Dynamic memory cell using silicon-on-insulator transistor with trench capacitor

Claim 2

A dynamic read/write memory cell formed in a face of a semiconductor body, comprising: a capacitor in a trench in said face, that capacitor having a lower plate defined by a doped region at the surface of the sidewalls and bottom of the trench, having a capacitor dielectric on the side walls and bottom of the trench, and an upper plate defined by a conductive material substantially filling the trench, an insulator overlying said conductive material, and means for connecting the upper plate to a reference potential, an access transistor in the form of an MOS field-effect device overlying said insulator, said device including a channel region directly above said trench and including source and drain regions on opposite ends of said channel region overlying said insulator, a bit line extending along said face overlying said insulator and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means coupling the source region to said doped region of the capacitor, wherein said source and drain regions and said doped region of said capacitor are doped with materials having similar impurity-type.

Claim 3

A memory cell according to claim 1 wherein said semiconductor body is silicon and said channel region is silicon.

Claim 4

A memory cell according to claim 2, wherein said conductive material is polycrystalline silicon, and said means for connecting said upper plate to reference potential is a layer of polycrystalline silicon extending along said face.

Claim 5

A memory cell according to claim 3 wherein said bit line and said source and drain regions are silicided.

Claim 6

A memory cell according to claim 4 wherein said contact means is in a hole in said layer and in said insulator, and includes a doped region of said face adjacent said trench.

Claim 7

A dynamic read/write memory cell formed in a face of a semiconductor body, comprising: a capacitor in a recess formed in said face, the capacitor having a lower electrode defined by a doped region in all surfaces of the recess, having a capacitor dielectric coating on all surfaces of the recess, and an upper electrode defined by a conductive material within the recess, an insulator overlying said conductive material, and means for connecting the upper electrode to reference potential, an access transistor in the form of a MOS field-effect device located above the recess overlying said insulator, said device including a channel region in a semiconductor layer directly above the recess and including source and drain regions on opposite ends of said channel region overlying said insulator, a bit line extending along said face overlying said insulator and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means directly connecting the source region to said face at said doped region of the capacitor, wherein said source and drain regions are doped with a material having similar impurity-type as the material used to dope said doped region of said capacitor.

Claim 8

A dynamic read/write memory cell formed in a face of a semiconductor body, comprising: a capacitor in a recess formed in said face, the capacitor having a lower electrode defined by a doped region in all surfaces of the recess, having a capacitor dielectric coating on all surfaces of the recess, and an upper electrode defined by a conductive material within the recess, an insulator overlying said conductive material, and means for connecting the upper electrode to reference potential, an access transistor in the form of a MOS field-effect device located above the recess overlying said insulator, said device including a channel region in a semiconductor layer directly above the recess and including source and drain regions on opposite ends of said channel region overlying said insulator, a bit line extending along said face overlying said insulator and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means directly connecting the source region to said face at said doped region of the capacitor, wherein said source and drain regions are doped with a material having similar impurity-type as the material used to dope said doped region of said capacitor.

Claim 9

A memory cell according to claim 6, wherein said semiconductor body is silicon and said channel region is silicon.

Claim 10

A memory cell according to claim 7, wherein said conductive material is polycrystalline silicon, and said means connecting said upper plate to reference potential is a layer of polycrystalline silicon extending along said face.

Claim 11

A memory cell according to claim 6, wherein said contact means is in a hole in said layer and in said insulator, and includes a doped region of said face adjacent said trench.

Claim 12

A memory cell according to claim 1, wherein said word line extends over said source and drain regions of said access transistor.

Claim 13

A memory cell according to claim 10, wherein said access transistor further comprises: a gate insulator disposed between said word line and said source, drain and channel regions of said access transistor, said gate insulator being thinner over said channel region than over said source and drain regions.

Claim 14

A memory cell according to claim 11, wherein said source and drain regions of said access transistor are silicided.

Claim 15

A memory cell according to claim 10, wherein said source and drain regions of said access transistor are silicided.

Claim 16

A memory cell according to claim 6, wherein said word line extends over said source and drain regions of said access transistor.

Claim 17

A memory cell according to claim 14, wherein said access transistor further comprising: a gate insulator disposed between said word line and said source, drain and channel regions of said access transistor, said gate insulator being thinner over said channel region than over said source and drain regions.

Claim 18

A memory cell according to claim 15, wherein said source and drain regions of said access transistor are silicided.

Claim 19

A memory cell according to claim 14 wherein said source and drain regions of said access transistor are silicided.

Claim 20

An improvement to an integrated circuit structure having a field effect transistor over a capacitor groove in which said capacitor covers the entire surface of said groove, the improvement comprising a dynamic read/write memory cell formed in a face of a semiconductor body, further comprising: a capacitor in a trench etched into said face, the capacitor having a lower plate defined by a doped region in the surface of the sidewalls and bottom of the trench, having a capacitor dielectric coating on the sidewalls and bottom of the trench, and an upper plate defined by a conductive material substantially filling the trench, an insulator overlying said conductive material, and means for connection the upper plate to reference potential, an access transistor in the form of a MOS field-effect device located above the trench overlying said insulator, said device including a channel region directly above said trench and including source and drain regions on opposite ends of said channel region overlying said insulator, and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means coupling the source region to said doped region of the capacitor, wherein said source and drain regions and said doped region of said capacitor are doped with materials having similar impurity-type.

Claim 21

An improvement to an integrated circuit structure having a field effect transistor over a capacitor groove in which said capacitor covers the entire surface of said groove, the improvement comprising a dynamic read/write memory cell formed in a face of a semiconductor body, further comprising: a capacitor in a trench etched into said face, the capacitor having a lower plate defined by a doped region in the surface of the sidewalls and bottom of the trench, having a capacitor dielectric coating on the sidewalls and bottom of the trench, and an upper plate defined by a conductive material substantially filling the trench, an insulator overlying said conductive material, and means for connection the upper plate to reference potential, an access transistor in the form of a MOS field-effect device located above the trench overlying said insulator, said device including a channel region directly above said trench and including source and drain regions on opposite ends of said channel region overlying said insulator, and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means coupling the source region to said doped region of the capacitor, wherein said source and drain regions and said doped region of said capacitor are doped with materials having similar impurity-type.

Claim 22

A memory cell according to claim 18, wherein said semiconductor body is silicon and said channel region is silicon.

Claim 23

A memory cell according to claim 19, wherein said conductive material is polycrystalline silicon, and said means for connecting said upper plate to reference potential is a layer of polycrystalline silicon extending along said face.

Claim 24

A memory cell according to claim 20, wherein said bit line and said source and drain regions are silicided.

Claim 25

A memory cell according to claim 21, wherein said contact means is in a hole in said layer and in said insulator, and includes a doped region of said face adjacent said trench.

Claim 26

A memory cell according to claim 18, wherein said word line extends over said source and drain regions of said access transistor.

Claim 27

A memory cell according to claim 23, wherein said access transistor further comprises: a gate insulator disposed between said word line and said source, drain and channel regions of said access transistor, said gate insulator being thinner over said channel region than over said source and drain regions.

Claim 28

A memory cell according to claim 24, wherein said source and drain regions of said access transistor are silicided.

Claim 29

A memory cell according to claim 23, wherein said source and drain regions of said access transistor are silicided.

Claim 30

An improvement to an integrated circuit structure having a field-effect transistor over a capacitor groove, in which said capacitor covers the entire surface of said groove, the improvement comprising a dynamic read/write memory cell formed in a face of a semiconductor body, further comprising: a capacitor in a recess formed in said face, the capacitor having a lower electrode defined by a doped region in all surfaces of the recess, and an upper electrode defined by a conductive material within the recess, an insulator overlying said conductive material, and means for connecting the upper electrode to reference potential, an access transistor in the form of a MOS field-effect device located above the recess overlying said insulator, said device including a channel region in a semiconductor layer directly above the recess and including source and drain regions on opposite ends of said channel region overlying said insulator, a bit line extending along said face overlying said insulator and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means directly connecting the source region to said face at said doped region of the capacitor, wherein said source and drain regions are doped with a material having similar impurity-type as the material used to dope said region of said capacitor.

Claim 31

An improvement to an integrated circuit structure having a field-effect transistor over a capacitor groove, in which said capacitor covers the entire surface of said groove, the improvement comprising a dynamic read/write memory cell formed in a face of a semiconductor body, further comprising: a capacitor in a recess formed in said face, the capacitor having a lower electrode defined by a doped region in all surfaces of the recess, and an upper electrode defined by a conductive material within the recess, an insulator overlying said conductive material, and means for connecting the upper electrode to reference potential, an access transistor in the form of a MOS field-effect device located above the recess overlying said insulator, said device including a channel region in a semiconductor layer directly above the recess and including source and drain regions on opposite ends of said channel region overlying said insulator, a bit line extending along said face overlying said insulator and connected to said drain region, a word line extending along said face and forming a gate for the transistor above said channel region, and ohmic contact means directly connecting the source region to said face at said doped region of the capacitor, wherein said source and drain regions are doped with a material having similar impurity-type as the material used to dope said region of said capacitor.

Claim 32

A memory cell according to claim 27, wherein said semiconductor body is silicon and said channel region is silicon.

Claim 33

A memory cell according to claim 28, wherein said conductive material is polycrystalline silicon, and said means connecting said upper plate to reference potential is a layer of polycrystalline silicon extending along said face.

Claim 34

A memory cell according to claim 27 wherein said contact means is in a hole in said layer and in said insulator, and includes a doped region of said face adjacent said trench.

Claim 35

A memory cell according to claim 27, wherein said word line extends over said source and drain regions of said access transistor.

Claim 36

A memory cell according to claim 31, wherein said access transistor further comprises: a gate insulator disposed between said word line and said source, drain and channel regions of said access transistor, said gate insulator being thinner over said channel region than over said source and drain regions.

Claim 37

A memory cell according to claim 32, wherein said source and drain regions of said access transistor are silicided.

Claim 38

A memory cell according to claim 31, wherein said source and drain regions of said access transistor are silicided.