Interconnect structures for integrated circuits

Claim 2

An integrated circuit having an interconnect structure comprising: a horizontal metallic conductor having a thickness and a width; and a vertical metallic conductor, the vertical metallic conductor contacting a surface of the horizontal metallic conductor to form an interface, wherein the surface is defined by at least a portion of the thickness and at least a portion of the width of the horizontal metallic conductor; wherein the horizontal metallic conductor comprises a Titanium/Titanium Nitride/Aluminum-Copper alloy/Titanium Nitride stack, and the vertical metallic conductor comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 3

An integrated circuit as in claim 1, wherein the vertical and metallic conductor contact at a substantially vertical interface.

Claim 4

An integrated circuit as in claim 1, wherein the vertical metallic conductor is a vertical interconnect and the horizontal metallic conductor is a horizontal interconnect.

Claim 5

An integrated circuit as in claim 1, wherein the size of the interface is defined by one half times the width times the thickness times π.

Claim 6

An integrated circuit as in claim 1, wherein the vertical metallic conductor at least partially penetrates into the horizontal metallic conductor.

Claim 7

An integrated circuit in claim 1, wherein the vertical metallic conductor terminates the horizontal metallic conductor.

Claim 8

An integrated circuit as in claim 1 further comprising: a second vertical metallic conductor having a first surface contacting a second surface of the horizontal metallic conductor to form a second interface, wherein the second surface is defined by at least a portion of the thickness and at least a portion of the width of the horizontal metallic conductor.

Claim 9

An integrated circuit as in claim 7 further comprising: a second horizontal metallic conductor having a thickness and a width, the second horizontal metallic conductor contacting a second surface of the second vertical metallic conductor to form a third interface, wherein the third surface is defined by at least a portion of the thickness and at least a portion of the width of the second horizontal metallic conductor.

Claim 10

An integrated circuit as in claim 8 further comprising: a dielectric material disposed between the horizontal metallic conductors.

Claim 11

An integrated circuit as in claim 1 further comprising: an electrical device having a diffused region in a substrate; wherein the vertical metallic conductor includes an end in contact with the electrical device diffused region.

Claim 12

An integrated circuit as in claim 1, wherein a top surface of the vertical metallic conductor substantially coincides with a top surface of the horizontal metallic conductor.

Claim 13

An integrated circuit as in claim 1, wherein a top surface of the vertical metallic conductor substantially coincides with a top surface of the horizontal metallic conductor.

Claim 14

An integrated circuit having an interconnect structure comprising: a generally horizontal metallic conductor having a thickness and a width; and a generally vertical metallic conductor, the vertical metallic conductor at least partially penetrating into the horizontal metallic conductor to form a first interface; wherein the horizontal metallic conductor comprises a Titanium/Titanium Nitride/Aluminum alloy/Titanium stack, and the vertical metallic conductor comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 15

An integrated circuit having an interconnect structure comprising: a generally horizontal metallic conductor having a thickness and a width; and a generally vertical metallic conductor, the vertical metallic conductor at least partially penetrating into the horizontal metallic conductor to form a first interface; wherein the horizontal metallic conductor comprises a Titanium/Titanium Nitride/Aluminum alloy/Titanium stack, and the vertical metallic conductor comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 16

An integrated circuit as in claim 13 wherein the horizontal metallic conductor is a horizontal metallic interconnect, and the vertical metallic conductor is a vertical metallic interconnect.

Claim 17

An integrated circuit as in claim 13 wherein the vertical metallic conductor terminates the horizontal metallic conductor.

Claim 18

An integrated circuit as in claim 13 further comprising: a dielectric layer having a first surface disposed on a surface of the horizontal metallic conductor and a second surface disposed on a surface of the vertical metallic conductor.

Claim 19

An integrated circuit as in claim 13 wherein the vertical metallic conductor completely penetrates the horizontal metallic conductor.

Claim 20

An integrated circuit as in claim 13 further comprising: a second generally horizontal metallic conductor having a thickness and a width; a dielectric layer in contact with and disposed between the first and second horizontal metallic conductors; wherein the vertical metallic conductor includes a body portion disposed within the dielectric layer, a first end portion intruding into the first horizontal metallic conductor to form the fist interface, and a second end portion intruding into the second horizontal metallic conductor to form a second interface.

Claim 21

An integrated circuit as in claim 18 wherein the second horizontal metallic conductor comprises respective Titanium/Titanium Nitride/Aluminum-Copper alloy/titanium Nitride stacks.

Claim 22

An integrated circuit having an interconnect structure, the integrated circuit comprising: a first conductive layer, of thickness t and linewidth w, having a first portion and a second portion; and a second conductive layer, having a thickness greater than t, coupled to the first conductive layer first portion at a first approximately interface and coupled to the first conductive layer second portion at a second interface; wherein the first and second interfaces are of approximately equal size; and wherein the size of the first interface significantly exceed 1/2 times π times w 2 to increase the electromigration lifetime of the first interface.

Claim 23

An integrated circuit having an interconnect structure, the integrated circuit comprising: a first conductive layer, of thickness t and linewidth w, having a first portion and a second portion; and a second conductive layer, having a thickness greater than t, coupled to the first conductive layer first portion at a first approximately interface and coupled to the first conductive layer second portion at a second interface; wherein the first and second interfaces are of approximately equal size; and wherein the size of the first interface significantly exceed 1/2 times π times w 2 to increase the electromigration lifetime of the first interface.

Claim 24

An integrated circuit as in claim 20 wherein t is about 0.7 microns and w is about 0.2 microns.

Claim 25

An integrated circuit as in claim 20 wherein the first conductive layer is a horizontal metallic conductor and comprises a Titanium/Titanium Nitride/Aluminum alloy/Titanium Nitride stack, and the second conductive layer is a vertical metallic conductor and comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 26

An integrated circuit as in claim 20 wherein the first conductive layer is a horizontal metallic interconnect and the second conductive layer is a vertical metallic interconnect.

Claim 27

An integrated circuit as in claim 20 further comprising: a dielectric having a surface disposed on a surface of the first conductive layer and having an orifice through which the second second conductive layer is disposed.

Claim 28

An integrated circuit as in claim 20 wherein the thickness t of the first conductive layer exceeds the first conductive layer linewidth w by a factor of at least 1.5.

Claim 29

An integrated circuit as in claim 20 wherein the thickness t of the first conductive layer exceeds the first conductive layer linewidth w by a factor of at least 2.

Claim 30

An integrated circuit as in claim 20 wherein the thickness t of the first conductive layer exceeds the first conductive layer linewidth w by a factor of at least 3.

Claim 31

An integrated circuit as in claim 20 wherein the thickness t of the first conductive layer exceeds the first conductive layer linewidth w by a factor of at least 4.

Claim 32

An integrated circuit as in claim 20 wherein the first interface is an approximately vertical interface.

Claim 33

An integrated circuit as in claim 20 wherein the second interface is approximately vertical interface, and the size of the second vertical interface significantly exceeds 1/2 times π times w 2 .

Claim 34

An integrated circuit as in claim 20 further comprising: a third conductive layer, of thickness T and linewidth W, having a first portion and a second portion, wherein the third conductive layer first portion is coupled to the second conductive layer at a third approximately vertical interface, and the third conductive layer second portion is coupled to the second conductive layer at a fourth approximately vertical interface; and a dielectric layer disposed between the first and third conductive layers; wherein the third and fourth vertical interfaces are of approximately equal size; and wherein the size of the third vertical interface significantly exceeds 1/2 times π times W 2 to increase the electromigration lifetime of the third vertical interface.

Claim 35

An integrated circuit as in claim 20 wherein a top surface of the first conductive layer coincides with a top surface of the second conductive layer.

Claim 36

An integrated circuit as in claim 20 wherein the first conductive layer comprises a Titanium/Titanium Nitride/Aluminum-Copper alloy/Titanium Nitride stack, and the second conductive layer comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 37

An integrated circuit as in claim 20 further comprising: a dielectric having a first surface disposed on a top surface of the first conductive layer; a first plurality of conductive layers disposed on a second surface of the dielectric; and a second plurality of conductive layers, extending through the dielectric, to couple, at a first plurality of respective approximately vertical interfaces, respective ones of the first plurality of conductive layers to the first conductive layer.

Claim 38

An integrated circuit as in claim 34 wherein the second plurality of conductive layers intersect the first conductive layer and the first plurality of conductive layers, respectively, and each interface has a size that significantly exceeds 1/2 times π times a linewidth squared, the linewidth being the thickness of the respective conductive layer at one of the respective interfaces.

Claim 39

An integrated circuit as in claim 20 further comprising: an electrical device coupled to the second conductive layer to provide a conductive path between the electrical device and the first conductive layer.

Claim 40

An interconnect structure comprising: a generally horizontal interconnect, of thickness t and linewidth w, having a first portion; and a generally vertical interconnect terminating the first conductive layer and in contact with the first conductive layer first portion at an approximately vertical interface; wherein the thickness t of the horizontal interconnect significantly exceeds the linewidth w of the horizontal interconnect.

Claim 41

An interconnect structure comprising: a generally horizontal interconnect, of thickness t and linewidth w, having a first portion; and a generally vertical interconnect terminating the first conductive layer and in contact with the first conductive layer first portion at an approximately vertical interface; wherein the thickness t of the horizontal interconnect significantly exceeds the linewidth w of the horizontal interconnect.

Claim 42

An integrated circuit as in claim 37 wherein if the generally vertical interconnect is misaligned in a direction perpendicular to the linewidth w by a distance less than or equal to a radius of the generally vertical interconnect, the effective conductive area of the vertical interface is substantially unaffected.

Claim 43

An interconnect structure as in claim 37 wherein the thickness t of the horizontal interconnect exceeds the horizontal interconnect linewidth w by a factor of at least 1.5.

Claim 44

An interconnect structure as in claim 37 wherein the thickness t of the horizontal interconnect exceeds the horizontal interconnect linewidth w by a factor of at least 2.

Claim 45

An interconnect structure as in claim 37 wherein the thickness t of the horizontal interconnect exceeds the horizontal interconnect linewidth w by a factor of at least 3.

Claim 46

An interconnect structure as in claim 37 wherein the size of the vertical interface substantially exceeds 1/2 times π times w 2 to increase the electromigration lifetime of the vertical interface.

Claim 47

An interconnect structure as in claim 37 wherein the thickness t of the horizontal interconnect exceeds the horizontal interconnect linewidth w by a factor of at least 4.

Claim 48

An interconnect structure as in claim 37 further comprising: a second generally horizontal interconnect, of thickness T and linewidth W, having a first portion and a second portion, wherein the second horizontal interconnect first portion is coupled to the vertical interconnect at a second approximately vertical interface, and the second horizontal interconnect second portion is coupled to the vertical interconnect at a third approximately vertical interface; and a dielectric layer disposed between the horizontal interconnects; wherein the second and third vertical interfaces are of approximately equal size; and wherein the size of the second vertical interface significantly exceeds 1/2 times π times W 2 to increase the electromigration lifetime of the second vertical interface.

Claim 49

An integrated circuit as in claim 37 wherein the horizontal interconnect comprises a Titanium/Titanium Nitride/Aluminum-Copper alloy/Titanium Nitride stack, and the vertical interconnect comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 50

An integrated circuit having an interconnect structure comprising: a first dielectric layer having a first surface, having a second surface opposing the first surface, and having an opening extending from the second surface to the first surface; a second dielectric layer having a first surface, having a second surface opposing the first surface, and having an opening extending from the second surface to the first surface; a first horizontal metallic interconnect including a first surface having a length and a width and disposed on the first dielectric first surface, and including a second surface extending approximately the width of the first horizontal metallic interconnect and having a first thickness; a second horizontal metallic interconnect including a first surface having a length and a width and disposed on the first dielectric second surface, including a second surface extending approximately the width of the second horizontal metallic interconnect and having a second thickness, including a third surface opposing the first surface and disposed on the second dielectric first surface, and including a fourth surface extending approximately the width of the second horizontal metallic interconnect and having a third thickness; a first vertical metallic interconnect having a body portion disposed within the opening of the first dielectric, a proximal portion having a surface in contact with the first horizontal metallic conductor second surface to form a first substantially vertical contact interface, and a distal portion having a surface in contact with the second horizontal metallic conductor second surface to form a second substantially vertical contact interface; and a second vertical metallic interconnect having a body portion disposed within the opening of the second dielectric and a proximal portion having a surface in contact with the second horizontal metallic conductor fourth surface to form a third substantially vertical contact interface; wherein the first and second horizontal metallic interconnects are comprised of respective Titanium/Titanium Nitride/Aluminum-Copper alloy/Titanium Nitride stacks, and wherein the first and second vertical metallic interconnects are comprised of respective Titanium/Titanium Nitride layer stacks and respective Tungsten.

Claim 51

An integrated circuit having an interconnect structure comprising: a first dielectric layer having a first surface, having a second surface opposing the first surface, and having an opening extending from the second surface to the first surface; a second dielectric layer having a first surface, having a second surface opposing the first surface, and having an opening extending from the second surface to the first surface; a first horizontal metallic interconnect including a first surface having a length and a width and disposed on the first dielectric first surface, and including a second surface extending approximately the width of the first horizontal metallic interconnect and having a first thickness; a second horizontal metallic interconnect including a first surface having a length and a width and disposed on the first dielectric second surface, including a second surface extending approximately the width of the second horizontal metallic interconnect and having a second thickness, including a third surface opposing the first surface and disposed on the second dielectric first surface, and including a fourth surface extending approximately the width of the second horizontal metallic interconnect and having a third thickness; a first vertical metallic interconnect having a body portion disposed within the opening of the first dielectric, a proximal portion having a surface in contact with the first horizontal metallic conductor second surface to form a first substantially vertical contact interface, and a distal portion having a surface in contact with the second horizontal metallic conductor second surface to form a second substantially vertical contact interface; and a second vertical metallic interconnect having a body portion disposed within the opening of the second dielectric and a proximal portion having a surface in contact with the second horizontal metallic conductor fourth surface to form a third substantially vertical contact interface; wherein the first and second horizontal metallic interconnects are comprised of respective Titanium/Titanium Nitride/Aluminum-Copper alloy/Titanium Nitride stacks, and wherein the first and second vertical metallic interconnects are comprised of respective Titanium/Titanium Nitride layer stacks and respective Tungsten.

Claim 52

An integrated circuit having an interconnect structure as in claim 46 wherein the first interface has a size generally defined by approximately the width of the first horizontal metallic interconnect times the first thickness times π, the second interface having a size generally defined by approximately the width of the second horizontal metallic interconnect times the second thickness times π, and the third interface having a size generally defined by approximately the width of the second horizontal metallic interconnect times the third thickness times π.

Claim 53

An integrated circuit interconnect structure comprising: a first metallic line having a generally planar surface; a second metallic line having a generally planar surface; a metallic plug having a first end region coupled to the first line and a second end region coupled to the second line, wherein a first interface, disposed between the plug first end region and the first line, extends into the first line beyond the surface thereof, and a second interface, disposed between the plug second end region and the second line, extends into the second line beyond the surface thereof; a third metallic line having a generally planar surface; and a second metallic plug having a first end region coupled to the first line and a second end region coupled to the third line, wherein a first interface, disposed between the second plug first end region and the first line, extends in to the first line beyond the surface thereof, and a second interface, disposed between the second plug second end region and the third line, extends in the third line beyond the surface thereof; wherein the first, second, and third metallic lines are comprised of respective Titanium/Titanium Nitride/Aluminum-Copper alloy/titanium Nitride stacks, and the metallic plugs are comprised of respective Titanium/Titanium Nitride layer stacks and respective Tungsten.

Claim 54

An integrated circuit interconnect structure comprising: a first metallic line having a generally planar surface; a second metallic line having a generally planar surface; a metallic plug having a first end region coupled to the first line and a second end region coupled to the second line, wherein a first interface, disposed between the plug first end region and the first line, extends into the first line beyond the surface thereof, and a second interface, disposed between the plug second end region and the second line, extends into the second line beyond the surface thereof; a third metallic line having a generally planar surface; and a second metallic plug having a first end region coupled to the first line and a second end region coupled to the third line, wherein a first interface, disposed between the second plug first end region and the first line, extends in to the first line beyond the surface thereof, and a second interface, disposed between the second plug second end region and the third line, extends in the third line beyond the surface thereof; wherein the first, second, and third metallic lines are comprised of respective Titanium/Titanium Nitride/Aluminum-Copper alloy/titanium Nitride stacks, and the metallic plugs are comprised of respective Titanium/Titanium Nitride layer stacks and respective Tungsten.

Claim 55

An integrated circuit interconnect structure as in claim 48 wherein the first line includes a thickness and width, dimensions of the first interface are defined by the thickness and width of the first line, the second line includes a thickness and width, and dimensions of the second interface are defined by the thickness and width of the second line.

Claim 56

An integrated circuit interconnect structure as in claim 48 wherein the plug first end region intrudes partially into the first line, and the plug second end region intrudes partially into the second line.

Claim 57

An integrated circuit interconnect structure as in claim 48 wherein the plug terminates the first line.

Claim 58

An integrated circuit interconnect structure as in claim 48 wherein the first interface is generally normal to the first line surface, and the second interface is generally normal to the second line surface.

Claim 59

An integrated circuit having an interconnect structure, integrated circuit comprising: a first means for conducting having a thickness t and a width w; an approximately vertical means for conducting, the vertical means intersecting the first means for conducting and coupled to a first portion of the first means for conducing at a first approximately vertical interface and coupled to a second portion of the first means for conducting at a second approximately vertical interface, the first interface having a size generally equal to a size of the second interface; wherein the size of the first interface significantly exceeds 1/2 time π times w 2 to increase the electromigration lifetime of the first interface.

Claim 60

An integrated circuit having an interconnect structure, integrated circuit comprising: a first means for conducting having a thickness t and a width w; an approximately vertical means for conducting, the vertical means intersecting the first means for conducting and coupled to a first portion of the first means for conducing at a first approximately vertical interface and coupled to a second portion of the first means for conducting at a second approximately vertical interface, the first interface having a size generally equal to a size of the second interface; wherein the size of the first interface significantly exceeds 1/2 time π times w 2 to increase the electromigration lifetime of the first interface.

Claim 61

An integrated circuit as in claim 53 further comprising: a second means for conducting having a thickness T and a width w, the vertical means intersecting the second means for conducting and coupled to a first portion of the second means for conducing at a third approximately vertical interface and coupled to a second portion of the second means for conducting at a fourth approximately vertical interface, the third interface having a size generally equal to a size of the fourth interface; wherein the size of the third interface significantly exceeds 1/2 time π times w 2 to increase the electromigration lifetime of the third interface.

Claim 62

An integrated circuit as in claim 53 wherein the first means for conducting comprises a Titanium/Titanium Nitride/Aluminum-Copper alloy/Titanium Nitride stack, and the vertical means for conducting comprises a Titanium/Titanium Nitride layer stack and Tungsten.

Claim 63

An integrated circuit as in claim 53 wherein the thickness t of the first means for conducting exceeds the width w of the first means for conducting by a factor of at least 1.5.

Claim 64

An integrated circuit as in claim 53 wherein the thickness t of the first means for conducting exceeds the width w of the first means for conducting by a factor of at least 2.

Claim 65

An integrated circuit as in claim 53 wherein the thickness t of the first means for conducting exceeds the width w of the first means for conducting by a factor of at least 3.

Claim 66

An integrated circuit as in claim 53 wherein the thickness t of the first means for conducting exceeds the width w of the first means or conducting by a factor of at least 4.