Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
339 words
A process for preparing a multi-layers stacked junction type thin film transistor having a base region of at least approximately 1000 Å in thickness comprising a polycrystal silicon-containing film having grains of at least 1000 Å in size, comprising forming said polycrystal silicon film by the steps of: (a) generating a precursor (A) by activating a gaseous raw material in a first activation space using activating energy, said gaseous raw material selected from the group consisting of compounds represented by the general formula: Si n X 2n+2 and compounds represented by the general formula: (SiX 2 ) n , wherein n is an integer of 1 to 3 and X is F; (b) generating a precursor (B) using activating energy in a second activation space which is separate from said first activation space said precursor (B) being chemically reactive with said precursor (A) so as to cause the formation of a film, and formed by activating a gaseous hydrogen-containing raw material selected from the group consisting of H 2 gas, compounds represented by the general formula: Si n H 2n+2 and compounds represented by the general formula: SiH n X 4-n , wherein n is an integer of 1 to 3 and X is F, Cl, Br or I, said precursor (B) including H.sub.α * species having a luminescence intensity I[H.sub.α *]; (c) introducing said precursor (A) and said precursor (B) into a film forming space separate from said first and second activation spaces, said film forming space having a substrate maintained at a temperature of at least 150° C. while regulating the amount said precursor (A) and the amount of said precursor (B) such that I[H.sub.α *]/I[SiF*] is at least 6×10 -3 in said film forming space wherein SiF* is a species formed by the reaction of said precursor (A) and said precursor (B) having a luminescence intensity of I[SiF*]; and (d) chemically reacting said precursor (A) and said precursor (B) in space surrounding the surface of the substrate so as to thereby form said polycrystal silicon film.
Claim 2
Dependent Claim
339 words
A process for preparing a multi-layers stacked junction type thin film transistor having a base region of at least approximately 1000 Å in thickness comprising a polycrystal silicon-containing film having grains of at least 1000 Å in size, comprising forming said polycrystal silicon film by the steps of: (a) generating a precursor (A) by activating a gaseous raw material in a first activation space using activating energy, said gaseous raw material selected from the group consisting of compounds represented by the general formula: Si n X 2n+2 and compounds represented by the general formula: (SiX 2 ) n , wherein n is an integer of 1 to 3 and X is F; (b) generating a precursor (B) using activating energy in a second activation space which is separate from said first activation space said precursor (B) being chemically reactive with said precursor (A) so as to cause the formation of a film, and formed by activating a gaseous hydrogen-containing raw material selected from the group consisting of H 2 gas, compounds represented by the general formula: Si n H 2n+2 and compounds represented by the general formula: SiH n X 4-n , wherein n is an integer of 1 to 3 and X is F, Cl, Br or I, said precursor (B) including H.sub.α * species having a luminescence intensity I[H.sub.α *]; (c) introducing said precursor (A) and said precursor (B) into a film forming space separate from said first and second activation spaces, said film forming space having a substrate maintained at a temperature of at least 150° C. while regulating the amount said precursor (A) and the amount of said precursor (B) such that I[H.sub.α *]/I[SiF*] is at least 6×10 -3 in said film forming space wherein SiF* is a species formed by the reaction of said precursor (A) and said precursor (B) having a luminescence intensity of I[SiF*]; and (d) chemically reacting said precursor (A) and said precursor (B) in space surrounding the surface of the substrate so as to thereby form said polycrystal silicon film.
Claim 3
Dependent Claim
14 words
The process according to claim 1 wherein said precursor (A) contains SiF 2 radical.
Claim 4
Dependent Claim
42 words
The process according to claim 1 wherein said gaseous raw material containing Group III atom is a member selected from the group consisting of B 2 H 6 , BF 3 , Al(CH 3 ) 3 and Ga(CH 3 ) 3 .
Claim 5
Dependent Claim
39 words
The process according to claim 1 wherein said gaseous raw material containing Group V atom is a member selected from the group consisting of N 2 , NH 3 , PH 3 , PF 5 and AsH 3 .
Claim 6
Dependent Claim
71 words
The process according to claim 1, further including, generating a precursor (C) using activation energy in at least one of said first activation space or said second activation space, from a gaseous raw material containing atoms selected from the group consisting of Group III and said Group V of the periodic table and introducing said precursor (C) into said film-forming space to mix with said precursor (A) and said precursor (B).