US5849623A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of forming thin film resistors on organic surfaces
Assignee: General Electric Co
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Filing: 1997-05-23
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Granted: 1998-12-15
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Expires: 2017-05-23
Abstract
Abstract A method for fabricating a thin film resistor comprises applying a tantalum nitride layer over a dielectric layer, applying a metallization layer over the tantalum nitride layer, and patterning the metallization layer with a first portion of the metallization layer situated apart from a second portion of the metallization layer and both the first and second portions being at least partially situated on the tantalum nitride layer. In one embodiment, after patterning the metallization layer, the resistance value between the first and second portions of the metallization layer is determined and compared to a predetermined resistance value, and at least one of the first and second portions is trimmed to obtain a modified resistance value between the first and second portions that is closer to the predetermined resistance value than the determined resistance value.
Inventors
- 👤 Robert John Wojnarowski
- 👤 James Wilson Rose
- 👤 Kyung Wook Paik
- 👤 Michael Gdula
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 05:59
CPC Classifications
H; H05; H05K; H05K1/00; H05K1/16; H05K1/167; H01; H01C; H01C1/00; H01C1/02; H01C1/032; H01C17/00; H01C17/06; H01C17/075; H01C7/00; H01C7/006; H05K1/02; H05K1/0266; H05K1/0268; H05K2201/00; H05K2201/03; H05K2201/0302; H05K2201/0317; H05K2203/00; H05K2203/03; H05K2203/0361; H05K2203/17; H05K2203/171; H05K3/00; H05K3/38; H05K3/388; H10; H10W; H10W70/00; H10W70/099; H10W70/60; H10W70/611; H10W70/614; H10W74/00; H10W74/10; H10W74/15; Y; Y10; Y10S; Y10S148/00; Y10S148/136; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49082; Y10T29/49101
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
130 words
A method for fabricating a thin film resistor, comprising the steps of: applying a tantalum nitride layer over an organic dielectric layer; applying a metallization layer over the tantalum nitride layer; patterning the metallization layer with a first portion of the metallization layer situated apart from a second portion of the metallization layer and both the first and second portions being at least partially situated on the tantalum nitride layer; determining a resistance value between the first and second portions of the metallization layer; comparing the determined resistance value with a predetermined resistance value; and etching at least one of the first and second portions to obtain a modified resistance value between the first and second portions that is closer to the predetermined resistance value than the determined resistance value.
Claim 2
Independent Claim
130 words
A method for fabricating a thin film resistor, comprising the steps of: applying a tantalum nitride layer over an organic dielectric layer; applying a metallization layer over the tantalum nitride layer; patterning the metallization layer with a first portion of the metallization layer situated apart from a second portion of the metallization layer and both the first and second portions being at least partially situated on the tantalum nitride layer; determining a resistance value between the first and second portions of the metallization layer; comparing the determined resistance value with a predetermined resistance value; and etching at least one of the first and second portions to obtain a modified resistance value between the first and second portions that is closer to the predetermined resistance value than the determined resistance value.
Claim 3
Dependent Claim
21 words
The method of claim 1, further including the step of patterning the tantalum nitride layer prior to applying the metallization layer.
Claim 4
Dependent Claim
28 words
The method of claim 1, further including, after patterning the metallization layer, stabilizing the resistance of the tantalum nitride layer by heating the tantalum nitride and metallization layer.
Claim 5
Dependent Claim
61 words
The method of claim 1, wherein applying the tantalum nitride layer over the dielectric layer comprises the steps of positioning the dielectric layer in a tantalum sputtering chamber under low pressure conditions and using a gas mixture ranging from 13%-17% N2 gas and from 83%-87% argon gas to sputter tantalum nitride in the hexagonal close packed phase on the dielectric layer.
Claim 6
Dependent Claim
85 words
The method of claim 1, further including: applying an additional dielectric layer over the metallization layer; applying an additional tantalum nitride layer over the additional dielectric layer; applying an additional metallization layer over the additional tantalum nitride layer and patterning the additional metallization layer with a first additional portion of the additional metallization layer situated apart from a second additional portion of the additional metallization layer and both the first and second additional portions being at least partially situated on the additional tantalum nitride layer.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2001-12-14 | 2002-06-15 | 2002-12-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2005-12-14 | 2006-06-15 | 2006-12-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2009-12-14 | 2010-06-15 | 2010-12-15 | $7700.00 | Window Closed / Lapsed |