US5504042A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Porous dielectric material with improved pore surface properties for electronics applications
Assignee: Texas Instruments Inc
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Filing: 1994-06-23
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Granted: 1996-04-02
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Expires: 2014-06-23
Abstract
Abstract This invention provides an improved porous structure for semiconductor devices and a process for making the same. This process may be applied to an existing porous structure 28, which may be deposited, for example, between patterned conductors 24. The process may include baking the structure in a reducing atmosphere, preferably a forming gas, to dehydroxylate the pore surfaces. The process may include baking the structure in a halogen-containing atmosphere to bond halogens to the pore surfaces. It has been found that a porous structure treated in such a manner generally exhibits improved dielectric properties relative to an untreated sample.
Inventors
- 👤 Chi-Chen Cho
- 👤 Bruce E. Gnade
- 👤 Douglas M. Smith
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 14:48
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/45; H10W20/48; H10W20/01; H10W20/071; H10W20/072; H10W20/46; H10W20/495
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
92 words
A method of modifying a porous dielectric on a semiconductor device comprising: (a) providing a substrate containing an uncapped porous dielectric layer, said porous dielectric layer having an average pore diameter between 2 and 80 nm; and (b) heating said substrate to one or more temperatures between 100 and 490 degrees C. in a controlled atmosphere such that at least 70% of hydroxyl groups initially present on the pore surfaces of said porous dielectric are removed from said porous dielectric, whereby one or more dielectric properties of the porous dielectric are improved.
Claim 2
Independent Claim
92 words
A method of modifying a porous dielectric on a semiconductor device comprising: (a) providing a substrate containing an uncapped porous dielectric layer, said porous dielectric layer having an average pore diameter between 2 and 80 nm; and (b) heating said substrate to one or more temperatures between 100 and 490 degrees C. in a controlled atmosphere such that at least 70% of hydroxyl groups initially present on the pore surfaces of said porous dielectric are removed from said porous dielectric, whereby one or more dielectric properties of the porous dielectric are improved.
Claim 3
Dependent Claim
17 words
The method of claim 1, wherein said controlled atmosphere comprises an H 2 -containing, substantially oxygen-free atmosphere.
Claim 4
Dependent Claim
33 words
The method of claim 1, wherein said controlled atmosphere comprises a forming gas, said forming gas having a composition of approximately 10 wt % H 2 and 90 wt % N 2 .
Claim 5
Dependent Claim
28 words
The method of claim 1, wherein said controlled atmosphere comprises one or more fluorine compounds selected from the group consisting of: ammonium fluoride, hydrogen fluoride, and fluorine gas.
Claim 6
Dependent Claim
37 words
The method of claim 1, wherein said controlled atmosphere comprises at least two different atmospheric compositions applied sequentially during said heating step, at least one of said controlled atmospheres comprising an H 2 -containing, substantially oxygen-free atmosphere.
Claim 7
Dependent Claim
20 words
The method of claim 1, wherein said heating step results in 5% or less linear shrinkage of said porous dielectric.
Claim 8
Independent Claim
102 words
A method of modifying a porous dielectric on a semiconductor device comprising: (a) providing a substrate containing an uncapped porous dielectric layer, said porous dielectric layer having an average pore diameter between 2 and 80 nm; (b) placing said substrate in an H 2 -containing, substantially oxygen-free atmosphere; and (c) heating said substrate to a temperature between 300 and 450 degrees C., at approximately atmospheric pressure, such that at least 70% of hydroxyl groups initially present on the pore surfaces of said porous dielectric are removed from said porous dielectric, whereby one or more dielectric properties of the porous dielectric are improved.
Claim 9
Independent Claim
102 words
A method of modifying a porous dielectric on a semiconductor device comprising: (a) providing a substrate containing an uncapped porous dielectric layer, said porous dielectric layer having an average pore diameter between 2 and 80 nm; (b) placing said substrate in an H 2 -containing, substantially oxygen-free atmosphere; and (c) heating said substrate to a temperature between 300 and 450 degrees C., at approximately atmospheric pressure, such that at least 70% of hydroxyl groups initially present on the pore surfaces of said porous dielectric are removed from said porous dielectric, whereby one or more dielectric properties of the porous dielectric are improved.
Claim 10
Dependent Claim
37 words
The method of claim 7, wherein said H 2 -containing, substantially oxygen-free atmosphere comprises a forming gas, said forming gas having a composition of approximately 10 wt % H 2 and 90 wt % N 2 .
References Cited (Backward Citations)
US4608316A
Cited
US5302548A
Cited
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