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US5114871A Expired / Lapsed US ⏱️ 0.0 years remaining

Manufacturing diamond electronic devices

Assignee: Individual
•
Filing: 1989-05-24
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Granted: 1992-05-19
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Expires: 2009-05-24
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Abstract

Abstract The invention provides a process for manufacturing an electronic device on a semiconducting substrate which is transparent to light of a particular wavelength. The process includes the steps of treating the substrate to form at least one region having a different electrical property to the substrate, and defining a conducting contact for the region by selective photolithographic masking and chemical etching. A layer of photoresist material deposited on one side of the substrate is subjected to light transmitted through the substrate from a light source on the other side of the substrate. The process can be used to produce a field effect transistor on a diamond substrate.

Inventors

  • 👤 Barbara L. Jones

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 11:13
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D62/00; H10D62/80; H10D62/83; H10D62/8303; H10P; H10P76/00; H10P76/20; H10P76/204; H10P76/2041; Y; Y10; Y10S; Y10S148/00; Y10S148/10

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 186 words
A process for manufacturing a unipolar semiconductor device characterized in that it includes the steps of: providing a p-type diamond substrate which is transparent to ultraviolet light; depositing a layer of insulating material on the surface of the substrate; depositing a layer of a first metal over the layer of insulating material; selectively removing the deposited layers to define a gate region of the unipolar semiconductor device; forming source and drain regions of the unipolar semiconductor device adjacent to the gate area; depositing a layer of positive photoresist material over the source, gate and drain regions; exposing the layer of photoresist material to ultraviolet light which is passed thorugh the substrate; removing the exposed photoresist material, so that a layer of photoresist material remains above the gate region; depositing a layer of a second metal over the source, gate and drain regions; and selectively removing the layer of photoresist material and hence the layer of the second metal above the gate region, a MISFET structure thereby being obtained which has source and drain contacts of the second metal and a gate contact of the first metal.
Claim 2
Dependent Claim 186 words
A process for manufacturing a unipolar semiconductor device characterized in that it includes the steps of: providing a p-type diamond substrate which is transparent to ultraviolet light; depositing a layer of insulating material on the surface of the substrate; depositing a layer of a first metal over the layer of insulating material; selectively removing the deposited layers to define a gate region of the unipolar semiconductor device; forming source and drain regions of the unipolar semiconductor device adjacent to the gate area; depositing a layer of positive photoresist material over the source, gate and drain regions; exposing the layer of photoresist material to ultraviolet light which is passed thorugh the substrate; removing the exposed photoresist material, so that a layer of photoresist material remains above the gate region; depositing a layer of a second metal over the source, gate and drain regions; and selectively removing the layer of photoresist material and hence the layer of the second metal above the gate region, a MISFET structure thereby being obtained which has source and drain contacts of the second metal and a gate contact of the first metal.
Claim 3
Dependent Claim 21 words
A process according to claim 1 characterised in that the layer of insulating material comprises an oxide, nitride, oxynitride or carbide.
Claim 4
Dependent Claim 23 words
A process according to claim 1 characterised in that the first metal is a low work function metal such as aluminum or chrome.
Claim 5
Dependent Claim 26 words
A process according to claim 1 characterised in that the second metal is a high work function metal such as gold, platinum, gold/tantalum alloy, or palladium.
Claim 6
Dependent Claim 141 words
A process for manufacturing a unipolar semiconducting device on a semiconducting substrate which is transparent to light of a predetermined wavelength characterized in that it includes the steps of: depositing a layer of insulating material on the surface of said semiconducting substrate; depositing a metallic layer over the layer of insulating material for forming a conducting gate contact; selectively removing the deposited layers to define at least one gate region, each gate region forming a metal insulator semiconductor structure; and defining a conducting gate contact for the at least one gate region, and at least one further conducting contact for a region adjacent to the gate region, by selective photolithographic masking and chemical etching, including subjecting a layer of positive photoresist material deposited on the substrate and the meatllic layer to the light of the predetermined wavelength transmitted through the substrate.
Claim 7
Dependent Claim 141 words
A process for manufacturing a unipolar semiconducting device on a semiconducting substrate which is transparent to light of a predetermined wavelength characterized in that it includes the steps of: depositing a layer of insulating material on the surface of said semiconducting substrate; depositing a metallic layer over the layer of insulating material for forming a conducting gate contact; selectively removing the deposited layers to define at least one gate region, each gate region forming a metal insulator semiconductor structure; and defining a conducting gate contact for the at least one gate region, and at least one further conducting contact for a region adjacent to the gate region, by selective photolithographic masking and chemical etching, including subjecting a layer of positive photoresist material deposited on the substrate and the meatllic layer to the light of the predetermined wavelength transmitted through the substrate.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1995-05-19 1995-11-18 1996-05-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1999-05-19 1999-11-18 2000-05-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2003-05-19 2003-11-18 2004-05-19 $7700.00 Window Closed / Lapsed

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