US5438006A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of fabricating gate stack having a reduced height
Assignee: Agere Systems LLC
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Filing: 1994-01-03
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Granted: 1995-08-01
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Expires: 2014-01-03
Abstract
Abstract An integrated circuit device having reduced-height gate stack is fabricated by using a patterned oxide hard mask to pattern the underlying metal layer. The oxide mask is removed and the patterned metal is subsequently used as a mask to etch the polysilicon layer.
Inventors
- 👤 Chorng-Ping Chang
- 👤 Kuo-Hua Lee
- 👤 Chun-Ting Liu
- 👤 Ruichen Liu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 05:40
CPC Classifications
H; H10; H10D; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D84/0172; H10D64/00; H10D64/01; H10D64/013; H10D64/01302; H10D64/01304; H10D64/01326; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/853; Y; Y10; Y10S; Y10S148/00; Y10S148/105
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
108 words
A process of fabricating a gate stack in an integrated circuit including the steps of: a) forming a polysilicon layer on a substrate, b) forming a refractory metal layer over said polysilicon layer, c) forming an oxide layer over said metal layer, d) forming a photo-resist layer over said oxide layer, e) patterning said photoresist layer and said underlying oxide layer, f) removing said patterned photoresist, g) using said remaining patterned oxide layer as a hard mask, etching away the exposed portion of said metal layer, h) removing said oxide hard mask, and i) using said patterned metal layer as a mask, etching away the exposed polysilicon layer.
Claim 2
Dependent Claim
108 words
A process of fabricating a gate stack in an integrated circuit including the steps of: a) forming a polysilicon layer on a substrate, b) forming a refractory metal layer over said polysilicon layer, c) forming an oxide layer over said metal layer, d) forming a photo-resist layer over said oxide layer, e) patterning said photoresist layer and said underlying oxide layer, f) removing said patterned photoresist, g) using said remaining patterned oxide layer as a hard mask, etching away the exposed portion of said metal layer, h) removing said oxide hard mask, and i) using said patterned metal layer as a mask, etching away the exposed polysilicon layer.
Claim 3
Dependent Claim
28 words
The process of claim 1, in which said step of etching the exposed portion of said metal layer also includes the partial etching of the exposed polysilicon layer.
Claim 4
Dependent Claim
30 words
The process of claim 1, in which said remaining polysilicon layer acts as an etching mask for the field oxide layer during said step of etching said exposed metal layer.
Claim 5
Dependent Claim
22 words
The process of claim 3, wherein said metal layer comprises a metal selected from the group including tungsten silicide and titanium nitride.
Claim 6
Dependent Claim
23 words
The process of claim 3, wherein said patterned metal mask and said patterned polysilicon layer underlying said metal form a reduced-height gate stack.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1998-07-31 | 1999-01-30 | 1999-08-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2002-07-31 | 2003-01-30 | 2003-08-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2006-07-31 | 2007-01-30 | 2007-08-01 | $7700.00 | Window Closed / Lapsed |