Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
170 words
A method of forming a porous insulator within a microelectronic device comprising: (a) providing a solid substrate possessing a layer of patterned conductors, or onto which said patterns will subsequently be placed; (b) providing a solution comprising particles and solvent, wherein said particles consist of a ceramic core surrounded by a coating of substantially different material; (c) depositing a film of said solution onto said substrate such that the gap between any said conductors is filled substantially with said solution; (d) drying said film such that said particles form a continuous layer over said substrate; and (e) treating the layer such that said particle coatings form crosslinks between adjacent particles and between said particles and said substrate to form a substantially bonded porous dielectric having a dielectric constant less than 3.0, whereby the capacitive coupling and propagation delay of said conductors is substantially reduced compared to solid silicon dioxide, and wherein the sum of the packing density of said particles and the porosity of said layer is equal to one.
Claim 2
Independent Claim
170 words
A method of forming a porous insulator within a microelectronic device comprising: (a) providing a solid substrate possessing a layer of patterned conductors, or onto which said patterns will subsequently be placed; (b) providing a solution comprising particles and solvent, wherein said particles consist of a ceramic core surrounded by a coating of substantially different material; (c) depositing a film of said solution onto said substrate such that the gap between any said conductors is filled substantially with said solution; (d) drying said film such that said particles form a continuous layer over said substrate; and (e) treating the layer such that said particle coatings form crosslinks between adjacent particles and between said particles and said substrate to form a substantially bonded porous dielectric having a dielectric constant less than 3.0, whereby the capacitive coupling and propagation delay of said conductors is substantially reduced compared to solid silicon dioxide, and wherein the sum of the packing density of said particles and the porosity of said layer is equal to one.
Claim 3
Dependent Claim
16 words
The method of claim 1, wherein the ceramic core of said particles consists of silicon dioxide.
Claim 4
Dependent Claim
23 words
The method of claim 1, wherein the ceramic cores of said particles have diameters in the approximate range of 2 to 100 nm.
Claim 5
Dependent Claim
11 words
The method of claim 1, wherein said particle coatings are organic.
Claim 6
Dependent Claim
21 words
The method of claim 1, wherein said particle coatings have a thickness in the approximate range of 0.5 to 2 nm.
Claim 7
Dependent Claim
34 words
The method of claim 1, wherein said particle coatings possess a high thermal tolerance, whereby allowing said layers to substantially withstand fabrication temperatures in the approximate range of 300°-500° C. encountered in microelectronics production.
Claim 8
Dependent Claim
14 words
The method of claim 1, wherein said particle coatings possess a resistance to moisture.
Claim 9
Dependent Claim
18 words
The method of claim 1, wherein said particle coatings prevent degradation, coagulation, flocculation, or gelation of said particles.
Claim 10
Dependent Claim
49 words
The method of claim 1, wherein said crosslinking treatment is accomplished by: (a) methods selected from the group consisting of thermal treatment, electron bombardment, and treatment with electromagnetic radiation, or a combination thereof, and (b) mixing an additive with said solution for increasing the crosslinking efficiency of said treatment.
Claim 11
Dependent Claim
40 words
The method of claim 1, wherein said substrate is treated with a chemical agent that renders the surface of the substrate hydrophobic prior to deposition of said solution, whereby the adhesion of said particles to said substrate is substantially enhanced.
Claim 12
Independent Claim
206 words
A method of forming a porous insulator with in a microelectronic device comprising: (a) providing a solid substrate possessing a layer of patterned conductors, or onto which said patterns will subsequently be placed; (b) providing a first and second solutions of particles and solvent, wherein said particles consist of a ceramic core surrounded by a thin coating of a substantially different material; (c) depositing a first film of said first solution onto said substrate such that gaps between any of said conductors a filled substantially with said solution; (d) drying said film such that said particles form a continuous layer over said substrate; (e) deposing a second film of said second solution onto said substrate; (f) drying said second film such that said particles form a continuous layer over said substrate; and (g) treating the layers such that said particle coatings form crosslinks between adjacent particles and between said particles and said substrate to form a substantially bonded porous dielectric having a dielectric constant less than 3.0, whereby the capacitive coupling and propagation delay of said conductors is substantially reduced compared to solid silicon dioxide, and wherein the sum of the packing density of said particles and the porosity of said layer is equal to one.
Claim 13
Independent Claim
206 words
A method of forming a porous insulator with in a microelectronic device comprising: (a) providing a solid substrate possessing a layer of patterned conductors, or onto which said patterns will subsequently be placed; (b) providing a first and second solutions of particles and solvent, wherein said particles consist of a ceramic core surrounded by a thin coating of a substantially different material; (c) depositing a first film of said first solution onto said substrate such that gaps between any of said conductors a filled substantially with said solution; (d) drying said film such that said particles form a continuous layer over said substrate; (e) deposing a second film of said second solution onto said substrate; (f) drying said second film such that said particles form a continuous layer over said substrate; and (g) treating the layers such that said particle coatings form crosslinks between adjacent particles and between said particles and said substrate to form a substantially bonded porous dielectric having a dielectric constant less than 3.0, whereby the capacitive coupling and propagation delay of said conductors is substantially reduced compared to solid silicon dioxide, and wherein the sum of the packing density of said particles and the porosity of said layer is equal to one.
Claim 14
Dependent Claim
45 words
The method of claim 11, wherein said drying of said first film produces a layer with a porosity in the approximate range of 40-80% and drying of said second film produces a layer with a porosity substantially lower than that produced by said first film.
Claim 15
Dependent Claim
42 words
The method of claim 11, wherein said second solution contains particles that are substantially smaller than the particles of said first solution, whereby these particles substantially fill the porosity of said first film, and substantially protect said layer from penetration by liquids.
Claim 16
Dependent Claim
28 words
The method of claim 11, wherein said second solution contains particles which form a substantially dense top layer, and substantially protect said first layer from penetration by liquids.