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Method of making a semiconductor read only memory

Assignee: Toshiba Corp
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Filing: 1984-05-23
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Granted: 1986-01-21
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Expires: 2004-05-23
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Abstract

Abstract A semiconductor read only memory having a plurality of MOS transistors and polycrystalline or amorphous silicon resistances connected to the source or drain regions of the MOS transistors, laser beams irradiating selected silicon resistances to thermally activate those resistances and store the required data.

Inventors

  • 👤 Hideo Noguchi
  • 👤 Tugunari Iwamoto
  • 👤 Sakae Takei

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-26 22:09
CPC Classifications
H; H10; H10D; H10D88/00; G; G05; G05F; G05F1/00; G05F1/10; G05F1/625; G05F1/63; G05F1/648; G11; G11C; G11C17/00; G11C17/08; H10W; H10W20/00; H10W20/40; H10W20/49

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 74 words
A method of manufacturing a semiconductor read only memory comprising the steps of: forming a plurality of MOS transistors on the surface of a semiconductor substrate, connecting a plurality of silicon resistances to source and drain regions of said MOS transistors respectively, forming an insulator film on the surface of said substrate to provide an unactivated ROM, and irradiating with a laser beam selected silicon resistances through said insulator film to activate said ROM.
Claim 2
Independent Claim 74 words
A method of manufacturing a semiconductor read only memory comprising the steps of: forming a plurality of MOS transistors on the surface of a semiconductor substrate, connecting a plurality of silicon resistances to source and drain regions of said MOS transistors respectively, forming an insulator film on the surface of said substrate to provide an unactivated ROM, and irradiating with a laser beam selected silicon resistances through said insulator film to activate said ROM.
Claim 3
Dependent Claim 21 words
A method of manufacturing a semiconductor read only memory as in claim 1, wherein said silicon resistances are polycrystalline or amorphous.
Claim 4
Dependent Claim 17 words
A method as in claim 1 including the further step of storing said unactivated ROM before irradiation.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1989-01-20 1989-07-22 1990-01-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1993-01-20 1993-07-22 1994-01-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1997-01-20 1997-07-22 1998-01-21 $7700.00 Window Closed / Lapsed

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