrate and a first dielectric layer formed upon the silicon substrate. The interconnect system also includes a first level of at least two electrically conductive lines formed upon the first dielectric layer. The interconnect system further includes a region of low dielectric constant material formed between the at least two electrically conductive lines. The interconnect system also includes a first hard mask formed upon the polymer region.
Inventors
- 👤 Chien Chiang
- 👤 Chuanbin Pan
- 👤 Vicky M. Ochoa
- 👤 Sychyi Fang
- 👤 David B. Fraser
- 👤 Joyce C. Sum
- 👤 Gary William Ray
- 👤 Jeremy A. Theil
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 16:55
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/45; H10W20/48; H10W20/01; H10W20/031; H10W20/056; H10W20/062; H10W20/071; H10W20/081; H10W20/495
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
123 words
A method for fabricating an interconnect system, the method comprising: a. providing a silicon substrate; b. forming a first dielectric layer upon the silicon substrate; c. forming a first level of at least two electrically conductive lines upon the first dielectric layer; d. forming a first region of low dielectric constant material upon and between the at least two first level electrically conductive lines, the dielectric constant of the material forming the first region of low dielectric constant material having a range of 1.5 to 3.5; and e. forming a hard mask upon the first region, wherein a thickness of the first region material measured between the first dielectric layer and the hard mask is in the range of 8,000 to 14,000 Angstroms.
Claim 2
Independent Claim
123 words
A method for fabricating an interconnect system, the method comprising: a. providing a silicon substrate; b. forming a first dielectric layer upon the silicon substrate; c. forming a first level of at least two electrically conductive lines upon the first dielectric layer; d. forming a first region of low dielectric constant material upon and between the at least two first level electrically conductive lines, the dielectric constant of the material forming the first region of low dielectric constant material having a range of 1.5 to 3.5; and e. forming a hard mask upon the first region, wherein a thickness of the first region material measured between the first dielectric layer and the hard mask is in the range of 8,000 to 14,000 Angstroms.
Claim 3
Dependent Claim
45 words
The method of claim 1, wherein the material with a low dielectric constant is an organic polymer, the hard mask having a higher dielectric constant than the dielectric constant of the organic polymer, the method further comprising: forming a patterning layer upon the hard mask.
Claim 4
Dependent Claim
88 words
The method of claim 2, the hard mask having a dielectric constant of approximately 4 and the organic polymer having a dielectric constant of approximately 2.5 and is stable within the temperature range of 400 degrees Celsius to 450 degrees Celsius, the method further comprising: etching the hard mask according to the patterning layer and forming at least one via hole through the hard mask and through the first region to only a top surface of at least one electrically conductive line formed upon the first dielectric layer.
Claim 5
Dependent Claim
32 words
The method of claim 3, the first dielectric layer having a dielectric constant that is substantially equal to four, the method further comprising: etching the hard mask according to the patterning layer.
Claim 6
Dependent Claim
92 words
The method of claim 4, the first dielectric layer having a thickness of approximately 6,000 angstroms, the hard mask having a thickness within the range of 1000 angstroms to 5000 angstroms, each electrically conductive line having a thickness in the range of 4000 Angstroms to 10,000 Angstroms, the method further comprising: etching the first region according to a pattern defined by the etched hard mask to an average thickness of approximately 6000 angstroms as measured from a top surface of the metal lines to a corresponding bottom surface of the hard mask.
Claim 7
Dependent Claim
40 words
The method of claim 5, the first dielectric layer being made of at least one of undoped silicon dioxide and doped silicon dioxide, the method further comprising: forming a via plug within the first region and the etched hard mask.
Claim 8
Dependent Claim
104 words
The method of claim 6, wherein the dopants include at least one of phosphorus, boron and phosphorus, silicon nitride, and silicon oxi-nitride, wherein each electrically conductive line includes at least one of aluminum and an alloy of aluminum, wherein the polymer is an organic polymer from the following group: polyarylether, polyimide, and polynaphthaline, wherein the hard mask is made of at least one of SiO 2 and a dual layer including SiO 2 and Si 3 N 4 , and wherein forming at least one via hole includes depositing a blanket layer of electrically conductive material and performing a chemical mechanical polishing process thereto.
Claim 9
Dependent Claim
76 words
The method of claim 7 further comprising: forming a second level of one electrically conductive line upon each via plug; forming a second region of low dielectric constant material upon and between a pair of second level electrically conductive line; forming a second hard mask upon the second region; and forming a second level of one via plug between each electrically conductive line of the second level and a top surface of the second hard mask.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-02-21 | 2003-08-23 | 2004-02-22 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-02-21 | 2007-08-23 | 2008-02-22 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-02-21 | 2011-08-23 | 2012-02-22 | $7700.00 | Window Closed / Lapsed |