US4840923A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Simultaneous multiple level interconnection process
Assignee: Sanmina Corp
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Filing: 1988-10-19
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Granted: 1989-06-20
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Expires: 2008-10-19
Abstract
Abstract A system of establishing a conductive via path between spaced interlevel conductors. Successive layers of metallization separated by a dielectric are built. The vias are opened in one step to eliminate interlevel mashing. The system employs annular pads at locations where contact may be established to another wiring level. The vias are self-aligned and taper from top metal to first level contact. The system is applicable both chip-wise and carrier-wise.
Inventors
- 👤 Donis G. Flagello
- 👤 Janusz S. Wilczynski
- 👤 David F. Witman
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 13:52
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/0011; H05K3/0017; H05K3/0041; H10; H10W; H10W20/00; H10W20/01; H10W70/00; H10W70/01; H10W70/05; H05K2201/00; H05K2201/09; H05K2201/09209; H05K2201/095; H05K2201/09509; H05K2201/09518; H05K2201/096; H05K2201/09818; H05K2201/09845; H05K3/40; H05K3/4038; H05K3/46; H05K3/4644; H05K3/467; Y; Y10; Y10S; Y10S148/00; Y10S148/02; Y10S148/164
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
105 words
A method of establishing a conductive via path between spaced interlevel conductors comprising the steps of: defining a first level having a pattern of a conductive material and applying a first dielectric layer over said first level of conductive material: applying a second level having a pattern of a conductive material with via openings over said first dielectric layer; applying a second dielectric layer over said second level of conductive material; creating a via path by opening said dielectric layers through said via openings in said conductive level and terminating said opening at the first conductive level; and filling said opening with a conductive material.
Claim 2
Independent Claim
105 words
A method of establishing a conductive via path between spaced interlevel conductors comprising the steps of: defining a first level having a pattern of a conductive material and applying a first dielectric layer over said first level of conductive material: applying a second level having a pattern of a conductive material with via openings over said first dielectric layer; applying a second dielectric layer over said second level of conductive material; creating a via path by opening said dielectric layers through said via openings in said conductive level and terminating said opening at the first conductive level; and filling said opening with a conductive material.
Claim 3
Independent Claim
50 words
The method of claim I, wherein said step of applying a second level of conductive material comprises the step of providing an enlarged area in said second level in a zone where a via path may be created, said enlarged area overlapping said conductive material in said first conductive level.
Claim 4
Dependent Claim
45 words
The method of claim 1, wherein the step of creating said via path comprising the steps of: applying a resist pattern on said second dielectric layer, developing said pattern and etching through said second dielectric layer, said second conductive level and said first dielectric level.
Claim 5
Dependent Claim
12 words
The method of claim 3, wherein said etch is a wet etch.
Claim 6
Dependent Claim
12 words
The method of claim 3, wherein said etch is a dry etch.
Claim 7
Dependent Claim
19 words
The method of claim 3 further comprising the step of removing residual resist prior to filling said via paths.
Claim 8
Dependent Claim
60 words
The method of claim 1 further comprising the steps of prior to creating said via paths applying a third level having a pattern of conductive material over said second dielectric layer and a third dielectric layer over said third level and wherein said step of creating said via path includes opening, opening said third level and said third dielectric layer.
Claim 9
Dependent Claim
22 words
The method of claim 1, wherein said first and second levels of conductive patterns comprise wiring levels of a semiconductor chip carrier.
Claim 10
Dependent Claim
14 words
The method of claim 8, wherein said first and second dielectric layers comprise polyimide.
Claim 11
Dependent Claim
21 words
The method of claim 1, wherein said first and second levels of conductive patterns comprise wiring interconnections of a semiconductor chip.
Claim 12
Dependent Claim
25 words
The method of claim 1, wherein the step of creating a via path comprises simultaneously opening said layers at a plurality of predetermined spaced locations.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1992-06-19 | 1992-12-19 | 1993-06-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1996-06-19 | 1996-12-19 | 1997-06-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2000-06-19 | 2000-12-19 | 2001-06-20 | $7700.00 | Window Closed / Lapsed |